PAVAN, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 24.839
EU - Europa 10.608
AS - Asia 4.686
SA - Sud America 49
AF - Africa 16
Continente sconosciuto - Info sul continente non disponibili 14
OC - Oceania 12
Totale 40.224
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Nazione #
US - Stati Uniti d'America 24.780
GB - Regno Unito 3.692
IT - Italia 2.124
CN - Cina 1.474
SG - Singapore 1.468
SE - Svezia 1.370
DE - Germania 1.163
HK - Hong Kong 696
UA - Ucraina 558
TR - Turchia 514
FR - Francia 387
FI - Finlandia 367
BG - Bulgaria 282
PT - Portogallo 178
KR - Corea 118
IN - India 112
NL - Olanda 87
TW - Taiwan 75
JP - Giappone 73
RU - Federazione Russa 67
BE - Belgio 65
IE - Irlanda 58
CA - Canada 53
CH - Svizzera 43
BR - Brasile 32
MY - Malesia 29
AT - Austria 25
ID - Indonesia 25
ES - Italia 22
IR - Iran 21
LU - Lussemburgo 19
LT - Lituania 16
PK - Pakistan 15
VN - Vietnam 15
PL - Polonia 14
CZ - Repubblica Ceca 12
GR - Grecia 12
RO - Romania 12
EU - Europa 11
BD - Bangladesh 10
SA - Arabia Saudita 10
AU - Australia 7
IL - Israele 7
PH - Filippine 7
AR - Argentina 6
CL - Cile 6
MX - Messico 6
NO - Norvegia 6
BY - Bielorussia 5
DK - Danimarca 5
HU - Ungheria 5
NZ - Nuova Zelanda 5
DZ - Algeria 4
EG - Egitto 4
A2 - ???statistics.table.value.countryCode.A2??? 3
AE - Emirati Arabi Uniti 3
EC - Ecuador 3
NG - Nigeria 3
AL - Albania 2
EE - Estonia 2
HR - Croazia 2
IQ - Iraq 2
KZ - Kazakistan 2
LK - Sri Lanka 2
ME - Montenegro 2
SI - Slovenia 2
TN - Tunisia 2
ZA - Sudafrica 2
AM - Armenia 1
BN - Brunei Darussalam 1
GE - Georgia 1
JO - Giordania 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
MA - Marocco 1
MD - Moldavia 1
MK - Macedonia 1
MO - Macao, regione amministrativa speciale della Cina 1
PE - Perù 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
TH - Thailandia 1
VE - Venezuela 1
Totale 40.224
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Città #
Fairfield 3.546
Southend 3.084
Woodbridge 2.154
Ashburn 1.905
Chandler 1.846
Houston 1.808
Seattle 1.386
Santa Clara 1.359
Jacksonville 1.236
Wilmington 1.171
Cambridge 1.170
Singapore 1.167
Ann Arbor 1.116
Nyköping 870
Dearborn 869
Hong Kong 653
Modena 491
Beijing 399
Chicago 359
San Diego 351
Izmir 317
Grafing 299
Princeton 276
Sofia 272
Eugene 221
London 198
Milan 182
Helsinki 162
Boardman 160
Des Moines 154
New York 147
Redwood City 145
Bremen 142
Guangzhou 109
Los Angeles 81
Rome 66
Shanghai 62
Bologna 54
Nanjing 47
Taipei 46
Falls Church 42
Hefei 38
Norwalk 37
Brussels 35
Dublin 34
Reggio Emilia 33
Tokyo 31
Parma 30
Indiana 28
Munich 28
San Mateo 28
Kilburn 26
Jakarta 25
Paris 25
Ottawa 24
Aachen 23
Chiswick 23
Frankfurt am Main 23
Jinan 23
Atlanta 22
Wuhan 22
Verona 21
Dresden 20
Kunming 20
Lappeenranta 20
San Jose 20
Hounslow 19
San Francisco 19
Zhengzhou 19
Zurich 18
Vienna 17
Mantova 16
Mountain View 16
Rimini 16
Rotterdam 16
Florence 15
Reggio Nell'emilia 15
Rende 15
Shenzhen 15
Dudelange 14
Seoul 14
Toronto 14
Xian 14
Buffalo 13
Cork 13
Leuven 13
Padova 13
Amsterdam 12
Ancona 12
Dallas 12
Delhi 12
Leawood 12
Napoli 12
Saint Petersburg 12
Turin 12
Auburn Hills 11
Bomporto 11
Dongguan 11
Formigine 11
Imola 11
Totale 31.256
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Nome #
XBW s.r.l. - Mechatronic Solutions 569
Unimore Resistive Random Access Memory (RRAM) Verilog-A Model 1.0.0 380
The Role of Carbon Doping on Breakdown, Current Collapse and Dynamic On-Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates 305
Leakage current in HfO2 stacks: from physical to compact modeling 301
Recommended Methods to Study Resistive Switching Devices 283
Can NROM, a 2 Bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells? 280
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 272
The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs 265
Anomalous random telegraph noise and temporary phenomena in resistive random access memory 259
Threshold Voltage Statistical Variability and Its Sensitivity to Critical Geometrical Parameters in Ultrascaled InGaAs and Silicon FETs 253
250mV Input Boost Converter for Low Power Applications 250
Active Safety System with RF Energy Harvesting Capabilities for Industrial Applications using Interchangeable Implements 246
Understanding current instabilities in conductive atomic force microscopy 244
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 238
Temperature impact on the reset operation in HfO2 RRAM 237
Photovoltaic scavenging systems: Modeling and optimization 235
Mixed-Mode Stress in Silicon-Germanium Heterostructure Bipolar Transistors: Insights from Experiments and Simulations 232
A WSN System Powered by Vibrations to Improve Safety of Machinery with Trailer 230
Photovoltaic Cell Modeling for Solar Energy Powered Sensor Networks 221
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 220
A microscopic physical description of RTN current fluctuations in HfOx RRAM 218
Force Impact Effect in Contact-Mode Triboelectric Energy Harvesters: Characterization and Modeling 217
Random telegraph noise: Measurement, data analysis, and interpretation 217
Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modeling 217
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 216
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 215
Ultra low cost triboelectric energy harvesting solutions for embedded sensor systems 215
AlN-based MEMS devices for vibrational energy harvesting applications 213
A Solar Energy Harvesting Circuit for Low Power Applications 213
Progresses in Modeling HfOx RRAM Operations and Variability 212
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJTs by means of a non-local analytical model for the avalanche multiplication factor 211
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 210
Physical modeling and characterization of thermo-acoustic loudspeakers made of silver nano-wire films 209
Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design 209
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements 207
An Ultra-Low Cost Triboelectric Flowmeter 207
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS 205
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 203
On the impact of channel compositional variations on total threshold voltage variability in nanoscale InGaAs MOSFETs 203
Investigation of trapping/detrapping mechanisms in Al2O3 electron/hole traps and their influence on TANOS memory operations 203
Optimized Energy-Aware Wireless System for Identification of the Relative Positioning of Articulated Systems in the Free Space 201
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 200
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 199
Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD 199
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 196
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 195
Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach 195
Perimeter and area current components in HfO2 and HfO2-x metal-insulator-metal capacitors 195
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting 195
Control of brushless DC motor with static redundancy for force-feedback in steer-by-wire applications 194
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy 194
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 193
Random dopant fluctuation variability in scaled InGaAs dual-gate ultra-thin body MOSFETs: source and drain doping effect 193
Charge Transport and Degradation in HfO2 and HfOx Dielectrics 192
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 192
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 191
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise 191
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 191
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations 190
Smart Logic-in-Memory Architecture for Low-Power non-von Neumann Computing 190
Enhancing Safety in Vehicles with Implement or Trailer using an Autonomous Wireless Sensor Network System 189
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control 189
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization 189
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 189
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories 188
On the RESET-SET transition in Phase Change Memories 186
Control of Brushless Motor with Hybrid Redundancy for Force Feedback in Steer-by-Wire Applications 186
Modeling NAND Flash Memories for IC Design 186
Variability and sensitivity to process parameters variations in InGaAs Dual-Gate Ultra-Thin Body MOSFETS: A scaling perspective 185
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 184
Operations, Charge Transport, and Random Telegraph Noise in HfOx Resistive Random Access Memory: a Multi-scale Modeling Study 184
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices 184
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 184
RTS Noise Characterization of HfOx RRAM in High Resistive State 183
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 183
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 182
Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 Resistive Random Access Memory 182
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 181
Force Feedback in Steer-by-Wire Systems: Architecture and Experimental Results 180
Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations 180
An autonomous wireless sensor network device powered by a RF energy harvesting system 180
A new model of gate capacitance as a simple tool to extract MOS parameters 179
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: experiments and simulations 179
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 177
A Vibration-Powered Wireless System to Enhance Safety in Agricultural Machinery 177
A Wireless Wearable Embedded System for Logistics Based On IEEE 802.15.4. 176
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials 175
Insights into the off-state breakdown mechanisms in power GaN HEMTs 175
Multiscale modeling of defect-related phenomena in high-k based logic and memory devices 174
Performance Analysis of Solar Energy Harvesting Circuits for Autonomous Sensors 174
Hole Distributions in Erased NROM Devices: profiling method and effects on reliability 174
Analysis of interface-trap effects in inversion-type InGaAs/ZrO2 MOSFETs 174
Extracting Atomic Defect Properties From Leakage Current Temperature Dependence 173
Sperimentando con CANbus - Controllo di un motore brushless con ridondandza statica per applicazioni di force-feedback in sistemi steer-by-wire 172
Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-Of-The-Roadmap III-V MOSFETs 172
Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJTs 171
A wearable IEEE 802.15.4 system for logistics scenarios 170
Effects of mole fraction variations and scaling on total variability in InGaAs MOSFETs 170
Solar harvesting per reti di sensori wireless 169
Energetic Approach for Steer-by-Wire in Off-highway Vehicles 169
Totale 20.800
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Categoria #
all - tutte 170.583
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 170.583
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20205.827 0 0 0 0 863 1.161 1.104 743 846 311 472 327
2020/20217.729 547 259 526 529 761 684 736 1.020 622 1.134 460 451
2021/20225.508 365 589 401 267 135 677 212 279 550 461 1.111 461
2022/20235.335 538 623 292 478 675 854 137 538 641 67 300 192
2023/20243.868 191 201 222 393 899 383 299 419 80 187 143 451
2024/20253.776 978 215 207 910 1.466 0 0 0 0 0 0 0
Totale 40.684