PAVAN, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 34.775
AS - Asia 18.841
EU - Europa 15.346
SA - Sud America 1.920
AF - Africa 280
OC - Oceania 19
Continente sconosciuto - Info sul continente non disponibili 17
Totale 71.198
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Nazione #
US - Stati Uniti d'America 34.308
CN - Cina 5.895
SG - Singapore 5.658
GB - Regno Unito 4.432
IT - Italia 2.910
HK - Hong Kong 2.648
SE - Svezia 1.623
DE - Germania 1.594
BR - Brasile 1.493
VN - Vietnam 1.324
KR - Corea 1.025
FI - Finlandia 770
PL - Polonia 735
FR - Francia 729
UA - Ucraina 625
RU - Federazione Russa 572
TR - Turchia 570
IN - India 400
BG - Bulgaria 293
CA - Canada 250
NL - Olanda 246
JP - Giappone 195
PT - Portogallo 191
BD - Bangladesh 174
MX - Messico 142
AR - Argentina 139
TW - Taiwan 137
ID - Indonesia 128
IQ - Iraq 107
ES - Italia 105
ZA - Sudafrica 84
BE - Belgio 79
PK - Pakistan 79
IE - Irlanda 75
EC - Ecuador 72
AE - Emirati Arabi Uniti 71
CO - Colombia 64
MY - Malesia 60
CH - Svizzera 59
LT - Lituania 52
AT - Austria 51
PH - Filippine 47
MA - Marocco 43
SA - Arabia Saudita 42
CL - Cile 40
IL - Israele 39
VE - Venezuela 38
UZ - Uzbekistan 32
EG - Egitto 28
GR - Grecia 28
DZ - Algeria 24
IR - Iran 24
PY - Paraguay 24
CZ - Repubblica Ceca 23
JO - Giordania 23
LU - Lussemburgo 23
NP - Nepal 23
TH - Thailandia 23
TN - Tunisia 23
RO - Romania 22
PE - Perù 19
BY - Bielorussia 18
CR - Costa Rica 17
AZ - Azerbaigian 16
UY - Uruguay 16
KE - Kenya 15
AL - Albania 14
OM - Oman 14
DO - Repubblica Dominicana 13
HU - Ungheria 13
JM - Giamaica 13
AU - Australia 12
SN - Senegal 12
BO - Bolivia 11
EU - Europa 11
KZ - Kazakistan 11
ET - Etiopia 10
PS - Palestinian Territory 10
DK - Danimarca 9
NO - Norvegia 9
RS - Serbia 9
GE - Georgia 8
LB - Libano 8
BH - Bahrain 7
CG - Congo 7
NZ - Nuova Zelanda 7
SK - Slovacchia (Repubblica Slovacca) 7
TT - Trinidad e Tobago 7
AO - Angola 6
BB - Barbados 6
EE - Estonia 6
NG - Nigeria 6
NI - Nicaragua 6
QA - Qatar 6
HR - Croazia 5
KG - Kirghizistan 5
CY - Cipro 4
GY - Guiana 4
HN - Honduras 4
KW - Kuwait 4
Totale 71.118
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Città #
Singapore 3.620
Fairfield 3.547
Ashburn 3.202
Southend 3.084
Santa Clara 2.971
Hong Kong 2.576
Hefei 2.431
Woodbridge 2.155
Chandler 1.850
Houston 1.849
Seattle 1.404
San Jose 1.335
Jacksonville 1.243
Wilmington 1.185
Cambridge 1.172
Ann Arbor 1.116
Chicago 966
Dearborn 870
Nyköping 870
Beijing 801
London 795
Seoul 789
Warsaw 714
Modena 532
The Dalles 527
Helsinki 519
Los Angeles 490
Ho Chi Minh City 449
San Diego 351
Milan 340
Council Bluffs 336
New York 331
Izmir 318
Hanoi 302
Grafing 299
Princeton 276
Sofia 276
Buffalo 225
Eugene 221
Lauterbourg 210
Boardman 167
Des Moines 167
Shanghai 149
Columbus 147
Moscow 146
Redwood City 145
Dallas 144
Salt Lake City 143
Bremen 142
São Paulo 141
Guangzhou 128
Munich 126
Tokyo 125
Bologna 122
Frankfurt am Main 122
Falkenstein 108
Rome 108
Orem 84
Atlanta 80
Chennai 80
Da Nang 68
Jakarta 68
Taipei 67
Tampa 63
Phoenix 62
Wuhan 59
Nanjing 58
Brooklyn 57
San Francisco 55
Kent 53
Reggio Emilia 53
Dublin 49
Paris 49
Haiphong 48
Elk Grove Village 47
Toronto 47
Amsterdam 45
Montreal 45
Baghdad 44
Rio de Janeiro 43
Brussels 42
Falls Church 42
Delfgauw 41
Denver 40
Dhaka 39
Mexico City 39
Zhengzhou 39
Dresden 38
Norwalk 38
Redondo Beach 38
Brantford 37
Johannesburg 37
Parma 35
Poplar 34
Turku 34
Hải Dương 33
Manchester 33
Nuremberg 33
Changsha 32
Jinan 32
Totale 50.937
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Nome #
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 751
XBW s.r.l. - Mechatronic Solutions 741
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 686
Unimore Resistive Random Access Memory (RRAM) Verilog-A Model 1.0.0 677
Leakage current in HfO2 stacks: from physical to compact modeling 483
Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges 475
Active Safety System with RF Energy Harvesting Capabilities for Industrial Applications using Interchangeable Implements 398
The Role of Carbon Doping on Breakdown, Current Collapse and Dynamic On-Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates 398
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 390
A WSN System Powered by Vibrations to Improve Safety of Machinery with Trailer 387
250mV Input Boost Converter for Low Power Applications 385
Can NROM, a 2 Bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells? 382
Photovoltaic scavenging systems: Modeling and optimization 375
Anomalous random telegraph noise and temporary phenomena in resistive random access memory 374
A microscopic physical description of RTN current fluctuations in HfOx RRAM 374
Random telegraph noise: Measurement, data analysis, and interpretation 368
Recommended Methods to Study Resistive Switching Devices 368
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 366
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 362
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 358
Threshold Voltage Statistical Variability and Its Sensitivity to Critical Geometrical Parameters in Ultrascaled InGaAs and Silicon FETs 357
An autonomous wireless sensor network device powered by a RF energy harvesting system 356
AlN-based MEMS devices for vibrational energy harvesting applications 354
The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs 352
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 347
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 346
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJTs by means of a non-local analytical model for the avalanche multiplication factor 344
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 344
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 342
A Solar Energy Harvesting Circuit for Low Power Applications 342
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements 341
Understanding current instabilities in conductive atomic force microscopy 334
Photovoltaic Cell Modeling for Solar Energy Powered Sensor Networks 334
Temperature impact on the reset operation in HfO2 RRAM 331
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 330
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 330
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 329
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting 327
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 326
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 325
Optimized Energy-Aware Wireless System for Identification of the Relative Positioning of Articulated Systems in the Free Space 322
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 321
embit s.r.l. 321
Control of brushless DC motor with static redundancy for force-feedback in steer-by-wire applications 320
A Vibration-Powered Wireless System to Enhance Safety in Agricultural Machinery 318
Force Feedback in Steer-by-Wire Systems: Architecture and Experimental Results 317
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 317
On the impact of channel compositional variations on total threshold voltage variability in nanoscale InGaAs MOSFETs 316
Solar Energy Harvesting: applicazioni a bassa potenza 314
Enhancing Safety in Vehicles with Implement or Trailer using an Autonomous Wireless Sensor Network System 313
Mixed-Mode Stress in Silicon-Germanium Heterostructure Bipolar Transistors: Insights from Experiments and Simulations 313
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 312
Progresses in Modeling HfOx RRAM Operations and Variability 312
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices 311
Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modeling 310
An Ultra-Low Cost Triboelectric Flowmeter 310
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 310
Charge Transport and Degradation in HfO2 and HfOx Dielectrics 309
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 309
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 306
Force Impact Effect in Contact-Mode Triboelectric Energy Harvesters: Characterization and Modeling 306
Physical modeling and characterization of thermo-acoustic loudspeakers made of silver nano-wire films 304
Ultra low cost triboelectric energy harvesting solutions for embedded sensor systems 301
Analysis of interface-trap effects in inversion-type InGaAs/ZrO2 MOSFETs 301
Solar harvesting per reti di sensori wireless 300
On the RESET-SET transition in Phase Change Memories 299
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control 298
Random dopant fluctuation variability in scaled InGaAs dual-gate ultra-thin body MOSFETs: source and drain doping effect 298
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 298
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations 295
Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design 294
A memory window expression to evaluate the endurance of ferroelectric FETs 294
Variability and sensitivity to process parameters variations in InGaAs Dual-Gate Ultra-Thin Body MOSFETS: A scaling perspective 293
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise 292
Energetic Approach for Steer-by-Wire in Off-highway Vehicles 292
RTS Noise Characterization of HfOx RRAM in High Resistive State 291
A complete model of (EPROM)-P-2 memory cells for circuit simulations 290
A new model of gate capacitance as a simple tool to extract MOS parameters 289
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise 289
Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach 288
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 288
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 288
An Empirical Model for RRAM Resistance in Low- and High-Resistance State 288
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules 287
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 287
Control of Brushless Motor with Hybrid Redundancy for Force Feedback in Steer-by-Wire Applications 286
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories 285
A complete radiation reliability software simulator 285
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS 285
A New Compact Model of Floating Gate Non-Volatile Memory Cells 284
W2TS: A novel IEEE 802.11 multi-hop mesh network for tracking systems 283
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS 283
Energy-efficient logic-in-memory I-bit full adder enabled by a physics-based RRAM compact model 283
Circuit reliability of low-power rram-based logic-in-memory architectures 282
Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD 281
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data 281
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: experiments and simulations 280
Study of RRAM-Based Binarized Neural Networks Inference Accelerators Using an RRAM Physics-Based Compact Model 278
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization 277
Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories 277
Totale 33.750
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Categoria #
all - tutte 257.952
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 257.952
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021911 0 0 0 0 0 0 0 0 0 0 460 451
2021/20225.508 365 589 401 267 135 677 212 279 550 461 1.111 461
2022/20235.337 538 623 292 478 675 854 137 538 641 67 301 193
2023/20243.881 191 202 222 395 903 383 301 420 81 187 143 453
2024/202514.458 981 215 207 915 2.119 1.973 1.023 865 1.315 615 2.337 1.893
2025/202620.303 1.820 1.213 1.747 1.930 3.039 2.302 2.621 982 2.284 1.926 439 0
Totale 71.684