PAVAN, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 22.826
EU - Europa 10.154
AS - Asia 2.729
SA - Sud America 30
AF - Africa 16
Continente sconosciuto - Info sul continente non disponibili 14
OC - Oceania 12
Totale 35.781
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Nazione #
US - Stati Uniti d'America 22.777
GB - Regno Unito 3.674
IT - Italia 1.873
SE - Svezia 1.361
DE - Germania 1.120
CN - Cina 996
HK - Hong Kong 694
UA - Ucraina 555
TR - Turchia 511
FR - Francia 370
FI - Finlandia 353
BG - Bulgaria 275
PT - Portogallo 178
IN - India 105
SG - Singapore 92
KR - Corea 91
NL - Olanda 77
TW - Taiwan 69
BE - Belgio 58
RU - Federazione Russa 57
IE - Irlanda 54
JP - Giappone 51
CA - Canada 44
CH - Svizzera 30
MY - Malesia 24
IR - Iran 21
BR - Brasile 20
AT - Austria 19
ES - Italia 17
PK - Pakistan 15
VN - Vietnam 15
RO - Romania 12
EU - Europa 11
GR - Grecia 11
CZ - Repubblica Ceca 10
PL - Polonia 10
SA - Arabia Saudita 10
AU - Australia 7
BD - Bangladesh 7
IL - Israele 7
PH - Filippine 7
CL - Cile 6
NO - Norvegia 6
BY - Bielorussia 5
DK - Danimarca 5
HU - Ungheria 5
LU - Lussemburgo 5
MX - Messico 5
NZ - Nuova Zelanda 5
DZ - Algeria 4
EG - Egitto 4
A2 - ???statistics.table.value.countryCode.A2??? 3
NG - Nigeria 3
AE - Emirati Arabi Uniti 2
AL - Albania 2
EE - Estonia 2
HR - Croazia 2
KZ - Kazakistan 2
LK - Sri Lanka 2
ME - Montenegro 2
SI - Slovenia 2
TN - Tunisia 2
ZA - Sudafrica 2
AM - Armenia 1
AR - Argentina 1
BN - Brunei Darussalam 1
EC - Ecuador 1
GE - Georgia 1
IQ - Iraq 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
MA - Marocco 1
MD - Moldavia 1
MK - Macedonia 1
MO - Macao, regione amministrativa speciale della Cina 1
PE - Perù 1
RS - Serbia 1
SK - Slovacchia (Repubblica Slovacca) 1
TH - Thailandia 1
VE - Venezuela 1
Totale 35.781
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Città #
Fairfield 3.546
Southend 3.084
Woodbridge 2.154
Ashburn 1.868
Chandler 1.846
Houston 1.808
Seattle 1.387
Jacksonville 1.236
Wilmington 1.171
Cambridge 1.170
Ann Arbor 1.116
Nyköping 870
Dearborn 869
Hong Kong 655
Modena 472
Beijing 373
San Diego 351
Izmir 317
Grafing 299
Princeton 276
Sofia 272
Eugene 221
London 190
Des Moines 154
Helsinki 154
Milan 151
Redwood City 145
New York 144
Bremen 142
Chicago 80
Guangzhou 76
Rome 52
Bologna 51
Nanjing 46
Taipei 45
Falls Church 42
Hefei 37
Norwalk 37
Boardman 35
Dublin 33
Brussels 29
Indiana 28
Reggio Emilia 28
San Mateo 28
Parma 27
Kilburn 26
Los Angeles 24
Aachen 23
Chiswick 23
Jinan 22
Shanghai 22
Atlanta 21
Paris 21
Verona 21
Kunming 20
Ottawa 20
San Jose 20
Dresden 19
Hounslow 19
Tokyo 19
Zhengzhou 19
Singapore 18
Mountain View 16
Rotterdam 16
Wuhan 16
Florence 15
Reggio Nell'emilia 15
Lappeenranta 14
San Francisco 14
Vienna 14
Xian 14
Leuven 13
Padova 13
Delhi 12
Frankfurt am Main 12
Leawood 12
Napoli 12
Rende 12
Rimini 12
Saint Petersburg 12
Seoul 12
Turin 12
Auburn Hills 11
Bomporto 11
Imola 11
Pavia 11
Prescot 11
Pune 11
Toronto 11
Augusta 10
Buffalo 10
Central 10
Chennai 10
Cork 10
Duncan 10
Formigine 10
Gif-sur-yvette 10
Mortegliano 10
Piacenza 10
Segrate 10
Totale 27.927
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Nome #
XBW s.r.l. - Mechatronic Solutions 548
Unimore Resistive Random Access Memory (RRAM) Verilog-A Model 1.0.0 301
The Role of Carbon Doping on Breakdown, Current Collapse and Dynamic On-Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates 290
Recommended Methods to Study Resistive Switching Devices 261
Leakage current in HfO2 stacks: from physical to compact modeling 253
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 252
The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs 247
Can NROM, a 2 Bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells? 246
Anomalous random telegraph noise and temporary phenomena in resistive random access memory 240
Threshold Voltage Statistical Variability and Its Sensitivity to Critical Geometrical Parameters in Ultrascaled InGaAs and Silicon FETs 237
Active Safety System with RF Energy Harvesting Capabilities for Industrial Applications using Interchangeable Implements 230
250mV Input Boost Converter for Low Power Applications 230
Understanding current instabilities in conductive atomic force microscopy 228
Temperature impact on the reset operation in HfO2 RRAM 224
Mixed-Mode Stress in Silicon-Germanium Heterostructure Bipolar Transistors: Insights from Experiments and Simulations 221
Photovoltaic scavenging systems: Modeling and optimization 209
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 209
A WSN System Powered by Vibrations to Improve Safety of Machinery with Trailer 203
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 202
Force Impact Effect in Contact-Mode Triboelectric Energy Harvesters: Characterization and Modeling 199
A microscopic physical description of RTN current fluctuations in HfOx RRAM 199
Ultra low cost triboelectric energy harvesting solutions for embedded sensor systems 199
Photovoltaic Cell Modeling for Solar Energy Powered Sensor Networks 199
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 198
Progresses in Modeling HfOx RRAM Operations and Variability 198
Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modeling 196
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 195
Random telegraph noise: Measurement, data analysis, and interpretation 195
A Solar Energy Harvesting Circuit for Low Power Applications 195
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 195
Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design 194
AlN-based MEMS devices for vibrational energy harvesting applications 193
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS 192
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements 192
An Ultra-Low Cost Triboelectric Flowmeter 189
Investigation of trapping/detrapping mechanisms in Al2O3 electron/hole traps and their influence on TANOS memory operations 188
Optimized Energy-Aware Wireless System for Identification of the Relative Positioning of Articulated Systems in the Free Space 185
On the impact of channel compositional variations on total threshold voltage variability in nanoscale InGaAs MOSFETs 185
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 184
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 184
Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD 184
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJTs by means of a non-local analytical model for the avalanche multiplication factor 183
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 183
Perimeter and area current components in HfO2 and HfO2-x metal-insulator-metal capacitors 182
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 180
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy 180
Physical modeling and characterization of thermo-acoustic loudspeakers made of silver nano-wire films 179
Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach 179
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting 179
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 178
Charge Transport and Degradation in HfO2 and HfOx Dielectrics 177
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations 177
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 177
Smart Logic-in-Memory Architecture for Low-Power non-von Neumann Computing 177
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories 176
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 176
Enhancing Safety in Vehicles with Implement or Trailer using an Autonomous Wireless Sensor Network System 174
Random dopant fluctuation variability in scaled InGaAs dual-gate ultra-thin body MOSFETs: source and drain doping effect 174
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization 174
RTS Noise Characterization of HfOx RRAM in High Resistive State 173
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control 173
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 173
Modeling NAND Flash Memories for IC Design 173
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 173
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 170
Control of brushless DC motor with static redundancy for force-feedback in steer-by-wire applications 169
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 169
Operations, Charge Transport, and Random Telegraph Noise in HfOx Resistive Random Access Memory: a Multi-scale Modeling Study 168
Variability and sensitivity to process parameters variations in InGaAs Dual-Gate Ultra-Thin Body MOSFETS: A scaling perspective 168
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: experiments and simulations 167
Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations 167
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 167
Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 Resistive Random Access Memory 167
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 167
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 165
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 165
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 164
A new model of gate capacitance as a simple tool to extract MOS parameters 164
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise 164
Control of Brushless Motor with Hybrid Redundancy for Force Feedback in Steer-by-Wire Applications 164
A Wireless Wearable Embedded System for Logistics Based On IEEE 802.15.4. 163
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices 163
On the RESET-SET transition in Phase Change Memories 162
A Vibration-Powered Wireless System to Enhance Safety in Agricultural Machinery 161
Hole Distributions in Erased NROM Devices: profiling method and effects on reliability 161
Analysis of interface-trap effects in inversion-type InGaAs/ZrO2 MOSFETs 161
Insights into the off-state breakdown mechanisms in power GaN HEMTs 160
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials 159
Extracting Atomic Defect Properties From Leakage Current Temperature Dependence 159
Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-Of-The-Roadmap III-V MOSFETs 159
Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJTs 158
Multiscale modeling of defect-related phenomena in high-k based logic and memory devices 158
An autonomous wireless sensor network device powered by a RF energy harvesting system 158
A wearable IEEE 802.15.4 system for logistics scenarios 158
Force Feedback in Steer-by-Wire Systems: Architecture and Experimental Results 157
Sperimentando con CANbus - Controllo di un motore brushless con ridondandza statica per applicazioni di force-feedback in sistemi steer-by-wire 157
Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors 154
Performance Analysis of Solar Energy Harvesting Circuits for Autonomous Sensors 154
Monte-Carlo Simulations of Flash Memory Array Retention 154
Temperature Effects on Metal-Alumina-Nitride-Oxide-Silicon Memory Operations 154
Totale 18.974
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Categoria #
all - tutte 139.343
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 139.343
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20192.333 0 0 0 0 0 0 0 0 0 386 1.012 935
2019/20207.563 598 364 296 478 863 1.161 1.104 743 846 311 472 327
2020/20217.729 547 259 526 529 761 684 736 1.020 622 1.134 460 451
2021/20225.508 365 589 401 267 135 677 212 279 550 461 1.111 461
2022/20235.337 538 623 292 478 675 854 137 538 641 67 301 193
2023/20243.189 191 202 222 395 903 383 301 420 81 91 0 0
Totale 36.231