PAVAN, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 32.424
AS - Asia 15.273
EU - Europa 14.359
SA - Sud America 1.520
AF - Africa 169
Continente sconosciuto - Info sul continente non disponibili 16
OC - Oceania 16
Totale 63.777
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Nazione #
US - Stati Uniti d'America 32.157
CN - Cina 5.362
SG - Singapore 4.639
GB - Regno Unito 4.389
IT - Italia 2.638
HK - Hong Kong 2.418
SE - Svezia 1.620
DE - Germania 1.519
BR - Brasile 1.258
KR - Corea 794
PL - Polonia 728
FI - Finlandia 616
UA - Ucraina 601
RU - Federazione Russa 551
TR - Turchia 551
VN - Vietnam 511
FR - Francia 472
BG - Bulgaria 285
IN - India 234
NL - Olanda 217
PT - Portogallo 183
CA - Canada 152
JP - Giappone 146
TW - Taiwan 121
AR - Argentina 97
ID - Indonesia 91
BD - Bangladesh 90
ES - Italia 87
MX - Messico 81
BE - Belgio 75
IE - Irlanda 71
ZA - Sudafrica 62
CH - Svizzera 53
EC - Ecuador 53
LT - Lituania 51
AT - Austria 47
IQ - Iraq 44
PK - Pakistan 40
IL - Israele 35
MY - Malesia 35
CO - Colombia 29
GR - Grecia 26
IR - Iran 24
MA - Marocco 24
VE - Venezuela 23
LU - Lussemburgo 22
AE - Emirati Arabi Uniti 21
CL - Cile 20
SA - Arabia Saudita 20
CZ - Repubblica Ceca 19
PY - Paraguay 18
RO - Romania 18
EG - Egitto 17
UZ - Uzbekistan 16
PH - Filippine 13
HU - Ungheria 12
TN - Tunisia 12
BY - Bielorussia 11
EU - Europa 11
PE - Perù 11
DZ - Algeria 10
SN - Senegal 10
AU - Australia 9
KE - Kenya 8
KZ - Kazakistan 8
NO - Norvegia 8
UY - Uruguay 8
AZ - Azerbaigian 7
DK - Danimarca 7
JM - Giamaica 7
JO - Giordania 7
NZ - Nuova Zelanda 7
AL - Albania 6
DO - Repubblica Dominicana 6
OM - Oman 6
CG - Congo 5
NG - Nigeria 5
NP - Nepal 5
RS - Serbia 5
CR - Costa Rica 4
EE - Estonia 4
ET - Etiopia 4
GE - Georgia 4
HN - Honduras 4
HR - Croazia 4
KG - Kirghizistan 4
TT - Trinidad e Tobago 4
A2 - ???statistics.table.value.countryCode.A2??? 3
AO - Angola 3
BN - Brunei Darussalam 3
LB - Libano 3
LK - Sri Lanka 3
ME - Montenegro 3
NI - Nicaragua 3
PS - Palestinian Territory 3
SK - Slovacchia (Repubblica Slovacca) 3
AM - Armenia 2
BB - Barbados 2
GH - Ghana 2
GY - Guiana 2
Totale 63.742
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Città #
Fairfield 3.547
Southend 3.084
Singapore 2.990
Santa Clara 2.897
Ashburn 2.638
Hefei 2.431
Hong Kong 2.366
Woodbridge 2.155
Chandler 1.850
Houston 1.841
Seattle 1.402
Jacksonville 1.243
Wilmington 1.185
Cambridge 1.172
Ann Arbor 1.116
Dearborn 870
Nyköping 870
London 789
San Jose 726
Warsaw 709
Chicago 669
Beijing 659
Seoul 583
Modena 521
Los Angeles 457
The Dalles 406
Helsinki 370
San Diego 351
Izmir 317
New York 304
Grafing 299
Council Bluffs 280
Princeton 276
Sofia 274
Milan 247
Eugene 221
Buffalo 214
Ho Chi Minh City 196
Des Moines 166
Boardman 163
Shanghai 146
Redwood City 145
Columbus 144
Moscow 144
Bremen 142
Dallas 140
Salt Lake City 140
Guangzhou 127
Munich 125
São Paulo 123
Bologna 117
Hanoi 109
Rome 99
Falkenstein 97
Tokyo 94
Frankfurt am Main 90
Atlanta 73
Taipei 64
Tampa 63
Phoenix 58
Nanjing 57
Brooklyn 56
Jakarta 56
Kent 53
Chennai 51
San Francisco 51
Wuhan 51
Reggio Emilia 49
Elk Grove Village 47
Dublin 45
Montreal 43
Brussels 42
Falls Church 42
Paris 42
Delfgauw 41
Denver 39
Zhengzhou 39
Dresden 38
Redondo Beach 38
Norwalk 37
Parma 35
Toronto 35
Poplar 34
Rio de Janeiro 34
Turku 34
Orem 33
Jinan 32
Johannesburg 32
Stockholm 32
Amsterdam 30
Boston 30
Changsha 29
Indiana 28
Nuremberg 28
San Mateo 28
Mantova 27
Ottawa 27
Verona 27
Da Nang 26
Formigine 26
Totale 46.618
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Nome #
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 698
XBW s.r.l. - Mechatronic Solutions 694
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 645
Unimore Resistive Random Access Memory (RRAM) Verilog-A Model 1.0.0 611
Leakage current in HfO2 stacks: from physical to compact modeling 428
The Role of Carbon Doping on Breakdown, Current Collapse and Dynamic On-Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates 378
Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges 362
Can NROM, a 2 Bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells? 357
Active Safety System with RF Energy Harvesting Capabilities for Industrial Applications using Interchangeable Implements 354
Anomalous random telegraph noise and temporary phenomena in resistive random access memory 351
250mV Input Boost Converter for Low Power Applications 351
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 351
A WSN System Powered by Vibrations to Improve Safety of Machinery with Trailer 348
Photovoltaic scavenging systems: Modeling and optimization 340
Threshold Voltage Statistical Variability and Its Sensitivity to Critical Geometrical Parameters in Ultrascaled InGaAs and Silicon FETs 338
Recommended Methods to Study Resistive Switching Devices 337
A microscopic physical description of RTN current fluctuations in HfOx RRAM 336
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 333
The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs 332
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 331
AlN-based MEMS devices for vibrational energy harvesting applications 331
Random telegraph noise: Measurement, data analysis, and interpretation 327
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 317
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJTs by means of a non-local analytical model for the avalanche multiplication factor 316
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 316
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 315
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 314
A Solar Energy Harvesting Circuit for Low Power Applications 313
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements 311
An autonomous wireless sensor network device powered by a RF energy harvesting system 307
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 306
Understanding current instabilities in conductive atomic force microscopy 306
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 304
Photovoltaic Cell Modeling for Solar Energy Powered Sensor Networks 304
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 301
Temperature impact on the reset operation in HfO2 RRAM 301
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 300
On the impact of channel compositional variations on total threshold voltage variability in nanoscale InGaAs MOSFETs 300
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 299
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 298
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting 294
Control of brushless DC motor with static redundancy for force-feedback in steer-by-wire applications 293
embit s.r.l. 293
Optimized Energy-Aware Wireless System for Identification of the Relative Positioning of Articulated Systems in the Free Space 292
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 292
Progresses in Modeling HfOx RRAM Operations and Variability 292
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 292
Mixed-Mode Stress in Silicon-Germanium Heterostructure Bipolar Transistors: Insights from Experiments and Simulations 292
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 290
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices 288
Enhancing Safety in Vehicles with Implement or Trailer using an Autonomous Wireless Sensor Network System 287
Physical modeling and characterization of thermo-acoustic loudspeakers made of silver nano-wire films 287
Force Feedback in Steer-by-Wire Systems: Architecture and Experimental Results 286
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 284
Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modeling 284
An Ultra-Low Cost Triboelectric Flowmeter 284
Solar Energy Harvesting: applicazioni a bassa potenza 283
A Vibration-Powered Wireless System to Enhance Safety in Agricultural Machinery 283
Ultra low cost triboelectric energy harvesting solutions for embedded sensor systems 281
Force Impact Effect in Contact-Mode Triboelectric Energy Harvesters: Characterization and Modeling 280
Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design 280
On the RESET-SET transition in Phase Change Memories 278
Random dopant fluctuation variability in scaled InGaAs dual-gate ultra-thin body MOSFETs: source and drain doping effect 277
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 276
Solar harvesting per reti di sensori wireless 275
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories 271
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 271
Analysis of interface-trap effects in inversion-type InGaAs/ZrO2 MOSFETs 271
A new model of gate capacitance as a simple tool to extract MOS parameters 270
Charge Transport and Degradation in HfO2 and HfOx Dielectrics 269
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations 269
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 267
An Empirical Model for RRAM Resistance in Low- and High-Resistance State 267
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise 265
Energetic Approach for Steer-by-Wire in Off-highway Vehicles 265
RTS Noise Characterization of HfOx RRAM in High Resistive State 264
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control 264
A New Compact Model of Floating Gate Non-Volatile Memory Cells 263
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 263
Variability and sensitivity to process parameters variations in InGaAs Dual-Gate Ultra-Thin Body MOSFETS: A scaling perspective 262
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise 262
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS 261
Control of Brushless Motor with Hybrid Redundancy for Force Feedback in Steer-by-Wire Applications 260
A memory window expression to evaluate the endurance of ferroelectric FETs 260
Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach 259
Circuit reliability of low-power rram-based logic-in-memory architectures 257
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: experiments and simulations 256
Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD 256
A complete radiation reliability software simulator 255
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 255
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules 254
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data 254
Measurements and simulation of avalanche breakdown in advanced Si bipolar transistors 253
Investigation of trapping/detrapping mechanisms in Al2O3 electron/hole traps and their influence on TANOS memory operations 253
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy 253
Floating Gate devices: operation and compact modeling 251
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS 251
A Wireless Wearable Embedded System for Logistics Based On IEEE 802.15.4. 250
Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 Resistive Random Access Memory 250
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization 250
Totale 30.705
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Categoria #
all - tutte 243.485
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 243.485
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20214.423 0 0 0 0 0 0 736 1.020 622 1.134 460 451
2021/20225.508 365 589 401 267 135 677 212 279 550 461 1.111 461
2022/20235.337 538 623 292 478 675 854 137 538 641 67 301 193
2023/20243.881 191 202 222 395 903 383 301 420 81 187 143 453
2024/202514.458 981 215 207 915 2.119 1.973 1.023 865 1.315 615 2.337 1.893
2025/202612.881 1.820 1.213 1.747 1.930 3.039 2.302 830 0 0 0 0 0
Totale 64.262