PAVAN, Paolo

PAVAN, Paolo  

Dipartimento di Ingegneria "Enzo Ferrari"  

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Risultati 1 - 20 di 265 (tempo di esecuzione: 0.036 secondi).
Titolo Data di pubblicazione Autore(i) File
250mV Input Boost Converter for Low Power Applications 1-gen-2010 Bertacchini, Alessandro; Scorcioni, Stefano; Cori, Marco Maria; Larcher, Luca; Pavan, Paolo
A compact method for measuring parasitic resistances in bipolar transistors 1-gen-1993 Verzellesi, Giovanni; A., Chantre; R., Turetta; M., Cappellin; Pavan, Paolo; E., Zanoni
A complete model of (EPROM)-P-2 memory cells for circuit simulations 1-gen-2003 Pavan, Paolo; Larcher, Luca; M., Cuozzo; P., Zuliani; A., Conte
A complete radiation reliability software simulator 1-gen-1994 Pavan, Paolo; R., Tu; E., Minami; G., Lum; P. K., Ko; C., Hu
A complete study of SILC effects on E2PROM reliability 1-gen-2002 Larcher, L.; Bertulu, S.; Pavan, P.
A Complete Study of SILC Effects on EEPROM Reliability 1-gen-2002 Larcher, Luca; S., Bertulu; Pavan, Paolo
A Micro Fuel Cell Power Supply Module for Low Power Portable Applications 1-gen-2010 Bertacchini, Alessandro; Scorcioni, Stefano; Cori, Marco Maria; Larcher, Luca; Pavan, Paolo; J. P., Esquivel; N., Torres Herrero; N., Sabaté; J., Santander
A microscopic physical description of RTN current fluctuations in HfOx RRAM 1-gen-2015 Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
A New Analytical Model of Channel Hot Electron (CHE) and CHannel Initiated Secondary ELectron (CHISEL) Current Suitable for Compact Modeling 1-gen-2002 Larcher, Luca; Pavan, Paolo
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 1-gen-2002 Larcher, Luca; Pavan, Paolo; S., Pietri; L., Albani; A., Marmiroli
A New Compact Model of Floating Gate Non-Volatile Memory Cells 1-gen-2001 Larcher, Luca; Pavan, Paolo; F., Gattel; L., Albani; A., Marmiroli
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 1-gen-2001 Larcher, Luca; Pavan, Paolo; Cuozzo, M.; Marmiroli, A.
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 1-gen-1992 Verzellesi, Giovanni; L., Vendrame; R., Turetta; Pavan, Paolo; A., Chantre; A., Marty; M., Cavone; R., Rivoir; E., Zanoni
A new methodology for SEE testing and simulation 1-gen-2000 Pietri, S.; Pavan, Paolo; Iacono, S.; Striccoli, M.
A new model of gate capacitance as a simple tool to extract MOS parameters 1-gen-2001 Larcher, Luca; Pavan, Paolo; F., Pellizzer; G., Ghidini
A physics-based, accurate SPICE model of impact-ionization effects in bipolar transistors 1-gen-1994 E., Zanoni; A., Dal Fabbro; L., Vendrame; Verzellesi, Giovanni; G., Meneghesso; Pavan, Paolo; A., Chantre
A study of ESD induced effects in high-voltage n-MOS and p-MOS transistors 1-gen-1992 Pavan, Paolo; E., Zanoni; B., Bonati; S., Martino; G., Dalla Libera
A wearable IEEE 802.15.4 system for logistics scenarios 1-gen-2007 Bonizzi, F; Sedoni, L; Sganzerla, D; Manzoli, U; Pavan, Paolo
A wireless network system for low data rata and multimedia data communications on trains 1-gen-2004 F., Bonizzi; U., Manzoli; Larcher, Luca; Pavan, Paolo
A Wireless Wearable Embedded System for Logistics Based On IEEE 802.15.4. 1-gen-2007 Bonizzi, F; Sedoni, L; Sganzerla, D; Manzoli, U; Pavan, Paolo