PAVAN, Paolo

PAVAN, Paolo  

Dipartimento di Ingegneria "Enzo Ferrari"  

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Titolo Data di pubblicazione Autore(i) File
250mV Input Boost Converter for Low Power Applications 1-gen-2010 Bertacchini, Alessandro; Scorcioni, Stefano; Cori, Marco Maria; Larcher, Luca; Pavan, Paolo
A compact method for measuring parasitic resistances in bipolar transistors 1-gen-1993 Verzellesi, Giovanni; A., Chantre; R., Turetta; M., Cappellin; Pavan, Paolo; E., Zanoni
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 1-gen-2013 Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 1-gen-2014 Larcher, Luca; Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Vandelli, Luca; Bersuker, Gennadi
A complete model of (EPROM)-P-2 memory cells for circuit simulations 1-gen-2003 Pavan, Paolo; Larcher, Luca; M., Cuozzo; P., Zuliani; A., Conte
A complete radiation reliability software simulator 1-gen-1994 Pavan, Paolo; R., Tu; E., Minami; G., Lum; P. K., Ko; C., Hu
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 1-gen-2015 Puglisi, Francesco Maria; Larcher, Luca; Padovani, Andrea; Pavan, Paolo
A complete study of SILC effects on E2PROM reliability 1-gen-2002 Larcher, L.; Bertulu, S.; Pavan, P.
A Complete Study of SILC Effects on EEPROM Reliability 1-gen-2002 Larcher, Luca; S., Bertulu; Pavan, Paolo
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 1-gen-2011 Padovani, Andrea; A., Arreghini; Vandelli, Luca; Larcher, Luca; G., Van den Bosh; Pavan, Paolo; J., Van Houdt
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 1-gen-2016 Puglisi, Francesco Maria; Pavan, Paolo
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules 1-gen-2024 Florini, Davide; Gandolfi, Daniela; Mapelli, Jonathan; Benatti, Lorenzo; Pavan, Paolo; Puglisi, Francesco Maria
A memory window expression to evaluate the endurance of ferroelectric FETs 1-gen-2020 Zagni, Nicolo'; Pavan, Paolo; Ashraful Alam, Muhammad
A Micro Fuel Cell Power Supply Module for Low Power Portable Applications 1-gen-2010 Bertacchini, Alessandro; Scorcioni, Stefano; Cori, Marco Maria; Larcher, Luca; Pavan, Paolo; J. P., Esquivel; N., Torres Herrero; N., Sabaté; J., Santander
A microscopic physical description of RTN current fluctuations in HfOx RRAM 1-gen-2015 Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 1-gen-2016 Puglisi, Francesco Maria; Deleruyelle, Damien; Portal, Jean Michel; Pavan, Paolo; Larcher, Luca
A New Analytical Model of Channel Hot Electron (CHE) and CHannel Initiated Secondary ELectron (CHISEL) Current Suitable for Compact Modeling 1-gen-2002 Larcher, Luca; Pavan, Paolo
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 1-gen-2002 Larcher, Luca; Pavan, Paolo; S., Pietri; L., Albani; A., Marmiroli
A New Compact Model of Floating Gate Non-Volatile Memory Cells 1-gen-2001 Larcher, Luca; Pavan, Paolo; F., Gattel; L., Albani; A., Marmiroli
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 1-gen-2001 Larcher, Luca; Pavan, Paolo; Cuozzo, M.; Marmiroli, A.