In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN) in electronic devices. Starting from an in-depth understanding of RTN signal characteristics, we will identify the correct measurement conditions to enable RTN analysis as a characterization tool for electronic devices. The estimate of RTN statistical parameters may indeed strongly depend on the choice of measurement conditions. We will carefully consider both the measurement limits and the extraction process constraints to devise a strategy to identify RTN signals measured in conditions allowing a meaningful estimation of their parameters. The proposed strategy will be tested on a variety of different RTN signals and operating conditions.

Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices / Puglisi, Francesco Maria; Pavan, Paolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 65:6(2016), pp. 1435-1442. [10.1109/TIM.2016.2518880]

Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices

PUGLISI, Francesco Maria;PAVAN, Paolo
2016

Abstract

In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN) in electronic devices. Starting from an in-depth understanding of RTN signal characteristics, we will identify the correct measurement conditions to enable RTN analysis as a characterization tool for electronic devices. The estimate of RTN statistical parameters may indeed strongly depend on the choice of measurement conditions. We will carefully consider both the measurement limits and the extraction process constraints to devise a strategy to identify RTN signals measured in conditions allowing a meaningful estimation of their parameters. The proposed strategy will be tested on a variety of different RTN signals and operating conditions.
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Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices / Puglisi, Francesco Maria; Pavan, Paolo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 65:6(2016), pp. 1435-1442. [10.1109/TIM.2016.2518880]
Puglisi, Francesco Maria; Pavan, Paolo
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1129406
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