Ferroelectric transistors (FeFETs) based on doped hafnium oxide (HfO2) have received much attention due to their technological potential in terms of scalability, highspeed, and low-power operation. Unfortunately, however, HfO2-FeFETs also suffer from persistent reliability challenges, specifically affecting retention, endurance, and variability. A deep understanding of the reliability physics of HfO2-FeFETs is an essential prerequisite for the successful commercialization of this promising technology. In this article, we review the literature about the relevant reliability aspects of HfO2-FeFETs. We initially focus on the reliability physics of ferroelectric capacitors, as a prelude to a comprehensive analysis of FeFET reliability. Then, we interpret key reliability metrics of the FeFET at the device level (i.e., retention, endurance, and variability) based on the physical mechanisms previously identified. Finally, we discuss the implications of device-level reliability metrics at both the circuit and system levels. Our integrative approach connects apparently unrelated reliability issues and suggests mitigation strategies at the device, circuit, or system level. We conclude this article by proposing a set of research opportunities to guide future development in this field.

Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges / Zagni, Nicolo'; Puglisi, Francesco Maria; Pavan, Paolo; Alam, Muhammad Ashraful. - In: PROCEEDINGS OF THE IEEE. - ISSN 1558-2256. - 111:2(2023), pp. 158-184. [10.1109/JPROC.2023.3234607]

Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges

Zagni, Nicolo'
;
Puglisi, Francesco Maria;Pavan, Paolo;
2023

Abstract

Ferroelectric transistors (FeFETs) based on doped hafnium oxide (HfO2) have received much attention due to their technological potential in terms of scalability, highspeed, and low-power operation. Unfortunately, however, HfO2-FeFETs also suffer from persistent reliability challenges, specifically affecting retention, endurance, and variability. A deep understanding of the reliability physics of HfO2-FeFETs is an essential prerequisite for the successful commercialization of this promising technology. In this article, we review the literature about the relevant reliability aspects of HfO2-FeFETs. We initially focus on the reliability physics of ferroelectric capacitors, as a prelude to a comprehensive analysis of FeFET reliability. Then, we interpret key reliability metrics of the FeFET at the device level (i.e., retention, endurance, and variability) based on the physical mechanisms previously identified. Finally, we discuss the implications of device-level reliability metrics at both the circuit and system levels. Our integrative approach connects apparently unrelated reliability issues and suggests mitigation strategies at the device, circuit, or system level. We conclude this article by proposing a set of research opportunities to guide future development in this field.
2023
feb-2023
111
2
158
184
Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges / Zagni, Nicolo'; Puglisi, Francesco Maria; Pavan, Paolo; Alam, Muhammad Ashraful. - In: PROCEEDINGS OF THE IEEE. - ISSN 1558-2256. - 111:2(2023), pp. 158-184. [10.1109/JPROC.2023.3234607]
Zagni, Nicolo'; Puglisi, Francesco Maria; Pavan, Paolo; Alam, Muhammad Ashraful
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1296086
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