ZAGNI, NICOLO'

ZAGNI, NICOLO'  

Dipartimento di Ingegneria "Enzo Ferrari"  

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Risultati 1 - 20 di 60 (tempo di esecuzione: 0.017 secondi).
Titolo Data di pubblicazione Autore(i) File
A memory window expression to evaluate the endurance of ferroelectric FETs 1-gen-2020 Zagni, Nicolò; Pavan, Paolo; Ashraful Alam, Muhammad
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 1-gen-2017 Puglisi, Francesco Maria; Zagni, Nicolo'; Larcher, Luca; Pavan, Paolo
A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps 1-gen-2022 Cioni, Marcello; Zagni, Nicolo; Chini, Alessandro
An Aqueous Route to Oxygen-Deficient Wake-Up-Free La-Doped HfO2 Ferroelectrics for Negative Capacitance Field Effect Transistors 1-gen-2023 Pujar, Pavan; Cho, Haewon; Kim, Young-Hoon; Zagni, Nicolo; Oh, Jeonghyeon; Lee, Eunha; Gandla, Srinivas; Nukala, Pavan; Kim, Young-Min; Alam, Muhammad Ashraful; Kim, Sunkook
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 1-gen-2020 Zagni, Nicolo; Puglisi, Francesco Maria; Verzellesi, Giovanni; Pavan, Paolo
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 1-gen-2017 Zagni, Nicolo'; Puglisi, Francesco Maria; Verzellesi, Giovanni; Pavan, Paolo
Correlating Interface and Border Traps With Distinctive Features of C–V Curves in Vertical Al$_{\text{2}}$O$_{\text{3}}$/GaN MOS Capacitors 1-gen-2024 Zagni, Nicolo'; Fregolent, Manuel; Verzellesi, Giovanni; Marcuzzi, Alberto; Santi, Carlo De; Meneghesso, Gaudenzio; Zanoni, Enrico; Treidel, Eldad Bahat; Brusaterra, Enrico; Brunner, Frank; Hilt, Oliver; Meneghini, Matteo; Pavan, Paolo
Design and Optimization of β-Ga 2 O 3 on (h-BN layered) Sapphire for High Efficiency Power Transistors: A Device-Circuit-Package Perspective 1-gen-2018 Mahajan, B. K.; Chen, Y. -P.; Ahn, W.; Zagni, N.; Alam, M. A.
Effect of Trap-Filling Bias on the Extraction of the Time Constant of Drain Current Transients in AlGaN/GaN HEMTs 1-gen-2021 Zagni, Nicolo; Cioni, Marcello; Chini, Alessandro
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 1-gen-2016 Pavan, Paolo; Zagni, Nicolo'; Puglisi, Francesco Maria; Alian, Alireza; Thean, Aaron Voon Yew; Collaert, Nadine; Verzellesi, Giovanni
Effects of mole fraction variations and scaling on total variability in InGaAs MOSFETs 1-gen-2019 Zagni, N.; Puglisi, F. M.; Pavan, P.; Verzellesi, G.
Electric Field and Self-Heating Effects on the Emission Time of Iron Traps in GaN HEMTs 1-gen-2021 Cioni, Marcello; Zagni, Nicolo; Selmi, Luca; Meneghesso, Gaudenzio; Meneghini, Matteo; Zanoni, Enrico; Chini, Alessandro
Energy-efficient logic-in-memory I-bit full adder enabled by a physics-based RRAM compact model 1-gen-2018 Puglisi, Francesco Maria; Pacchioni, Lorenzo; Zagni, Nicolo; Pavan, Paolo
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 1-gen-2021 Cioni, Marcello; Bertacchini, Alessandro; Mucci, Alessandro; Zagni, Nicolo'; Verzellesi, Giovanni; Pavan, Paolo; Chini, Alessandro
Experimental and Numerical Analysis of OFFState Bias Induced Instabilities in Vertical GaNon-Si Trench MOSFETs 1-gen-2024 Zagni, N.; Fregolent, M.; Verzellesi, G.; Bergamin, F.; Favero, D.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Huber, C.; Meneghini, M.; Pavan, P.
Experimental and numerical investigation of Poole-Frenkel effect on dynamic RON transients in C-doped p-GaN HEMTs 1-gen-2022 Zagni, Nicolò; Cioni, Marcello; Iucolano, Ferdinando; Moschetti, Maurizio; Verzellesi, Giovanni; Chini, Alessandro
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications 1-gen-2022 Cioni, M.; Zagni, N.; Chini, A.
From Planar to Vertical GaN-on-Si Power Devices: Reliability Challenges to Efficient Power Conversion (Invited) 1-gen-2024 Zagni, N.
GaN-based power devices: Physics, reliability, and perspectives 1-gen-2021 Meneghini, Matteo; De Santi, Carlo; Abid, Idriss; Buffolo, Matteo; Cioni, Marcello; Khadar, Riyaz Abdul; Nela, Luca; Zagni, Nicolò; Chini, Alessandro; Medjdoub, Farid; Meneghesso, Gaudenzio; Verzellesi, Giovanni; Zanoni, Enrico; Matioli, Elison
Gate-Bias Induced RON Instability in p-GaN Power HEMTs 1-gen-2023 Chini, Alessandro; Zagni, Nicolo'; Verzellesi, Giovanni; Cioni, Marcello; Giorgino, Giovanni; Nicotra, Maria Concetta; Castagna, Maria Eloisa; Iucolano, Ferdinando