In this paper, we report about the derivation of a physics-based compact model of random telegraph noise (RTN) in HfO2-based resistive random access memory (RRAM) devices. Starting from the physics of charge transport, which is different in the high resistive states and low resistive states, we explore the mechanisms responsible for RTN exploiting a hybrid approach, based on self-consistent physics simulations and geometrical simplifications. Then, we develop a simple yet effective physics-based compact model of RTN valid in both states, which can be steadily integrated in state-of-the-art RRAM compact models. The RTN compact model predictions are validated by comparison with both a large experimental data set obtained by measuring RRAM devices in different conditions, and data reported in the literature. In addition, we show how the model enables advanced circuit simulations by exploring three different circuits for memory, security, and logic applications.

Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design / Puglisi, Francesco Maria; Zagni, Nicolo; Larcher, Luca; Pavan, Paolo. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 65:7(2018), pp. 2964-2972. [10.1109/TED.2018.2833208]

Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design

Puglisi, Francesco Maria
;
Zagni, Nicolo;Larcher, Luca;Pavan, Paolo
2018

Abstract

In this paper, we report about the derivation of a physics-based compact model of random telegraph noise (RTN) in HfO2-based resistive random access memory (RRAM) devices. Starting from the physics of charge transport, which is different in the high resistive states and low resistive states, we explore the mechanisms responsible for RTN exploiting a hybrid approach, based on self-consistent physics simulations and geometrical simplifications. Then, we develop a simple yet effective physics-based compact model of RTN valid in both states, which can be steadily integrated in state-of-the-art RRAM compact models. The RTN compact model predictions are validated by comparison with both a large experimental data set obtained by measuring RRAM devices in different conditions, and data reported in the literature. In addition, we show how the model enables advanced circuit simulations by exploring three different circuits for memory, security, and logic applications.
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Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design / Puglisi, Francesco Maria; Zagni, Nicolo; Larcher, Luca; Pavan, Paolo. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 65:7(2018), pp. 2964-2972. [10.1109/TED.2018.2833208]
Puglisi, Francesco Maria; Zagni, Nicolo; Larcher, Luca; Pavan, Paolo
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1175100
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