Resistive switching (RS) is an interesting property shown by some materials systems that, especially during the last decade, has gained a lot of interest for the fabrication of electronic devices, with electronic nonvolatile memories being those that have received the most attention. The presence and quality of the RS phenomenon in a materials system can be studied using different prototype cells, performing different experiments, displaying different figures of merit, and developing different computational analyses. Therefore, the real usefulness and impact of the findings presented in each study for the RS technology will be also different. This manuscript describes the most recommendable methodologies for the fabrication, characterization, and simulation of RS devices, as well as the proper methods to display the data obtained. The idea is to help the scientific community to evaluate the real usefulness and impact of an RS study for the development of RS technology.

Recommended Methods to Study Resistive Switching Devices / Lanza, M., Wong, H.-S.P., Pop, E., Ielmini, D., Strukov, D., Regan, B.C., Larcher, L., Villena, M.A., Yang, J.J., Goux, L., Belmonte, A., Yang, Y., Puglisi, F.M., Kang, J., Magyari-Köpe, B., Yalon, E., Kenyon, A., Buckwell, M., Mehonic, A., Shluger, A., et al.. - In: ADVANCED ELECTRONIC MATERIALS. - ISSN 2199-160X. - 5:1(2019), pp. 1-28. [10.1002/aelm.201800143]

Recommended Methods to Study Resistive Switching Devices

Larcher, Luca;Puglisi, Francesco M.;Padovani, Andrea;Pavan, Paolo;
2019

Abstract

Resistive switching (RS) is an interesting property shown by some materials systems that, especially during the last decade, has gained a lot of interest for the fabrication of electronic devices, with electronic nonvolatile memories being those that have received the most attention. The presence and quality of the RS phenomenon in a materials system can be studied using different prototype cells, performing different experiments, displaying different figures of merit, and developing different computational analyses. Therefore, the real usefulness and impact of the findings presented in each study for the RS technology will be also different. This manuscript describes the most recommendable methodologies for the fabrication, characterization, and simulation of RS devices, as well as the proper methods to display the data obtained. The idea is to help the scientific community to evaluate the real usefulness and impact of an RS study for the development of RS technology.
2019
5
1
1
28
Recommended Methods to Study Resistive Switching Devices / Lanza, M., Wong, H.-S.P., Pop, E., Ielmini, D., Strukov, D., Regan, B.C., Larcher, L., Villena, M.A., Yang, J.J., Goux, L., Belmonte, A., Yang, Y., Puglisi, F.M., Kang, J., Magyari-Köpe, B., Yalon, E., Kenyon, A., Buckwell, M., Mehonic, A., Shluger, A., et al.. - In: ADVANCED ELECTRONIC MATERIALS. - ISSN 2199-160X. - 5:1(2019), pp. 1-28. [10.1002/aelm.201800143]
Lanza, Mario; Wong, H. -S. Philip; Pop, Eric; Ielmini, Daniele; Strukov, Dimitri; Regan, Brian C.; Larcher, Luca; Villena, Marco A.; Yang, J. Joshua; ...espandi
File in questo prodotto:
File Dimensione Formato  
VQR_aelm201800143.pdf

Accesso riservato

Tipologia: VOR - Versione pubblicata dall'editore
Dimensione 5.12 MB
Formato Adobe PDF
5.12 MB Adobe PDF   Visualizza/Apri   Richiedi una copia
AEM 2019 - Accepted.pdf

Open access

Tipologia: AAM - Versione dell'autore revisionata e accettata per la pubblicazione
Dimensione 2.8 MB
Formato Adobe PDF
2.8 MB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

Licenza Creative Commons
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1175102
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 627
  • ???jsp.display-item.citation.isi??? 608
  • OpenAlex ND
social impact