VANDELLI, LUCA
 Distribuzione geografica
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Continente #
NA - Nord America 4.015
EU - Europa 1.221
AS - Asia 660
Continente sconosciuto - Info sul continente non disponibili 7
SA - Sud America 7
OC - Oceania 3
Totale 5.913
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Nazione #
US - Stati Uniti d'America 3.998
GB - Regno Unito 439
IT - Italia 213
CN - Cina 207
SG - Singapore 199
SE - Svezia 163
DE - Germania 103
UA - Ucraina 95
HK - Hong Kong 94
TR - Turchia 90
FI - Finlandia 63
BG - Bulgaria 39
PT - Portogallo 37
FR - Francia 26
CA - Canada 17
IN - India 17
KR - Corea 17
IR - Iran 14
RU - Federazione Russa 14
TW - Taiwan 11
IE - Irlanda 9
EU - Europa 6
NL - Olanda 6
BR - Brasile 4
CH - Svizzera 4
AU - Australia 3
ID - Indonesia 3
IL - Israele 3
RO - Romania 3
CL - Cile 2
JP - Giappone 2
MY - Malesia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
BE - Belgio 1
ES - Italia 1
HU - Ungheria 1
KZ - Kazakistan 1
MD - Moldavia 1
PE - Perù 1
SI - Slovenia 1
Totale 5.913
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Città #
Fairfield 648
Woodbridge 394
Southend 388
Ashburn 339
Chandler 299
Houston 267
Seattle 257
Ann Arbor 218
Wilmington 214
Jacksonville 187
Cambridge 182
Dearborn 178
Singapore 166
Nyköping 133
Modena 122
Hong Kong 85
Izmir 64
San Diego 64
Beijing 47
Santa Clara 44
Princeton 41
Sofia 38
Eugene 37
Helsinki 29
New York 25
Redwood City 24
London 22
Des Moines 16
Chicago 15
Grafing 14
Falls Church 13
Boardman 10
Hefei 10
Norwalk 9
Shanghai 9
Ardabil 8
Bremen 8
Dongguan 8
Saint Petersburg 8
San Mateo 8
Taipei 8
Toronto 8
Dublin 7
Los Angeles 7
Augusta 6
Prescot 6
Stanford 6
Varallo 6
Zhengzhou 6
Jodhpur 5
Milan 5
Ottawa 5
Verona 5
Wuhan 5
Bologna 4
Council Bluffs 4
Frontone 4
Jinan 4
Kilburn 4
Leawood 4
Monmouth Junction 4
Mountain View 4
New Delhi 4
Santa Barbara 4
Bruneck 3
Carrara 3
Chiswick 3
Davis 3
Delft 3
Fuzhou 3
Grenoble 3
Gurgaon 3
Kunming 3
Mumbai 3
Nanjing 3
Paris 3
Phoenix 3
San Francisco 3
Southwark 3
São Paulo 3
Andover 2
Caivano 2
Chengdu 2
Dallas 2
Frankfurt am Main 2
Guangzhou 2
Hounslow 2
Jakarta 2
Kuala Lumpur 2
Mestre 2
Palermo 2
Pavia 2
Rozzano 2
Sherbrooke 2
Storrs Mansfield 2
Suwon 2
Tainan City 2
Udine 2
Aesch 1
Alexandria 1
Totale 4.859
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Nome #
A microscopic physical description of RTN current fluctuations in HfOx RRAM 214
Progresses in Modeling HfOx RRAM Operations and Variability 208
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 206
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 195
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 192
Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability 191
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 191
Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM 185
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 185
Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories 176
A simulation framework for modeling charge transport and degradation in high-k stacks 175
Metal oxide resistive memory switching mechanism based on conductive filament properties 174
Electrical defect spectroscopy and reliability prediction through a novel simulation-based methodology 174
Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching 170
Grain boundary-driven leakage path formation in HfO2 dielectrics 169
Microscopic Modeling of Electrical Stress -Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics 163
Connecting the physical and electrical properties of Hafnia-based RRAM 161
Threshold Shift Observed in Resistive Switching in Metal-Oxide-Semiconductor Transistors and the Effect of Forming Gas Anneal 160
Microscopic understanding and modeling of HfO2 RRAM device physics 160
Metal oxide RRAM switching mechanism based on conductive filament microscopic properties 159
SrTiOx for sub-20 nm DRAM technology nodes - Characterization and modeling 156
A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs 155
Role of Holes and Electrons During Erase of TANOS Memories: Evidences for Dipole Formation and its Impact on Reliability 151
A New Physical Method Based on CV--GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High-k/III--V MOSFETs 151
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 148
A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High-k Gate-Stacks 148
Random telegraph noise (RTN) in scaled RRAM devices 147
Physical modeling of charge transport and degradation in HfO 2 stacks for logic device and memory applications 139
Modeling the Effects of Different Forming Conditions on RRAM Conductive Filament Stability 135
Modeling of the forming operation in HfO2-base resistive switching memories 133
A Physical model of the temperature dependence of the current through SiO2/HfO2 stacks 132
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs 129
Cross-correlation of electrical measurements via physics-based device simulations: Linking electrical and structural characteristics 127
Multiscale modeling of electron-ion interactions for engineering novel electronic device and materials 125
Modeling Temperature Dependency (6 - 400K) of the Leakage Current Through the SiO2/High-K Stacks 117
Low Power RRAM with Improved HRS/LRS Uniformity through Efficient Filament Control Using CVS Forming 113
Defect spectroscopy and engineering for nanoscale electron device applications: A novel simulation-based methodology 111
Modeling the charge transport and degradation in HfO 2 dielectric for reliability improvement and life-time predictions in logic and memory devices 57
Totale 5.982
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Categoria #
all - tutte 24.556
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 24.556
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.080 0 0 0 0 178 219 245 133 150 49 62 44
2020/20211.007 82 34 74 87 91 77 81 146 72 121 81 61
2021/2022784 36 104 74 31 9 52 44 38 97 62 172 65
2022/2023714 54 84 62 59 94 134 4 88 92 4 22 17
2023/2024490 12 38 35 59 116 61 24 65 5 7 24 44
2024/2025312 102 14 18 136 42 0 0 0 0 0 0 0
Totale 5.982