VANDELLI, LUCA
 Distribuzione geografica
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Continente #
NA - Nord America 4.458
EU - Europa 1.288
AS - Asia 774
Continente sconosciuto - Info sul continente non disponibili 7
SA - Sud America 7
OC - Oceania 3
Totale 6.537
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Nazione #
US - Stati Uniti d'America 4.441
GB - Regno Unito 440
CN - Cina 223
IT - Italia 213
SG - Singapore 204
HK - Hong Kong 184
SE - Svezia 171
DE - Germania 106
UA - Ucraina 95
TR - Turchia 90
FI - Finlandia 76
RU - Federazione Russa 50
BG - Bulgaria 39
PT - Portogallo 37
FR - Francia 26
CA - Canada 17
IN - India 17
KR - Corea 17
IR - Iran 14
TW - Taiwan 11
IE - Irlanda 9
NL - Olanda 9
EU - Europa 6
BR - Brasile 4
CH - Svizzera 4
AU - Australia 3
ID - Indonesia 3
IL - Israele 3
RO - Romania 3
CL - Cile 2
HU - Ungheria 2
JP - Giappone 2
KZ - Kazakistan 2
MY - Malesia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
AT - Austria 1
BE - Belgio 1
CY - Cipro 1
ES - Italia 1
KG - Kirghizistan 1
LV - Lettonia 1
MD - Moldavia 1
PE - Perù 1
SI - Slovenia 1
Totale 6.537
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Città #
Fairfield 648
Santa Clara 457
Woodbridge 394
Southend 388
Ashburn 339
Chandler 299
Houston 267
Seattle 257
Ann Arbor 218
Wilmington 214
Jacksonville 187
Cambridge 182
Dearborn 178
Hong Kong 175
Singapore 171
Nyköping 133
Modena 122
Izmir 64
San Diego 64
Beijing 49
Helsinki 42
Princeton 41
Sofia 38
Eugene 37
New York 25
Redwood City 24
London 23
Moscow 19
Des Moines 16
Chicago 15
Grafing 14
Falls Church 13
Boardman 10
Hefei 10
Norwalk 9
Shanghai 9
Ardabil 8
Bremen 8
Dongguan 8
Los Angeles 8
Saint Petersburg 8
San Mateo 8
Taipei 8
Toronto 8
Dublin 7
Augusta 6
Council Bluffs 6
Prescot 6
Stanford 6
Varallo 6
Wuhan 6
Zhengzhou 6
Jodhpur 5
Milan 5
Ottawa 5
Verona 5
Bologna 4
Frontone 4
Jinan 4
Kilburn 4
Leawood 4
Monmouth Junction 4
Mountain View 4
New Delhi 4
Santa Barbara 4
Bruneck 3
Carrara 3
Chiswick 3
Davis 3
Delft 3
Falkenstein 3
Fuzhou 3
Grenoble 3
Guangzhou 3
Gurgaon 3
Kunming 3
Mumbai 3
Nanjing 3
Paris 3
Phoenix 3
San Francisco 3
Southwark 3
São Paulo 3
Almaty 2
Andover 2
Caivano 2
Chengdu 2
Dallas 2
Frankfurt am Main 2
Hounslow 2
Jakarta 2
Kuala Lumpur 2
Mestre 2
Palermo 2
Pavia 2
Rozzano 2
Shenyang 2
Sherbrooke 2
Storrs Mansfield 2
Suwon 2
Totale 5.408
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Nome #
A microscopic physical description of RTN current fluctuations in HfOx RRAM 234
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 224
Progresses in Modeling HfOx RRAM Operations and Variability 222
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 219
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 209
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 209
Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability 208
Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM 198
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 198
Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories 196
Metal oxide resistive memory switching mechanism based on conductive filament properties 193
Grain boundary-driven leakage path formation in HfO2 dielectrics 192
A simulation framework for modeling charge transport and degradation in high-k stacks 190
Electrical defect spectroscopy and reliability prediction through a novel simulation-based methodology 188
Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching 184
Microscopic understanding and modeling of HfO2 RRAM device physics 179
Metal oxide RRAM switching mechanism based on conductive filament microscopic properties 177
Connecting the physical and electrical properties of Hafnia-based RRAM 177
Microscopic Modeling of Electrical Stress -Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics 177
Threshold Shift Observed in Resistive Switching in Metal-Oxide-Semiconductor Transistors and the Effect of Forming Gas Anneal 175
A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs 174
SrTiOx for sub-20 nm DRAM technology nodes - Characterization and modeling 171
A New Physical Method Based on CV--GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High-k/III--V MOSFETs 166
Role of Holes and Electrons During Erase of TANOS Memories: Evidences for Dipole Formation and its Impact on Reliability 165
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 165
A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High-k Gate-Stacks 163
Random telegraph noise (RTN) in scaled RRAM devices 162
Physical modeling of charge transport and degradation in HfO 2 stacks for logic device and memory applications 157
Modeling of the forming operation in HfO2-base resistive switching memories 153
A Physical model of the temperature dependence of the current through SiO2/HfO2 stacks 152
Modeling the Effects of Different Forming Conditions on RRAM Conductive Filament Stability 149
Cross-correlation of electrical measurements via physics-based device simulations: Linking electrical and structural characteristics 144
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs 143
Multiscale modeling of electron-ion interactions for engineering novel electronic device and materials 137
Modeling Temperature Dependency (6 - 400K) of the Leakage Current Through the SiO2/High-K Stacks 133
Defect spectroscopy and engineering for nanoscale electron device applications: A novel simulation-based methodology 127
Low Power RRAM with Improved HRS/LRS Uniformity through Efficient Filament Control Using CVS Forming 125
Modeling the charge transport and degradation in HfO 2 dielectric for reliability improvement and life-time predictions in logic and memory devices 71
Totale 6.606
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Categoria #
all - tutte 26.182
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 26.182
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020683 0 0 0 0 0 0 245 133 150 49 62 44
2020/20211.007 82 34 74 87 91 77 81 146 72 121 81 61
2021/2022784 36 104 74 31 9 52 44 38 97 62 172 65
2022/2023714 54 84 62 59 94 134 4 88 92 4 22 17
2023/2024490 12 38 35 59 116 61 24 65 5 7 24 44
2024/2025936 102 14 18 136 324 244 98 0 0 0 0 0
Totale 6.606