VANDELLI, LUCA
 Distribuzione geografica
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Continente #
NA - Nord America 3.922
EU - Europa 1.202
AS - Asia 391
Continente sconosciuto - Info sul continente non disponibili 7
SA - Sud America 7
OC - Oceania 3
Totale 5.532
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Nazione #
US - Stati Uniti d'America 3.907
GB - Regno Unito 438
IT - Italia 202
SE - Svezia 161
CN - Cina 137
DE - Germania 101
UA - Ucraina 95
TR - Turchia 89
HK - Hong Kong 87
FI - Finlandia 63
BG - Bulgaria 39
PT - Portogallo 37
FR - Francia 25
KR - Corea 17
SG - Singapore 16
CA - Canada 15
IN - India 13
RU - Federazione Russa 13
TW - Taiwan 11
IR - Iran 10
IE - Irlanda 9
EU - Europa 6
NL - Olanda 6
BR - Brasile 4
AU - Australia 3
CH - Svizzera 3
ID - Indonesia 3
IL - Israele 3
RO - Romania 3
CL - Cile 2
JP - Giappone 2
MY - Malesia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AD - Andorra 1
AL - Albania 1
BE - Belgio 1
ES - Italia 1
HU - Ungheria 1
KZ - Kazakistan 1
MD - Moldavia 1
PE - Perù 1
SI - Slovenia 1
Totale 5.532
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Città #
Fairfield 648
Woodbridge 394
Southend 388
Ashburn 339
Chandler 299
Houston 267
Seattle 257
Ann Arbor 218
Wilmington 214
Jacksonville 187
Cambridge 182
Dearborn 178
Nyköping 133
Modena 122
Hong Kong 85
Izmir 64
San Diego 64
Beijing 45
Princeton 41
Sofia 38
Eugene 37
Helsinki 29
Redwood City 24
New York 22
London 21
Des Moines 16
Grafing 14
Falls Church 13
Hefei 10
Norwalk 9
Ardabil 8
Bremen 8
Dongguan 8
Saint Petersburg 8
San Mateo 8
Taipei 8
Dublin 7
Los Angeles 7
Augusta 6
Prescot 6
Stanford 6
Toronto 6
Varallo 6
Jodhpur 5
Ottawa 5
Verona 5
Zhengzhou 5
Bologna 4
Council Bluffs 4
Frontone 4
Jinan 4
Kilburn 4
Leawood 4
Milan 4
Monmouth Junction 4
Mountain View 4
Santa Barbara 4
Shanghai 4
Wuhan 4
Bruneck 3
Carrara 3
Chicago 3
Chiswick 3
Davis 3
Delft 3
Grenoble 3
Gurgaon 3
Kunming 3
Mumbai 3
Nanjing 3
Phoenix 3
San Francisco 3
Southwark 3
São Paulo 3
Andover 2
Boardman 2
Caivano 2
Chengdu 2
Dallas 2
Fuzhou 2
Guangzhou 2
Hounslow 2
Jakarta 2
Kuala Lumpur 2
Mestre 2
Paris 2
Pavia 2
Rozzano 2
Sherbrooke 2
Storrs Mansfield 2
Suwon 2
Tainan City 2
Aesch 1
Alexandria 1
Almaty 1
Atlanta 1
Austin 1
Baotou 1
Bari 1
Brisbane 1
Totale 4.607
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Nome #
A microscopic physical description of RTN current fluctuations in HfOx RRAM 199
Progresses in Modeling HfOx RRAM Operations and Variability 198
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 195
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 184
Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability 183
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 177
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 176
Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM 174
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 170
Metal oxide resistive memory switching mechanism based on conductive filament properties 168
Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories 167
A simulation framework for modeling charge transport and degradation in high-k stacks 166
Grain boundary-driven leakage path formation in HfO2 dielectrics 162
Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching 161
Electrical defect spectroscopy and reliability prediction through a novel simulation-based methodology 158
Microscopic Modeling of Electrical Stress -Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics 157
Threshold Shift Observed in Resistive Switching in Metal-Oxide-Semiconductor Transistors and the Effect of Forming Gas Anneal 154
Microscopic understanding and modeling of HfO2 RRAM device physics 153
Metal oxide RRAM switching mechanism based on conductive filament microscopic properties 152
SrTiOx for sub-20 nm DRAM technology nodes - Characterization and modeling 149
A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs 147
Connecting the physical and electrical properties of Hafnia-based RRAM 146
Random telegraph noise (RTN) in scaled RRAM devices 143
Role of Holes and Electrons During Erase of TANOS Memories: Evidences for Dipole Formation and its Impact on Reliability 142
A New Physical Method Based on CV--GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High-k/III--V MOSFETs 140
A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High-k Gate-Stacks 136
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 135
Physical modeling of charge transport and degradation in HfO 2 stacks for logic device and memory applications 130
Modeling the Effects of Different Forming Conditions on RRAM Conductive Filament Stability 130
A Physical model of the temperature dependence of the current through SiO2/HfO2 stacks 124
Modeling of the forming operation in HfO2-base resistive switching memories 121
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs 119
Cross-correlation of electrical measurements via physics-based device simulations: Linking electrical and structural characteristics 118
Multiscale modeling of electron-ion interactions for engineering novel electronic device and materials 116
Modeling Temperature Dependency (6 - 400K) of the Leakage Current Through the SiO2/High-K Stacks 110
Defect spectroscopy and engineering for nanoscale electron device applications: A novel simulation-based methodology 102
Low Power RRAM with Improved HRS/LRS Uniformity through Efficient Filament Control Using CVS Forming 93
Modeling the charge transport and degradation in HfO 2 dielectric for reliability improvement and life-time predictions in logic and memory devices 46
Totale 5.601
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Categoria #
all - tutte 20.915
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 20.915
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019408 0 0 0 0 0 0 0 0 0 63 179 166
2019/20201.382 111 48 28 115 178 219 245 133 150 49 62 44
2020/20211.007 82 34 74 87 91 77 81 146 72 121 81 61
2021/2022784 36 104 74 31 9 52 44 38 97 62 172 65
2022/2023714 54 84 62 59 94 134 4 88 92 4 22 17
2023/2024421 12 38 35 59 116 61 24 65 5 6 0 0
Totale 5.601