VANDELLI, LUCA

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 36 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autore(i)
1	Threshold Shift Observed in Resistive Switching in Metal-Oxide-Semiconductor Transistors and the Effect of Forming Gas Anneal	2011	W.H. Liu; K.L. Pey; X. Wu; N. Raghavan; A. Padovani; L. Larcher; L. Vandelli; M. Bosman; T. Kauerauf
2	SrTiO<inf>x</inf> for sub-20 nm DRAM technology nodes - Characterization and modeling	2015	Kaczer, B.; Larcher, L.; Vandelli, L.; Reisinger, H.; Popovici, M.; Clima, S.; Ji, Z.; Joshi, S.; Swerts, J.; Redolfi, A.; Afanas'Ev, V.V.; Jurczak, M.
3	A simulation framework for modeling charge transport and degradation in high-k stacks	2013	L. Larcher; A. Padovani; L. Vandelli
4	Role of Holes and Electrons During Erase of TANOS Memories: Evidences for Dipole Formation and its Impact on Reliability	2010	Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Antonio, Arreghini; Geert Van den bosch, ; Malgorzata, Jurczak; Jan Van Houdt, ; Vincenzo Della Marca, ; Pavan, Paolo
5	Random telegraph noise (RTN) in scaled RRAM devices	2013	Veksler, D.; Bersuker, G.; Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Muraviev, A.; Chakrabarti, B.; Vogel, E.; Gilmer, D. C.; Kirsch, P. D.
6	Progresses in Modeling HfOx RRAM Operations and Variability	2014	Larcher, Luca.; Pirrotta, Onofrio.; Puglisi, Francesco M.; Padovani, Andrea.; Pavan, Paolo.; Vandelli, Luca
7	A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction	2011	L. Vandelli; G. Bersuker; A. Padovani; J.H. Yum; L. Larcher; P. Pavan
8	A Physical model of the temperature dependence of the current through SiO2/HfO2 stacks	2011	L. Vandelli; A. Padovani; L. Larcher; R.G. Southwick III; W.B. Knowlton; G. Bersuker
9	A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs	2015	Sereni, Gabriele; Larcher, Luca; Vandelli, Luca; Veksler, D.; Kim, T.; Koh, D.; Bersuker, Gennadi
10	A New Physical Method Based on CV--GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High-k/III--V MOSFETs	2015	Sereni, Gabriele; Vandelli, Luca; Veksler, Dmitry; Larcher, Luca
11	Multiscale modeling of electron-ion interactions for engineering novel electronic device and materials	2016	Larcher, Luca; Puglisi, Francesco Maria; Padovani, Andrea; Vandelli, Luca; Pavan, Paolo
12	Modeling the Effects of Different Forming Conditions on RRAM Conductive Filament Stability	2013	Butcher, B.; Bersuker, G.; Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Kalantarian, A.; Geer, R.; Gilmer, D. C.
13	Modeling the Charge Transport and Degradation in HfO2 Dielectric for Reliability Improvement and Life-Time Predictions in Logic and Memory Devices	2011	A. Padovani; L. Larcher; L. Vandelli; O. Pirrotta; P. Pavan
14	Modeling Temperature Dependency (6 - 400K) of the Leakage Current Through the SiO2/High-K Stacks	2010	Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Bersuker, G.; Southwick III, R. G.; Knowlton, W. B.
15	Modeling of the forming operation in HfO2-base resistive switching memories	2011	L. Vandelli; A. Padovani; L. Larcher; G. Bersuker; D. Gilmer; P. Pavan
16	Microscopic understanding and modeling of HfO2 RRAM device physics	2012	Larcher, Luca; Padovani, Andrea; Pirrotta, Onofrio; Vandelli, Luca; Bersuker, G.
17	A microscopic physical description of RTN current fluctuations in HfO<inf>x</inf> RRAM	2015	Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
18	Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching	2015	Padovani, Andrea; Larcher, Luca; Pirrotta, Onofrio; Vandelli, Luca; Bersuker, Gennadi
19	Microscopic Modeling of Electrical Stress -Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics	2013	L. Vandelli; A. Padovani; L. Larcher; G. Bersuker
20	Metal oxide RRAM switching mechanism based on conductive filament microscopic properties	2010	Bersuker, G.; Gilmer, D. C.; Veksler, D.; Yum, J.; Park, H.; Lian, S.; Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Mckenna, K.; Shluger, A.; Iglesias, V.; Porti, M.; Nafría, M.; Taylor, W.; Kirsch, P. D.; Jammy, R.

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VANDELLI, LUCA