VANDELLI, LUCA
 Distribuzione geografica
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Continente #
EU - Europa 11
Totale 11
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Nazione #
IT - Italia 11
Totale 11
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Città #
Modena 11
Totale 11
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Nome #
A Physical model of the temperature dependence of the current through SiO2/HfO2 stacks, file e31e124b-5bcd-987f-e053-3705fe0a095a 2
Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching, file e31e124c-b7e2-987f-e053-3705fe0a095a 2
Microscopic Modeling of Electrical Stress -Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics, file e31e124b-6b1d-987f-e053-3705fe0a095a 1
SrTiOx for sub-20 nm DRAM technology nodes - Characterization and modeling, file e31e124c-ac03-987f-e053-3705fe0a095a 1
A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs, file e31e124c-ac0d-987f-e053-3705fe0a095a 1
A New Physical Method Based on CV--GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High-k/III--V MOSFETs, file e31e124c-b503-987f-e053-3705fe0a095a 1
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs, file e31e124d-bebd-987f-e053-3705fe0a095a 1
Cross-correlation of electrical measurements via physics-based device simulations: Linking electrical and structural characteristics, file e31e124d-d877-987f-e053-3705fe0a095a 1
Multiscale modeling of electron-ion interactions for engineering novel electronic device and materials, file e31e124f-0e22-987f-e053-3705fe0a095a 1
Totale 11
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Categoria #
all - tutte 11
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 11
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20202 0 0 0 1 1 0 0 0 0 0 0 0
2020/20211 0 0 0 0 1 0 0 0 0 0 0 0
2021/20221 0 0 0 0 0 0 0 1 0 0 0 0
Totale 11