FRABBONI, Stefano
 Distribuzione geografica
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Continente #
NA - Nord America 15034
EU - Europa 6725
AS - Asia 743
Continente sconosciuto - Info sul continente non disponibili 15
SA - Sud America 11
AF - Africa 7
OC - Oceania 5
Totale 22540
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Nazione #
US - Stati Uniti d'America 14952
GB - Regno Unito 3282
DE - Germania 833
SE - Svezia 799
IT - Italia 690
UA - Ucraina 402
CN - Cina 356
TR - Turchia 286
BG - Bulgaria 164
FI - Finlandia 162
FR - Francia 151
CA - Canada 79
RU - Federazione Russa 62
IE - Irlanda 57
BE - Belgio 35
IN - India 27
NL - Olanda 17
JP - Giappone 16
EU - Europa 15
RO - Romania 15
VN - Vietnam 15
CH - Svizzera 10
GR - Grecia 9
MY - Malesia 9
KR - Corea 8
BR - Brasile 7
ES - Italia 6
AT - Austria 5
CZ - Repubblica Ceca 5
AU - Australia 4
MD - Moldavia 4
TW - Taiwan 4
CL - Cile 3
IR - Iran 3
PL - Polonia 3
SG - Singapore 3
DK - Danimarca 2
ET - Etiopia 2
HK - Hong Kong 2
ID - Indonesia 2
MX - Messico 2
NO - Norvegia 2
SM - San Marino 2
TH - Thailandia 2
ZA - Sudafrica 2
AE - Emirati Arabi Uniti 1
BA - Bosnia-Erzegovina 1
BD - Bangladesh 1
DO - Repubblica Dominicana 1
EE - Estonia 1
GE - Georgia 1
HU - Ungheria 1
IQ - Iraq 1
KH - Cambogia 1
KZ - Kazakistan 1
LA - Repubblica Popolare Democratica del Laos 1
LK - Sri Lanka 1
LU - Lussemburgo 1
LV - Lettonia 1
MA - Marocco 1
MC - Monaco 1
NG - Nigeria 1
NZ - Nuova Zelanda 1
OM - Oman 1
PE - Perù 1
PH - Filippine 1
PT - Portogallo 1
SI - Slovenia 1
TN - Tunisia 1
Totale 22540
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Città #
Southend 2960
Fairfield 2587
Woodbridge 1586
Houston 1316
Chandler 1095
Ashburn 1006
Seattle 991
Jacksonville 931
Cambridge 893
Wilmington 845
Ann Arbor 815
Dearborn 618
Nyköping 493
San Diego 221
Modena 197
Princeton 186
Izmir 165
Sofia 163
Des Moines 157
Grafing 156
Eugene 151
Beijing 127
Redwood City 90
Bremen 81
Philadelphia 73
London 62
Montréal 61
Dublin 57
Munich 55
Milan 50
Mcallen 40
Brussels 35
Hefei 34
Falls Church 33
Guangzhou 30
Kunming 25
Norwalk 25
Helsinki 24
Nanjing 23
San Mateo 22
Boardman 15
Jinan 14
New York 14
Padova 14
Rome 14
Bologna 13
Verona 13
Auburn Hills 12
Dong Ket 12
Scuola 11
Fuzhou 10
Toronto 10
Indiana 9
Nanchang 9
Parma 9
Torino 9
Andover 8
Islington 8
Los Angeles 8
Mountain View 8
Tokyo 8
Como 7
Phoenix 7
Tulare 7
Changsha 6
Chicago 6
Columbus 6
Florence 6
Reggio Nell'emilia 6
San Francisco 6
Ottawa 5
Saint Petersburg 5
Sant'Ilario d'Enza 5
Terni 5
Cardiff 4
Catanzaro 4
Chisinau 4
Chongqing 4
Clearwater 4
Frankfurt am Main 4
Leawood 4
Minneapolis 4
Redmond 4
Rovereto 4
Shaoxing 4
Shenyang 4
São Paulo 4
Wenzhou 4
Amsterdam 3
Augusta 3
Bangalore 3
Bolzano 3
Chavannes 3
Chengdu 3
Genoa 3
Groningen 3
Hanoi 3
Hebei 3
Madrid 3
Novara 3
Totale 18876
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Nome #
High figures of merit in degenerate semiconductors. Energy filtering by grain boundaries in heavily doped polycrystalline silicon 350
Holographic generation of highly twisted electron beams 248
Il microscopio ottico a proiezione come modello per introdurre la microscopia elettronica in trasmissione 246
Assembly and structure of Ni/NiO core–shell nanoparticles 235
Assembly and Fine Analysis of Ni/MgO Core/Shell Nanoparticles 231
Structure and stability of nickel/nickel oxide core-shell nanoparticles 228
Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures 223
Observation of nanoscale magnetic fields using twisted electron beams 209
Thermal desorption spectra from cavities in helium-implanted silicon 202
Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon 202
Vacancy-gettering in silicon: Cavities and helium-implantation 199
Measuring the orbital angular momentum spectrum of an electron beam 198
Highly efficient electron vortex beams generated by nanofabricated phase holograms 196
Generation of Nondiffracting Electron Bessel Beams 195
HYDROGEN-RELATED COMPLEXES AS THE STRESSING SPECIES IN HIGH-FLUENCE, HYDROGEN-IMPLANTED, SINGLE-CRYSTAL SILICON 195
Focused Electron Beam Deposition of Nanowires from Cobalt Tricarbonyl Nitrosyl (Co(CO)(3)NO) Precursor 191
Experimental realization of the Ehrenberg-Siday thought experiment 190
Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment 190
Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography 189
Single-metalloprotein wet biotransistor 188
Helium-implanted silicon: A study of bubble precursors 182
Structured quantum waves 182
Hydrogen precipitation in highly oversaturated single-crystalline silicon 181
Transmission electron microscopy study of helium implanted silicon 181
Controlled growth of Ni/NiO core–shell nanoparticles: Structure, morphology and tuning of magnetic properties 179
Combination of Electron Energy-loss Spectroscopy and Orbital Angular Momentum Spectroscopy. Applications to Electron Magnetic Chiral Dichroism, Plasmon-loss, and Core-loss 179
Build-up of interference patterns with single electrons 179
Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM 178
Nanocavities in silicon: An infrared investigation of internal surface reconstruction after hydrogen implantation 177
Stress and interface morphology contributions in the crystallization kinetics of a GexSi1-x thin layer on (100)Si 173
Morphological and mechanical characterization of composite calcite/SWCNT–COOH single crystals 172
Power Factor Enhancement by Inhomogeneous Distribution of Dopants in Two-Phase Nanocrystalline Systems 170
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment 169
Giant radiation damage produced by the impact of heavy molecular ions onto silicon single crystal 168
High-dose helium-implanted single-crystal silicon: Annealing behavior 168
Generation and application of bessel beams in electron microscopy 168
Adsorption equilibria and kinetics of H2 at nearly ideal (2 x 1) Si(1 0 0) inner surfaces 167
Using evidence from nanocavities to assess the vibrational properties of external surfaces 166
Electrical characterization of suspended Pt nanowires grown by EBID with water vapour assistance 165
Strain field reconstruction in shallow trench isolation structures by CBED and LACBED 164
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector 164
Processing high-quality silicon for microstrip detectors 163
Silicon interstitials generation during the exposure of silicon to hydrogen plasma 162
ANALYTICAL ELECTRON-MICROSCOPY OF SI1-XGEX/SI HETEROSTRUCTURES AND LOCAL ISOLATION STRUCTURES 162
HRTEM and HAADF analysis of Ni Multi-Twinned Nanoparticles 162
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up 162
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 162
Strain mapping in deep sub-micron Si devices by convergent beam electron diffraction in the STEM 161
Fabrication of FeSi and Fe3Si compounds by electron beam induced mixing of [Fe/Si]2 and [Fe3/Si]2 multilayers grown by focused electron beam induced deposition 161
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densities 160
Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition 160
FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient 160
A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction 160
Simultaneous increase in electrical conductivity and Seebeck coefficient in highly boron-doped nanocrystalline Si 159
Controlled co-deposition of FePt nanoparticles embedded in MgO: a detailed investigation of structure and electronic and magnetic properties 159
Effects of thermal annealing on the structural properties of sputtered W-Si-N diffusion barriers 159
Fabrication by electron beam induced deposition and transmission electron microscopic characterization of sub-10-nm freestanding Pt nanowires 159
Young's double-slit interference experiment with electrons 159
Two and three slit electron interference and diffraction experiments 157
Impact of energy filtering and carrier localization on the thermoelectric properties of granular semiconductors 157
Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures 157
TEM study of annealed Pt nanostructures grown by electron beam induced deposition 156
Evidence for H-2 at high pressure in the silicon nanocavities after dipping in HF solution 154
On the silicon dioxide/polycrystalline silicon interface width measurement 154
Orbital Angular Momentum and Energy Loss Characterization of Plasmonic Excitations in Metallic Nanostructures in TEM 154
Paradoxical Enhancement of the Power Factor of Polycrystalline Silicon as a Result of the Formation of Nanovoids 153
Hydrogen and helium bubbles in silicon 152
Structural properties of reactively sputtered W-Si-N thin films 150
Silicon de novo: Energy filtering and enhanced thermoelectric performances of nanocrystalline silicon and silicon alloys 150
Electron-Beam Shaping in the Transmission Electron Microscope: Control of Electron-Beam Propagation Along Atomic Columns 146
Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon 145
Transmission Electron Microscopy study of Helium Implanted Silicon 145
The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films 145
Innovative Phase Plates for Beam Shaping 144
Nanovoid Formation and Dynamics in He+-Implanted Nanocrystalline Silicon 144
Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires 144
Effect of Nanocavities on the Thermoelectric Properties of Polycrystalline Silicon 143
The Young-Feynman controlled double-slit electron interference experiment 143
INFLUENCE OF IMPLANT DOSE AND TARGET TEMPERATURE ON CRYSTAL QUALITY AND JUNCTION DEPTH OF BORON-DOPED SILICON LAYERS 142
Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction 142
Four slits interference and diffraction experiments 141
Transmission Electron Microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition 140
Bulk mismatch values of heterostructures as determined from convergent beam electron diffraction on thin cross sections 139
Alloy multilayers and ternary nanostructures by direct-write approach 139
Static disorder depth profile in ion implanted materials by means of large angle convergent beam electron diffraction 138
Single-crystal silicon coimplanted by helium and hydrogen: Evolution of decorated vacancy like defects with thermal treatments 138
Low temperature dopant activation of BF2 implanted silicon 138
Hydrogen injection and retention in nanocavities of single-crystalline silicon 137
Dynamical simulation of LACBED patterns in cross-sectioned heterostructures 136
Fabrication of 5 nm gap pillar-electrodes by electron-beam Pt deposition 136
Growth kinetics of a displacement field in hydrogen implanted single crystalline silicon 135
Electron diffraction with ten nanometer beam size for strain analysis of nanodevices 133
Nondestructive Measurement of Orbital Angular Momentum for an Electron Beam 133
Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope 133
Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures 132
Strain in silicon below Si3N4 stripes, comparison between SUPREM IV calculation and TEM/CBED measurements 130
Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns 130
LATTICE STRAIN AND STATIC DISORDER IN HYDROGEN IMPLANTED AND ANNEALED SINGLE CRYSTAL SILICON AS DETERMINED BY LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION 130
Phase retrieval of an electron vortex beam using diffraction holography 129
Strain analysis in sub-micron silicon devices by TEM/CBED 129
Totale 16640
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Categoria #
all - tutte 50362
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 50362
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2017/201820 0000 00 00 00020
2018/20192733 5011323155 163145 19127 36329722779
2019/20206429 401309198432 741828 1202699 759243360257
2020/20215127 449166320403 546378 700498 380794292201
2021/20223110 152290464146 85138 343142 312260456322
2022/20233078 326331236212 411587 72302 442301218
Totale 22797