FRABBONI, Stefano
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 17.760
EU - Europa 7.403
AS - Asia 2.380
SA - Sud America 74
Continente sconosciuto - Info sul continente non disponibili 15
AF - Africa 13
OC - Oceania 10
Totale 27.655
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 17.673
GB - Regno Unito 3.377
IT - Italia 900
CN - Cina 882
DE - Germania 882
SE - Svezia 814
SG - Singapore 749
UA - Ucraina 406
HK - Hong Kong 302
TR - Turchia 288
FI - Finlandia 246
RU - Federazione Russa 233
BG - Bulgaria 165
FR - Francia 160
CA - Canada 80
BR - Brasile 67
IE - Irlanda 44
ID - Indonesia 33
IN - India 31
NL - Olanda 31
LT - Lituania 25
BE - Belgio 24
JP - Giappone 24
EU - Europa 15
RO - Romania 15
VN - Vietnam 15
CH - Svizzera 14
AT - Austria 12
AU - Australia 9
ES - Italia 9
GR - Grecia 9
MY - Malesia 9
CZ - Repubblica Ceca 8
KR - Corea 8
TW - Taiwan 6
AE - Emirati Arabi Uniti 5
PK - Pakistan 5
PL - Polonia 5
IR - Iran 4
MD - Moldavia 4
MX - Messico 4
ZA - Sudafrica 4
BD - Bangladesh 3
CL - Cile 3
HU - Ungheria 3
KZ - Kazakistan 3
TN - Tunisia 3
AR - Argentina 2
DK - Danimarca 2
DO - Repubblica Dominicana 2
ET - Etiopia 2
IQ - Iraq 2
LU - Lussemburgo 2
MA - Marocco 2
NO - Norvegia 2
PT - Portogallo 2
SI - Slovenia 2
SM - San Marino 2
TH - Thailandia 2
UZ - Uzbekistan 2
AM - Armenia 1
BA - Bosnia-Erzegovina 1
BY - Bielorussia 1
EE - Estonia 1
EG - Egitto 1
GE - Georgia 1
JM - Giamaica 1
KH - Cambogia 1
LA - Repubblica Popolare Democratica del Laos 1
LK - Sri Lanka 1
LV - Lettonia 1
MC - Monaco 1
NG - Nigeria 1
NZ - Nuova Zelanda 1
OM - Oman 1
PE - Perù 1
PH - Filippine 1
PY - Paraguay 1
Totale 27.655
Salva come PNG Salva come JPEG
Città #
Southend 2.975
Fairfield 2.615
Santa Clara 1.872
Woodbridge 1.592
Ashburn 1.352
Houston 1.335
Chandler 1.098
Seattle 1.031
Jacksonville 939
Cambridge 900
Wilmington 854
Ann Arbor 821
Dearborn 622
Singapore 567
Nyköping 496
Hong Kong 300
Beijing 231
San Diego 224
Modena 212
Princeton 188
Izmir 166
Sofia 164
Des Moines 157
Grafing 157
Eugene 152
Helsinki 100
Redwood City 91
Bremen 81
Moscow 71
Milan 69
London 66
Munich 64
Montréal 61
Dublin 44
Guangzhou 44
Shanghai 43
Mcallen 40
Philadelphia 39
New York 37
Hefei 35
Falls Church 33
Jakarta 32
Bologna 30
Rome 27
Kunming 25
Nanjing 25
Norwalk 25
Brussels 23
San Mateo 22
Kilburn 21
Boardman 18
Los Angeles 17
Padova 15
Jinan 14
Verona 13
Auburn Hills 12
Chiswick 12
Dong Ket 12
Fuzhou 11
Hounslow 11
Scuola 11
Como 10
Indiana 10
Parma 10
Reggio Emilia 10
Tokyo 10
Toronto 10
Amsterdam 9
Changsha 9
Nanchang 9
São Paulo 9
Torino 9
Andover 8
Mountain View 8
Chongqing 7
Phoenix 7
Shenyang 7
Shenzhen 7
Tulare 7
Turin 7
Chicago 6
Columbus 6
Falkenstein 6
Florence 6
Hangzhou 6
Islington 6
Novara 6
Prescot 6
Reggio Nell'emilia 6
San Francisco 6
Washington 6
Wuhan 6
Chengdu 5
Espoo 5
Groningen 5
Ottawa 5
Pisa 5
Saint Petersburg 5
Sant'Ilario d'Enza 5
Southwark 5
Totale 22.589
Salva come PNG Salva come JPEG
Nome #
High figures of merit in degenerate semiconductors. Energy filtering by grain boundaries in heavily doped polycrystalline silicon 374
Il microscopio ottico a proiezione come modello per introdurre la microscopia elettronica in trasmissione 348
Holographic generation of highly twisted electron beams 281
Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures 268
Assembly and structure of Ni/NiO core–shell nanoparticles 267
Structure and stability of nickel/nickel oxide core-shell nanoparticles 262
Assembly and Fine Analysis of Ni/MgO Core/Shell Nanoparticles 260
Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon 241
Observation of nanoscale magnetic fields using twisted electron beams 241
Vacancy-gettering in silicon: Cavities and helium-implantation 238
Thermal desorption spectra from cavities in helium-implanted silicon 231
Measuring the orbital angular momentum spectrum of an electron beam 227
Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment 226
Generation of Nondiffracting Electron Bessel Beams 225
Single-metalloprotein wet biotransistor 225
Focused Electron Beam Deposition of Nanowires from Cobalt Tricarbonyl Nitrosyl (Co(CO)(3)NO) Precursor 224
Experimental realization of the Ehrenberg-Siday thought experiment 222
Highly efficient electron vortex beams generated by nanofabricated phase holograms 219
Build-up of interference patterns with single electrons 219
HYDROGEN-RELATED COMPLEXES AS THE STRESSING SPECIES IN HIGH-FLUENCE, HYDROGEN-IMPLANTED, SINGLE-CRYSTAL SILICON 216
Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography 216
Transmission electron microscopy study of helium implanted silicon 216
Enhancement of the power factor in two-phase silicon-boron nanocrystalline alloys 215
Controlled growth of Ni/NiO core–shell nanoparticles: Structure, morphology and tuning of magnetic properties 214
Structured quantum waves 213
Helium-implanted silicon: A study of bubble precursors 212
Combination of Electron Energy-loss Spectroscopy and Orbital Angular Momentum Spectroscopy. Applications to Electron Magnetic Chiral Dichroism, Plasmon-loss, and Core-loss 211
Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM 210
Morphological and mechanical characterization of composite calcite/SWCNT–COOH single crystals 205
Nanocavities in silicon: An infrared investigation of internal surface reconstruction after hydrogen implantation 205
Hydrogen precipitation in highly oversaturated single-crystalline silicon 205
Adsorption equilibria and kinetics of H2 at nearly ideal (2 x 1) Si(1 0 0) inner surfaces 204
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment 201
Generation and application of bessel beams in electron microscopy 200
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector 200
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up 199
A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction 199
HRTEM and HAADF analysis of Ni Multi-Twinned Nanoparticles 198
Power Factor Enhancement by Inhomogeneous Distribution of Dopants in Two-Phase Nanocrystalline Systems 198
Electrical characterization of suspended Pt nanowires grown by EBID with water vapour assistance 197
Using evidence from nanocavities to assess the vibrational properties of external surfaces 197
Stress and interface morphology contributions in the crystallization kinetics of a GexSi1-x thin layer on (100)Si 196
Giant radiation damage produced by the impact of heavy molecular ions onto silicon single crystal 195
High-dose helium-implanted single-crystal silicon: Annealing behavior 195
Processing high-quality silicon for microstrip detectors 195
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densities 193
Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition 193
Young's double-slit interference experiment with electrons 193
Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures 193
ANALYTICAL ELECTRON-MICROSCOPY OF SI1-XGEX/SI HETEROSTRUCTURES AND LOCAL ISOLATION STRUCTURES 191
Strain field reconstruction in shallow trench isolation structures by CBED and LACBED 191
Fabrication of FeSi and Fe3Si compounds by electron beam induced mixing of [Fe/Si]2 and [Fe3/Si]2 multilayers grown by focused electron beam induced deposition 191
Strain mapping in deep sub-micron Si devices by convergent beam electron diffraction in the STEM 189
FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient 189
Simultaneous increase in electrical conductivity and Seebeck coefficient in highly boron-doped nanocrystalline Si 188
Effects of thermal annealing on the structural properties of sputtered W-Si-N diffusion barriers 188
Silicon interstitials generation during the exposure of silicon to hydrogen plasma 186
Controlled co-deposition of FePt nanoparticles embedded in MgO: a detailed investigation of structure and electronic and magnetic properties 186
Evidence for H-2 at high pressure in the silicon nanocavities after dipping in HF solution 185
Impact of energy filtering and carrier localization on the thermoelectric properties of granular semiconductors 185
Orbital Angular Momentum and Energy Loss Characterization of Plasmonic Excitations in Metallic Nanostructures in TEM 185
Two and three slit electron interference and diffraction experiments 184
TEM study of annealed Pt nanostructures grown by electron beam induced deposition 184
Hydrogen and helium bubbles in silicon 183
LATTICE STRAIN AND STATIC DISORDER IN HYDROGEN IMPLANTED AND ANNEALED SINGLE CRYSTAL SILICON AS DETERMINED BY LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION 183
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 181
The Young-Feynman controlled double-slit electron interference experiment 181
Fabrication by electron beam induced deposition and transmission electron microscopic characterization of sub-10-nm freestanding Pt nanowires 179
Structural properties of reactively sputtered W-Si-N thin films 178
On the silicon dioxide/polycrystalline silicon interface width measurement 177
Silicon de novo: Energy filtering and enhanced thermoelectric performances of nanocrystalline silicon and silicon alloys 177
Paradoxical Enhancement of the Power Factor of Polycrystalline Silicon as a Result of the Formation of Nanovoids 176
Innovative Phase Plates for Beam Shaping 176
The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films 175
Nanovoid Formation and Dynamics in He+-Implanted Nanocrystalline Silicon 174
Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires 174
Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon 173
Electron-Beam Shaping in the Transmission Electron Microscope: Control of Electron-Beam Propagation Along Atomic Columns 173
Transmission Electron Microscopy study of Helium Implanted Silicon 170
Effect of Nanocavities on the Thermoelectric Properties of Polycrystalline Silicon 167
Four slits interference and diffraction experiments 167
Growth kinetics of a displacement field in hydrogen implanted single crystalline silicon 166
Low temperature dopant activation of BF2 implanted silicon 166
INFLUENCE OF IMPLANT DOSE AND TARGET TEMPERATURE ON CRYSTAL QUALITY AND JUNCTION DEPTH OF BORON-DOPED SILICON LAYERS 165
Alloy multilayers and ternary nanostructures by direct-write approach 165
Bulk mismatch values of heterostructures as determined from convergent beam electron diffraction on thin cross sections 164
Static disorder depth profile in ion implanted materials by means of large angle convergent beam electron diffraction 164
Transmission Electron Microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition 164
Hydrogen injection and retention in nanocavities of single-crystalline silicon 164
Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction 164
Single-crystal silicon coimplanted by helium and hydrogen: Evolution of decorated vacancy like defects with thermal treatments 163
Nondestructive Measurement of Orbital Angular Momentum for an Electron Beam 163
Strain in silicon below Si3N4 stripes, comparison between SUPREM IV calculation and TEM/CBED measurements 162
Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope 162
Dynamical simulation of LACBED patterns in cross-sectioned heterostructures 161
Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns 159
Strain analysis in sub-micron silicon devices by TEM/CBED 159
Electron diffraction with ten nanometer beam size for strain analysis of nanodevices 158
Phase retrieval of an electron vortex beam using diffraction holography 158
Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices 157
Totale 19.752
Salva come PNG Salva come JPEG
Categoria #
all - tutte 110.540
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 110.540
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20204.383 0 0 0 0 0 835 1.212 705 765 244 363 259
2020/20215.163 451 168 321 410 550 380 703 502 382 800 292 204
2021/20223.127 156 290 464 148 86 141 344 142 314 262 457 323
2022/20233.096 327 331 238 212 411 591 52 295 427 26 97 89
2023/20241.678 57 132 68 259 345 145 166 214 43 32 68 149
2024/20253.285 239 80 88 532 1.300 1.046 0 0 0 0 0 0
Totale 27.930