The two-slitsexperimentforsingleelectronshasbeencarriedoutbyinsertinginaconventionaltransmissionelectronmicroscopeathicksamplewithtwonano-slitsfabricatedbyFocusedIonBeamtechniqueandafastrecordingsystemabletomeasuretheelectronarrival-time.Thedetector,designedfor experimentsinfuturecolliders,isbasedonacustomCMOSchipequippedwithafastreadoutchainable tomanageupto106 frames persecond.Inthisway,highstatisticsamplesofsingleelectroneventscan becollectedwithinatimeintervalshortenoughtomeasurethedistributionoftheelectronarrival-times andtoobservethebuild-upoftheinterferencepattern.
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector / Frabboni, Stefano; Alessandro, Gabrielli; Gian Carlo, Gazzadi; Filippo, Giorgi; Giorgio, Matteucci; Giulio, Pozzi; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - STAMPA. - 116:(2012), pp. 73-76. [10.1016/j.ultramic.2012.03.017]
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector
FRABBONI, Stefano;
2012
Abstract
The two-slitsexperimentforsingleelectronshasbeencarriedoutbyinsertinginaconventionaltransmissionelectronmicroscopeathicksamplewithtwonano-slitsfabricatedbyFocusedIonBeamtechniqueandafastrecordingsystemabletomeasuretheelectronarrival-time.Thedetector,designedfor experimentsinfuturecolliders,isbasedonacustomCMOSchipequippedwithafastreadoutchainable tomanageupto106 frames persecond.Inthisway,highstatisticsamplesofsingleelectroneventscan becollectedwithinatimeintervalshortenoughtomeasurethedistributionoftheelectronarrival-times andtoobservethebuild-upoftheinterferencepattern.Pubblicazioni consigliate
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