FRABBONI, Stefano
FRABBONI, Stefano
Dipartimento di Scienze Fisiche, Informatiche e Matematiche
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment
2013-01-01 Gabrielli, A.; Giorgi, F. M.; Semprini, N.; Villa, M.; Zoccoli, A.; Matteucci, G.; Pozzi, G.; Frabboni, Stefano; Gazzadi, gian carlo
A novel Monte-Carlo based method for quantitative thin film X-ray microanalysis
2000-01-01 Armigliato, A; Balboni, R; Frabboni, Stefano; Rosa, R.
A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction
2010-01-01 E., Romano; G. F., Cerofolini; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita
Adsorption equilibria and kinetics of H2 at nearly ideal (2 x 1) Si(1 0 0) inner surfaces
2010-01-01 G. F., Cerofolini; E., Romano; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita
Alignment of electron optical beam shaping elements using a convolutional neural network
2021-01-01 Rotunno, E.; Tavabi, A. H.; Rosi, P.; Frabboni, S.; Tiemeijer, P.; Dunin-Borkowski, R. E.; Grillo, V.
Alloy multilayers and ternary nanostructures by direct-write approach
2017-01-01 Porrati, F.; Sachser, R.; Gazzadi, G. C.; Frabboni, S.; Terfort, A.; Huth, M.
Analysis of localised strains by convergent beam electron diffraction
2004-01-01 A., Armigliato; R., Balboni; A., Benedetti; Frabboni, Stefano
ANALYTICAL ELECTRON-MICROSCOPY OF SI1-XGEX/SI HETEROSTRUCTURES AND LOCAL ISOLATION STRUCTURES
1995-01-01 Armigliato, A; Balboni, R; Corticelli, F; Frabboni, Stefano; Malvezzi, F.
Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment
2011-01-01 A., Gabrielli; F., Giorgi; N., Semprini Cesari; M., Villa; A., Zoccoli; G., Matteucci; G., Pozzi; Frabboni, Stefano; Gazzadi, gian carlo
Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices
2003-01-01 A., Armigliato; R., Balboni; Gp, Carnevale; G., Pavia; D., Piccolo; Frabboni, Stefano; A., Benedetti; Ag, Cullis
Assembly and Fine Analysis of Ni/MgO Core/Shell Nanoparticles
2011-01-01 D'Addato, Sergio; Vincenzo, Grillo; Altieri, Salvatore; Frabboni, Stefano; Francesca, Rossi; Valeri, Sergio
Assembly and structure of Ni/NiO core–shell nanoparticles
2012-01-01 D'Addato, Sergio; Vincenzo, Grillo; Altieri, Salvatore; Frabboni, Stefano; Valeri, Sergio
Build-up of interference patterns with single electrons
2013-01-01 Giorgio, Matteucci; Michele, Pezzi; Giulio, Pozzi; Gian Luigi, Alberghi; Filippo, Giorgi; Alessandro, Gabrielli; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli; Frabboni, Stefano; Gazzadi, gian carlo
Bulk mismatch values of heterostructures as determined from convergent beam electron diffraction on thin cross sections
1996-01-01 Balboni, R; Armigliato, A; Frabboni, Stefano
CBED STRAIN-MEASUREMENTS IN BORON IMPLANTED SILICON
1991-01-01 Balboni, R; Frabboni, Stefano
Challenging Point Scanning across Electron Microscopy and Optical Imaging using Computational Imaging
2022-01-01 Kallepalli, Akhil; Viani, Lorenzo; Stellinga, Daan; Rotunno, Enzo; Bowman, Richard; Gibson, Graham M.; Sun, Ming-Jie; Rosi, Paolo; Frabboni, Stefano; Balboni, Roberto; Migliori, Andrea; Grillo, Vincenzo; Padgett, Miles J.
Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures
2011-01-01 Gazzadi, gian carlo; J. J. L., Mulders; P., Trompenaars; Ghirri, Alberto; Rota, Alberto; Affronte, Marco; Frabboni, Stefano
Combination of Electron Energy-loss Spectroscopy and Orbital Angular Momentum Spectroscopy. Applications to Electron Magnetic Chiral Dichroism, Plasmon-loss, and Core-loss
2020-01-01 Bertoni, G.; Rotunno, E.; Tavabi, A.; Zanfrognini, M.; Rosi, P.; Frabboni, S.; Karimi, E.; Dunin-Borkowski, R.; Grillo, V.
Combined HREM and theoretical analysis of SiC/Si interface
2003-01-01 V., Grillo; Frabboni, Stefano; G., Cicero; G., Savini; AND A., Catellani
Combined HREM and theoretical analysis of SiC/Si interfaces
2004-01-01 Grille, V.; Frabboni, S.; Cicero, G.; Savini, G.; Catellani, A.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment | 1-gen-2013 | Gabrielli, A.; Giorgi, F. M.; Semprini, N.; Villa, M.; Zoccoli, A.; Matteucci, G.; Pozzi, G.; Frabboni, Stefano; Gazzadi, gian carlo | |
| A novel Monte-Carlo based method for quantitative thin film X-ray microanalysis | 1-gen-2000 | Armigliato, A; Balboni, R; Frabboni, Stefano; Rosa, R. | |
| A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction | 1-gen-2010 | E., Romano; G. F., Cerofolini; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita | |
| Adsorption equilibria and kinetics of H2 at nearly ideal (2 x 1) Si(1 0 0) inner surfaces | 1-gen-2010 | G. F., Cerofolini; E., Romano; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita | |
| Alignment of electron optical beam shaping elements using a convolutional neural network | 1-gen-2021 | Rotunno, E.; Tavabi, A. H.; Rosi, P.; Frabboni, S.; Tiemeijer, P.; Dunin-Borkowski, R. E.; Grillo, V. | |
| Alloy multilayers and ternary nanostructures by direct-write approach | 1-gen-2017 | Porrati, F.; Sachser, R.; Gazzadi, G. C.; Frabboni, S.; Terfort, A.; Huth, M. | |
| Analysis of localised strains by convergent beam electron diffraction | 1-gen-2004 | A., Armigliato; R., Balboni; A., Benedetti; Frabboni, Stefano | |
| ANALYTICAL ELECTRON-MICROSCOPY OF SI1-XGEX/SI HETEROSTRUCTURES AND LOCAL ISOLATION STRUCTURES | 1-gen-1995 | Armigliato, A; Balboni, R; Corticelli, F; Frabboni, Stefano; Malvezzi, F. | |
| Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment | 1-gen-2011 | A., Gabrielli; F., Giorgi; N., Semprini Cesari; M., Villa; A., Zoccoli; G., Matteucci; G., Pozzi; Frabboni, Stefano; Gazzadi, gian carlo | |
| Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices | 1-gen-2003 | A., Armigliato; R., Balboni; Gp, Carnevale; G., Pavia; D., Piccolo; Frabboni, Stefano; A., Benedetti; Ag, Cullis | |
| Assembly and Fine Analysis of Ni/MgO Core/Shell Nanoparticles | 1-gen-2011 | D'Addato, Sergio; Vincenzo, Grillo; Altieri, Salvatore; Frabboni, Stefano; Francesca, Rossi; Valeri, Sergio | |
| Assembly and structure of Ni/NiO core–shell nanoparticles | 1-gen-2012 | D'Addato, Sergio; Vincenzo, Grillo; Altieri, Salvatore; Frabboni, Stefano; Valeri, Sergio | |
| Build-up of interference patterns with single electrons | 1-gen-2013 | Giorgio, Matteucci; Michele, Pezzi; Giulio, Pozzi; Gian Luigi, Alberghi; Filippo, Giorgi; Alessandro, Gabrielli; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli; Frabboni, Stefano; Gazzadi, gian carlo | |
| Bulk mismatch values of heterostructures as determined from convergent beam electron diffraction on thin cross sections | 1-gen-1996 | Balboni, R; Armigliato, A; Frabboni, Stefano | |
| CBED STRAIN-MEASUREMENTS IN BORON IMPLANTED SILICON | 1-gen-1991 | Balboni, R; Frabboni, Stefano | |
| Challenging Point Scanning across Electron Microscopy and Optical Imaging using Computational Imaging | 1-gen-2022 | Kallepalli, Akhil; Viani, Lorenzo; Stellinga, Daan; Rotunno, Enzo; Bowman, Richard; Gibson, Graham M.; Sun, Ming-Jie; Rosi, Paolo; Frabboni, Stefano; Balboni, Roberto; Migliori, Andrea; Grillo, Vincenzo; Padgett, Miles J. | |
| Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures | 1-gen-2011 | Gazzadi, gian carlo; J. J. L., Mulders; P., Trompenaars; Ghirri, Alberto; Rota, Alberto; Affronte, Marco; Frabboni, Stefano | |
| Combination of Electron Energy-loss Spectroscopy and Orbital Angular Momentum Spectroscopy. Applications to Electron Magnetic Chiral Dichroism, Plasmon-loss, and Core-loss | 1-gen-2020 | Bertoni, G.; Rotunno, E.; Tavabi, A.; Zanfrognini, M.; Rosi, P.; Frabboni, S.; Karimi, E.; Dunin-Borkowski, R.; Grillo, V. | |
| Combined HREM and theoretical analysis of SiC/Si interface | 1-gen-2003 | V., Grillo; Frabboni, Stefano; G., Cicero; G., Savini; AND A., Catellani | |
| Combined HREM and theoretical analysis of SiC/Si interfaces | 1-gen-2004 | Grille, V.; Frabboni, S.; Cicero, G.; Savini, G.; Catellani, A. |