FRABBONI, Stefano

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 149 (tempo di esecuzione: 0.0 secondi).

	Titolo	Data di pubblicazione	Autore(i)
1	The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector	2012	Stefano Frabboni;Alessandro Gabrielli;Gian Carlo Gazzadi;Filippo Giorgi;Giorgio Matteucci;Giulio Pozzi;Nicola Semprini Cesari;Mauro Villa;Antonio Zoccoli
2	Young's double-slit interference experiment with electrons	2007	S. FRABBONI; GAZZADI GC; POZZI G
3	X-RAY-EMISSION MODULATION BY ELECTRON CHANNELING AND SITE OCCUPANCY IN GARNETS	1994	BALBONI R; S. FRABBONI; RINALDI R; SPIGARELLI S
4	Vacancy-gettering in silicon: Cavities and helium-implantation	1999	Corni F; Tonini R; Frabboni S; Nobili C; Calzolari G; Masetti S; Tamarozzi P; Pavia G; Cerofolini GF
5	Using evidence from nanocavities to assess the vibrational properties of external surfaces	2012	G.F. Cerofolini; F. Corni; S. Frabboni; G. Ottaviani; E. Romano; R. Tonini; D. Narducci
6	Two and three slit electron interference and diffraction experiments	2011	Frabboni Stefano; Frigeri Cesare; Gazzadi Gian Carlo; Pozzi Giulio.
7	Transmission electron microscopy study of helium implanted silicon	2018	Frabboni, Stefano; Corni, Federico; Tonini, Rita; Nobili, Carlo Emanuele; Ottaviani, Giampiero
8	Transmission Electron Microscopy study of Helium Implanted Silicon	2004	Frabboni, S.; Corni, F.; Tonini, R.; Nobili, C.; Ottaviani, G.
9	Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon	2004	S. Frabboni; GC Gazzadi; L. Felisari; R. Tonini; F. Corni; G. Ottaviani
10	Transmission Electron Microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition	2006	S. FRABBONI; G.C.GAZZADI; A. SPESSOT
11	Transmission Electron diffraction techniques for nm scale measurement in semiconductors	1996	J. Vanhellemont; K.G.F.Janssens; S. Frabboni; R. Balboni and A. Armigliato
12	Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy	2017	Grillo, Vincenzo; Tavabi, Amir H.; Yucelen, Emrah; Lu, Peng-Han; Venturi, Federico; Larocque, Hugo; Jin, Lei; Savenko, Aleksei; Gazzadi, Gian Carlo; Balboni, Roberto; Frabboni, Stefano; Tiemeijer, Peter; Dunin-Borkowski, Rafal E.; Karimi, Ebrahim
13	A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction	2010	Romano, E.; Cerofolini, G. F.; Narducci, D.; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita
14	Thermal desorption spectra from cavities in helium-implanted silicon	2000	Cerofolini GF; Calzolari G; Corni F; Frabboni S; Nobili C; Ottaviani G; Tonini R
15	The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films	1998	Corni F; Frabboni S; Tonini R; Leone D; de Boer W; Gasparotto A
16	Temperature dependence of damage in boron implanted silicon	1989	G. OTTAVIANI; F. NAVA; R. TONINI; S. FRABBONI; G.F. CEROFOLINI AND P. CANTONI
17	TEM/CBED determination of strain in silicon-based submicrometric electronic devices	2000	Armigliatoa A; Balboni R; Balboni S; Frabboni S; Tixier A; Carnevale GP; Colpani P; Pavia G; Marmiroli A
18	TEM study of annealed Pt nanostructures grown by electron beam induced deposition	2007	S. FRABBONI; G.C.GAZZADI; A. SPESSOT
19	Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray microdiffraction and modeling	2003	I. De Wolf; V. Senez; R. Balboni; A. Armigliato; S. Frabboni; A. Cedola; S. Lagomarsino
20	Suspended nanostructures grown by electron beam-induced deposition of Pt and TEOS precursors	2007	GAZZADI G. C; S. FRABBONI; MENOZZI C

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FRABBONI, Stefano