EnglishFRABBONI, Stefano
Risultati 1 - 20 di 150 (tempo di esecuzione: 0.001 secondi).
| Titolo | Data di pubblicazione | Autore(i) | |
|---|---|---|---|
| 1 | The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector | 2012 | Frabboni, Stefano; Alessandro, Gabrielli; Gian Carlo, Gazzadi; Filippo, Giorgi; Giorgio, Matteucci; Giulio, Pozzi; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli |
| 2 | The Young-Feynman controlled double-slit electron interference experiment | 2019 | Tavabi, Amir H; Boothroyd, Chris B; Yücelen, Emrah; Frabboni, Stefano; Gazzadi, Gian Carlo; Dunin-Borkowski, Rafal E; Pozzi, Giulio |
| 3 | Young's double-slit interference experiment with electrons | 2007 | Frabboni, Stefano; Gazzadi, Gc; Pozzi, G. |
| 4 | X-RAY-EMISSION MODULATION BY ELECTRON CHANNELING AND SITE OCCUPANCY IN GARNETS | 1994 | Balboni, R; Frabboni, Stefano; Rinaldi, R; Spigarelli, S. |
| 5 | Vacancy-gettering in silicon: Cavities and helium-implantation | 1999 | Corni, Federico; Tonini, Rita; Frabboni, Stefano; Nobili, Carlo Emanuele; Calzolari, G; Masetti, S; Tamarozzi, P; Pavia, G; Cerofolini, Gf |
| 6 | Using evidence from nanocavities to assess the vibrational properties of external surfaces | 2012 | G. F., Cerofolini; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; E., Romano; Tonini, Rita; D., Narducci |
| 7 | Two and three slit electron interference and diffraction experiments | 2011 | Frabboni, Stefano; Frigeri, Cesare; Gazzadi Gian, Carlo; Pozzi, Giulio |
| 8 | Transmission Electron Microscopy study of Helium Implanted Silicon | 2004 | Frabboni, S.; Corni, F.; Tonini, R.; Nobili, C.; Ottaviani, G. |
| 9 | Transmission electron microscopy study of helium implanted silicon | 2018 | Frabboni, Stefano; Corni, Federico; Tonini, Rita; Nobili, Carlo Emanuele; Ottaviani, Giampiero |
| 10 | Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon | 2004 | Frabboni, Stefano; Gc, Gazzadi; L., Felisari; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero |
| 11 | Transmission Electron Microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition | 2006 | Frabboni, Stefano; G. C., Gazzadi; A., Spessot |
| 12 | Transmission Electron diffraction techniques for nm scale measurement in semiconductors | 1996 | J., Vanhellemont; K. G. F., Janssens; Frabboni, Stefano; R., Balboni; A., Armigliato |
| 13 | Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy | 2017 | Grillo, Vincenzo; Tavabi, Amir H.; Yucelen, Emrah; Lu, Peng-Han; Venturi, Federico; Larocque, Hugo; Jin, Lei; Savenko, Aleksei; Gazzadi, Gian Carlo; Balboni, Roberto; Frabboni, Stefano; Tiemeijer, Peter; Dunin-Borkowski, Rafal E.; Karimi, Ebrahim |
| 14 | A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction | 2010 | E., Romano; G. F., Cerofolini; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita |
| 15 | Thermal desorption spectra from cavities in helium-implanted silicon | 2000 | Cerofolini, Gf; Calzolari, G; Corni, Federico; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita |
| 16 | The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films | 1998 | Corni, Federico; Frabboni, Stefano; Tonini, Rita; Leone, D; de Boer, W; Gasparotto, A. |
| 17 | Temperature dependence of damage in boron implanted silicon | 1989 | G., Ottaviani; F., Nava; R., Tonini; Frabboni, Stefano; G. F. CEROFOLINI AND P., Cantoni |
| 18 | TEM/CBED determination of strain in silicon-based submicrometric electronic devices | 2000 | Armigliatoa, A; Balboni, R; Balboni, S; Frabboni, Stefano; Tixier, A; Carnevale, Gp; Colpani, P; Pavia, G; Marmiroli, A. |
| 19 | TEM study of annealed Pt nanostructures grown by electron beam induced deposition | 2007 | Frabboni, Stefano; G. C., Gazzadi; A., Spessot |
| 20 | Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray microdiffraction and modeling | 2003 | I., De Wolf; V., Senez; R., Balboni; A., Armigliato; Frabboni, Stefano; A., Cedola; S., Lagomarsino |
Nome completo:
FRABBONI, Stefano
struttura:
Dipartimento di Scienze Fisiche, Informatiche e Matematiche
settore SSD:
Settore FIS/01 - Fisica Sperimentale
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