Hydrogen incorporation in diluted nitride semiconductors dramatically modifies the electronic and structural properties of the crystal through the creation of nitrogen-hydrogen complexes. We report a convergent beam electron-diffraction characterization of diluted nitride semiconductor- heterostructures patterned at a sub-micron scale and selectively exposed to hydrogen. We present a method to determine separately perpendicular mismatch and static disorder in pristine and hydrogenated heterostructures. The roles of chemical composition and strain on static disorder have been separately assessed.
Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures / Frabboni, Stefano; V., Grillo; Gazzadi, gian carlo; R., Balboni; R., Trotta; A., Polimeni; M., Capizzi; F., Martelli; S., Rubini; G., Guzzinati; F., Glas. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 101:(2012), pp. 111912-1-111912-4. [10.1063/1.4752464]