GAZZADI, gian carlo
GAZZADI, gian carlo
Dipartimento di Scienze Fisiche, Informatiche e Matematiche
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment
2013-01-01 Gabrielli, A.; Giorgi, F. M.; Semprini, N.; Villa, M.; Zoccoli, A.; Matteucci, G.; Pozzi, G.; Frabboni, Stefano; Gazzadi, gian carlo
Alloy multilayers and ternary nanostructures by direct-write approach
2017-01-01 Porrati, F.; Sachser, R.; Gazzadi, G. C.; Frabboni, S.; Terfort, A.; Huth, M.
Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment
2011-01-01 A., Gabrielli; F., Giorgi; N., Semprini Cesari; M., Villa; A., Zoccoli; G., Matteucci; G., Pozzi; Frabboni, Stefano; Gazzadi, gian carlo
Build-up of interference patterns with single electrons
2013-01-01 Giorgio, Matteucci; Michele, Pezzi; Giulio, Pozzi; Gian Luigi, Alberghi; Filippo, Giorgi; Alessandro, Gabrielli; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli; Frabboni, Stefano; Gazzadi, gian carlo
Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures
2011-01-01 Gazzadi, gian carlo; J. J. L., Mulders; P., Trompenaars; Ghirri, Alberto; Rota, Alberto; Affronte, Marco; Frabboni, Stefano
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films
2018-01-01 Parisini, Andrea; Frabboni, Stefano; Gazzadi, Gian Carlo; Rosa, Rodolfo; Armigliato, Aldo
Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures
2012-01-01 Frabboni, Stefano; V., Grillo; Gazzadi, gian carlo; R., Balboni; R., Trotta; A., Polimeni; M., Capizzi; F., Martelli; S., Rubini; G., Guzzinati; F., Glas
Early stage in low-energy ion-induced damage on InP(110) surface
1997-01-01 Valeri, Sergio; Gazzadi, gian carlo; Rota, Alberto; DI BONA, Alessandro
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up
2015-01-01 Frabboni, Stefano; Gazzadi, Gian Carlo; Grillo, Vincenzo; Pozzi, Giulio
Electron Interference via a 4096-Pixel MAPS Detector Designed for High-Energy Physics Experiments
2013-01-01 Balbi, G.; Frabboni, S.; Gabrielli, A.; Gazzadi, gian carlo; Giorgi, F. M.; Matteucci, G.; Semprini, N.; Villa, M.; Zoccoli, A.
Experimental realization of the Ehrenberg-Siday thought experiment
2016-01-01 Pozzi, Giulio; Boothroyd, Chris B.; Tavabi, Amir H.; Yücelen, Emrah; Dunin Borkowski, Rafal E.; Frabboni, Stefano; Gazzadi, gian carlo
Fabrication of FeSi and Fe3Si compounds by electron beam induced mixing of [Fe/Si]2 and [Fe3/Si]2 multilayers grown by focused electron beam induced deposition
2016-01-01 Porrati, F.; Sachser, R.; Gazzadi, Gian Carlo; Frabboni, Stefano; Huth, M.
Focused Electron Beam Deposition of Nanowires from Cobalt Tricarbonyl Nitrosyl (Co(CO)(3)NO) Precursor
2011-01-01 Gazzadi, gian carlo; Mulders, H.; Trompenaars, P.; Ghirri, A.; Affronte, Marco; Grillo, V.; Frabboni, Stefano
Focused ion beam fabrication of Janus bimetallic cylinders acting as drift tube Zernike phase plates for electron microscopy
2021-01-01 Rosi, P.; Gazzadi, G. C.; Frabboni, S.; Grillo, V.; Tavabi, A. H.; Dunin-Borkowski, R. E.; Pozzi, G.
Focused ion beam patterned Hall nano-sensors
2007-01-01 Candini, A.; Gazzadi, G. C.; di Bona, A.; Affronte, M.; Ercolani, D.; Biasiol, G.; Sorba, L.
Friction and wear of DLC films deposited on additive manufactured AlSi10Mg: the role of surface finishing
2023-01-01 Salerno, E.; Casotti, D.; Paolicelli, G.; Gualtieri, E.; Ballestrazzi, A.; Gazzadi, G. C.; Bolelli, G.; Lusvarghi, L.; Valeri, S.; Rota, A.
Generation and application of bessel beams in electron microscopy
2016-01-01 Grillo, Vincenzo; Harris, Jérémie; Gazzadi, Gian Carlo; Balboni, Roberto; Mafakheribashmagh, Erfan; Dennis, Mark R.; Frabboni, Stefano; Boyd, Robert W.; Karimi, Ebrahim
Generation of Nondiffracting Electron Bessel Beams
2014-01-01 Vincenzo, Grillo; Ebrahim, Karimi; Gazzadi, gian carlo; Frabboni, Stefano; Mark, R. Dennis; Robert, W. Boyd
Green Fabrication of (6,5)Carbon Nanotube/Protein Transistor Endowed with Specific Recognition
2021-01-01 Berto, M.; Di Giosia, M.; Giordani, M.; Sensi, M.; Valle, F.; Alessandrini, A.; Menozzi, C.; Cantelli, A.; Gazzadi, G. C.; Zerbetto, F.; Calvaresi, M.; Biscarini, F.; Bortolotti, C. A.
Holographic generation of highly twisted electron beams
2015-01-01 Grillo, Vincenzo; Gazzadi, Gian Carlo; Mafakheribashmagh, Erfan; Frabboni, Stefano; Karimi, Ebrahim; Boyd, Robert W.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment | 1-gen-2013 | Gabrielli, A.; Giorgi, F. M.; Semprini, N.; Villa, M.; Zoccoli, A.; Matteucci, G.; Pozzi, G.; Frabboni, Stefano; Gazzadi, gian carlo | |
Alloy multilayers and ternary nanostructures by direct-write approach | 1-gen-2017 | Porrati, F.; Sachser, R.; Gazzadi, G. C.; Frabboni, S.; Terfort, A.; Huth, M. | |
Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment | 1-gen-2011 | A., Gabrielli; F., Giorgi; N., Semprini Cesari; M., Villa; A., Zoccoli; G., Matteucci; G., Pozzi; Frabboni, Stefano; Gazzadi, gian carlo | |
Build-up of interference patterns with single electrons | 1-gen-2013 | Giorgio, Matteucci; Michele, Pezzi; Giulio, Pozzi; Gian Luigi, Alberghi; Filippo, Giorgi; Alessandro, Gabrielli; Nicola Semprini, Cesari; Mauro, Villa; Antonio, Zoccoli; Frabboni, Stefano; Gazzadi, gian carlo | |
Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures | 1-gen-2011 | Gazzadi, gian carlo; J. J. L., Mulders; P., Trompenaars; Ghirri, Alberto; Rota, Alberto; Affronte, Marco; Frabboni, Stefano | |
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films | 1-gen-2018 | Parisini, Andrea; Frabboni, Stefano; Gazzadi, Gian Carlo; Rosa, Rodolfo; Armigliato, Aldo | |
Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures | 1-gen-2012 | Frabboni, Stefano; V., Grillo; Gazzadi, gian carlo; R., Balboni; R., Trotta; A., Polimeni; M., Capizzi; F., Martelli; S., Rubini; G., Guzzinati; F., Glas | |
Early stage in low-energy ion-induced damage on InP(110) surface | 1-gen-1997 | Valeri, Sergio; Gazzadi, gian carlo; Rota, Alberto; DI BONA, Alessandro | |
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up | 1-gen-2015 | Frabboni, Stefano; Gazzadi, Gian Carlo; Grillo, Vincenzo; Pozzi, Giulio | |
Electron Interference via a 4096-Pixel <newline/>MAPS Detector Designed for <newline/>High-Energy Physics Experiments | 1-gen-2013 | Balbi, G.; Frabboni, S.; Gabrielli, A.; Gazzadi, gian carlo; Giorgi, F. M.; Matteucci, G.; Semprini, N.; Villa, M.; Zoccoli, A. | |
Experimental realization of the Ehrenberg-Siday thought experiment | 1-gen-2016 | Pozzi, Giulio; Boothroyd, Chris B.; Tavabi, Amir H.; Yücelen, Emrah; Dunin Borkowski, Rafal E.; Frabboni, Stefano; Gazzadi, gian carlo | |
Fabrication of FeSi and Fe3Si compounds by electron beam induced mixing of [Fe/Si]2 and [Fe3/Si]2 multilayers grown by focused electron beam induced deposition | 1-gen-2016 | Porrati, F.; Sachser, R.; Gazzadi, Gian Carlo; Frabboni, Stefano; Huth, M. | |
Focused Electron Beam Deposition of Nanowires from Cobalt Tricarbonyl Nitrosyl (Co(CO)(3)NO) Precursor | 1-gen-2011 | Gazzadi, gian carlo; Mulders, H.; Trompenaars, P.; Ghirri, A.; Affronte, Marco; Grillo, V.; Frabboni, Stefano | |
Focused ion beam fabrication of Janus bimetallic cylinders acting as drift tube Zernike phase plates for electron microscopy | 1-gen-2021 | Rosi, P.; Gazzadi, G. C.; Frabboni, S.; Grillo, V.; Tavabi, A. H.; Dunin-Borkowski, R. E.; Pozzi, G. | |
Focused ion beam patterned Hall nano-sensors | 1-gen-2007 | Candini, A.; Gazzadi, G. C.; di Bona, A.; Affronte, M.; Ercolani, D.; Biasiol, G.; Sorba, L. | |
Friction and wear of DLC films deposited on additive manufactured AlSi10Mg: the role of surface finishing | 1-gen-2023 | Salerno, E.; Casotti, D.; Paolicelli, G.; Gualtieri, E.; Ballestrazzi, A.; Gazzadi, G. C.; Bolelli, G.; Lusvarghi, L.; Valeri, S.; Rota, A. | |
Generation and application of bessel beams in electron microscopy | 1-gen-2016 | Grillo, Vincenzo; Harris, Jérémie; Gazzadi, Gian Carlo; Balboni, Roberto; Mafakheribashmagh, Erfan; Dennis, Mark R.; Frabboni, Stefano; Boyd, Robert W.; Karimi, Ebrahim | |
Generation of Nondiffracting Electron Bessel Beams | 1-gen-2014 | Vincenzo, Grillo; Ebrahim, Karimi; Gazzadi, gian carlo; Frabboni, Stefano; Mark, R. Dennis; Robert, W. Boyd | |
Green Fabrication of (6,5)Carbon Nanotube/Protein Transistor Endowed with Specific Recognition | 1-gen-2021 | Berto, M.; Di Giosia, M.; Giordani, M.; Sensi, M.; Valle, F.; Alessandrini, A.; Menozzi, C.; Cantelli, A.; Gazzadi, G. C.; Zerbetto, F.; Calvaresi, M.; Biscarini, F.; Bortolotti, C. A. | |
Holographic generation of highly twisted electron beams | 1-gen-2015 | Grillo, Vincenzo; Gazzadi, Gian Carlo; Mafakheribashmagh, Erfan; Frabboni, Stefano; Karimi, Ebrahim; Boyd, Robert W. |