Relazione in Atti di Convegno: [15023] Home page tipologia

Sfoglia
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.781 a 6.800 di 15.023
Titolo Data di pubblicazione Autore(i) File
A human factors assessment model for sustainable Manufacturing 1-gen-2017 Peruzzini, Margherita; Pellicciari, Marcello
A Monte Carlo Study of the Role of Scattering in Deca-nanometer MOSFETs 1-gen-2004 Palestri, Pierpaolo; Esseni, David; S., Eminente; C., Fiegna; E., Sangiorgi; Selmi, Luca
An improved semiclassical Monte-Carlo approach for nano-scale MOSFET simulation 1-gen-2004 Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Sangiorgi, E; Selmi, Luca
Monte-Carlo Analysis of Ballistic Transport in MOSFETs along the ITRS Roadmap 1-gen-2005 Palestri, Pierpaolo; S., Eminente; Esseni, David; C., Fiegna; Selmi, Luca; E., Sangiorgi
On the Optimization of SiGe and III-V Compound Hetero-Junction Tunnel FET Devices 1-gen-2013 Revelant, Alberto; Palestri, Pierpaolo; Osgnach, Patrik; Lizzit, Daniel; Selmi, Luca
Modeling, Design and Characterization of a new low Jitter Analog Dual Tuning LC-VCO PLL Architecture 1-gen-2004 Nonis, Roberto; Da Dalt, N; Palestri, Pierpaolo; Selmi, Luca
A model for robust electrostatic design of nanowire FETs with arbitrary polygonal cross sections 1-gen-2009 De Michielis, Luca; Selmi, Luca; Ionescu, A. M.
Mobility Extraction of UTB n-MOSFETs down to 0.9 nm SOI thickness 1-gen-2009 Schmidt, M; Lemme, M. C.; Gottlob, H. D. B.; Kurz, H; Driussi, Francesco; Selmi, Luca
Design and evaluation of mixed 3T-4T FinFET stacks for leakage reduction 1-gen-2009 Agostinelli, M; Alioto, M; Esseni, David; Selmi, Luca
Improved Modeling of Intersymbol Interference in High Speed Serial Links 1-gen-2012 Cristofoli, Andrea; Palestri, Pierpaolo; Selmi, Luca; Da Dalt, N.
Trading off static power and dynamic performance in CMOS digital circuits: bulk versus double gate SOI MOSFETs 1-gen-2007 Agostinelli, Matteo; Alioto, M.; Esseni, David; Selmi, Luca
The Impact of Device Design on the Substrate Enhanced Gate Current of VLSI MOSFET's 1-gen-1998 Esseni, David; Selmi, Luca; Bez, R.
Un Approccio a Rete per Migliorare l’Attività di Prevenzione nelle P.M.I. 1-gen-2016 Melloni, R.; Mosconi, S.; Bacchetta, A.; Iotti, A.; Di Stefano, S.; Zuccarello, G.; Avino, M. R.
Enhanced Ballisticity in nano-MOSFETs along the ITRS Roadmap: A Monte Carlo Study 1-gen-2004 S., Eminente; Esseni, David; Palestri, Pierpaolo; C., Fiegna; Selmi, Luca; E., Sangiorgi
On the Passivation of Interface States in SONOS Test Structures: Impact of Device Layout and Annealing Process 1-gen-2006 Driussi, Francesco; Selmi, Luca; Akil, N.; Van Duuren, M. J.; Van Schaijk, R.
A better understanding of the low-field mobility in Graphene Nano-ribbons 1-gen-2009 Bresciani, M; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Deuterium Effect on Interface States and SILC Generation in the CHE Stress Conditions: A Comparative Study 1-gen-2000 Esseni, David; Bude, J.; Selmi, Luca
Quantitative Assesment of mobility degradation by Remote Coulomb Scattering in Ultra-thin oxide MOSFETs: measurement and simulations 1-gen-2003 Lucci, Luca; Esseni, David; J., Loo; Y., Ponomarev; Selmi, Luca; Abramo, Antonio; Sangiorgi, Enrico
Gate Current in Stacked Dielectrics for Advanced FLASH EEPROM cells 1-gen-2005 Driussi, Francesco; Marcuzzi, S; Palestri, Pierpaolo; Selmi, Luca
Hot carrier degradation and damage profiling of cmos devices with biased substrates 1-gen-2000 Driussi, Francesco; Esseni, David; Piazza, F.; Selmi, Luca
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.781 a 6.800 di 15.023
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile

Scopri
Tipologia
  • Atti di CONVEGNO15022
  • Contributo su VOLUME1
Autore
  • CUCCHIARA, Rita458
  • ZAMBONELLI, Franco281
  • SELMI, LUCA228
  • FANTUZZI, Cesare217
  • GUNDUZ, Deniz215
  • FERRARI, Fabrizio212
  • BERGAMASCHI, Sonia203
  • SECCHI, Cristian195
  • LARCHER, Luca186
  • PALESTRI, Pierpaolo176
Data di pubblicazione
  • 2020 - 20262862
  • 2010 - 20195586
  • 2000 - 20094697
  • 1990 - 19991488
  • 1980 - 1989359
  • 1970 - 197930
  • 1967 - 19691
Editore
  • Institute of Electrical and Elect...1349
  • IEEE1011
  • IEEE Computer Society379
  • Springer Science and Business Med...260
  • Springer243
  • -235
  • Springer Verlag205
  • SAE International192
  • CEUR-WS125
  • SPRINGER-VERLAG BERLIN100
Rivista
  • SAE TECHNICAL PAPER202
  • JOURNAL OF PHYSICS. CONFERENCE SE...97
  • ...SUMMER SCHOOL FRANCESCO TURCO....63
  • POS PROCEEDINGS OF SCIENCE41
  • ACTA HORTICULTURAE35
  • ENERGY PROCEDIA29
Serie
  • LECTURE NOTES IN COMPUTER SCIENCE409
  • CEUR WORKSHOP PROCEEDINGS164
  • PROCEEDINGS OF SPIE, THE INTERNAT...160
  • LECTURE NOTES IN ARTIFICIAL INTEL...85
  • LECTURE NOTES IN MECHANICAL ENGIN...81
  • COMMUNICATIONS IN COMPUTER AND IN...72
  • IFAC-PAPERSONLINE71
  • PROCEEDINGS OF THE ANNUAL CONFERE...67
  • IFAC PROCEEDINGS VOLUMES65
  • TECHNICAL DIGEST - INTERNATIONAL ...64
Keyword
  • Electrical and Electronic Enginee...166
  • -160
  • Control and Systems Engineering104
  • Software86
  • Industrial and Manufacturing Engi...85
  • Computer Networks and Communications72
  • Computer Science (all)72
  • Computer Science Applications1707...72
  • CFD67
  • Artificial Intelligence63
Lingua
  • eng11823
  • ita2914
  • fre119
  • ger62
  • spa58
  • por15
  • rus12
  • und8
  • cat5
  • chi2
Accesso al fulltext
  • no fulltext10046
  • reserved2965
  • open1891
  • partially open113
  • embargoed8