Relazione in Atti di Convegno: [15023] Home page tipologia

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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.761 a 6.780 di 15.023
Titolo Data di pubblicazione Autore(i) File
La declaratoria d’incostituzionalità tra impatto ordinamentale ed effetti sul giudizio a quo: la Corte alla prova dei fatti 1-gen-2018 Pinardi, Roberto
Characterization and Modeling of long term retention in SONOS Non Volatile Memories 1-gen-2007 Arreghini, A; Akil, N; Driussi, Francesco; Esseni, David; Selmi, Luca; Van Duuren, M. J.
A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs 1-gen-2012 Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Conzatti, Francesco; Selmi, Luca
Performance comparison for FinFETs, nanowire and stacked nanowires FETs: Focus on the influence of surface roughness and thermal effects 1-gen-2017 Badami, O.; Driussi, F.; Palestri, P.; Selmi, L.; Esseni, D.
Mobility in Single and Double Gate Ultra-Thin SOI MOSFETs 1-gen-2001 Esseni, David; M., Mastrapasqua; C., Fiegna; G. K., Celler; Selmi, Luca; E., Sangiorgi
Tunnelling Injection in Thin Oxide MOS Capacitors 1-gen-2000 . Dalla Serra, A.; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, E.
Revised analysis of the mobility and ION degradation in high-k gate stacks: surface optical phonons vs. remote Coulomb scattering 1-gen-2008 Toniutti, P; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Design, characterization and signal integrity analysis of a 2.5 Gb/s high-speed serial interface for automotive applications overarching the chip/PCB wall 1-gen-2015 Cossettini, Andrea; Cristofoli, A.; Grollitsch, W.; Alves, L.; Nonis, R.; Ricca, L. Della; Palestri, Pierpaolo; Selmi, Luca
The impact of interface states on the mobility and the drive current of III-V MOSFETs 1-gen-2014 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Multi-Subband Semi-classical Simulation of n-type Tunnel-FETs 1-gen-2012 Revelant, Alberto; Palestri, Pierpaolo; Selmi, Luca
Effects of electrical stress and ionizing radiation on Si-based TFETs 1-gen-2015 Ding, Lili; Gerardin, Simone; Paccagnella, Alessandro; Gnani, Elena; Bagatin, Marta; Driussi, Francesco; Selmi, Luca; Le Royer, Cyrille
Observation of a new hole gate current component in p(+)-poly gate p-channel MOSFET's 1-gen-2000 Driussi, Francesco; Esseni, David; Selmi, Luca; Piazza, F.
High Performance SiGe Nanowire Tunnel FETs: Low Temperature Characterization for Device Process Optimization 1-gen-2014 A., Villalon; Revelant, Alberto; C., Le Royer; P., Nguyen; Selmi, Luca; S., Cristoloveanu
A comparison between threshold ergodic sets and stochastic simulation of boolean networks for modelling cell differentiation 1-gen-2018 Braccini, Michele; Roli, Andrea; Villani, Marco; Serra, Roberto
Monte Carlo Simulation of Low Voltage Hot Carrier Effects in Non Volatile Memory Cells 1-gen-1996 Ghetti, A; Selmi, Luca; Bez, R; Sangiorgi, Enrico
Simulation study of the on-current improvements in Ge and sGe versus Si and sSi nano-MOSFETs 1-gen-2010 Conzatti, Francesco; Toniutti, Paolo; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Tempi del processo ed impatto delle decisioni della Consulta 1-gen-2018 Scagliarini, Simone
Analysis of Dielectric Microbead Detection by Impedance Spectroscopy with Nanoribbons 1-gen-2016 Scarbolo, Paolo; Accastelli, Enrico; Ernst, Thomas; Guiducci, Carlotta; Selmi, Luca
Technology Oriented Analytical Models of MOSFETs in the Quasi Ballistic Regime 1-gen-2007 Clerc, R; Rafhay, Q; Ferrier, M; Palestri, Pierpaolo; Ghibaudo, G; Selmi, Luca
Graphene Base Transistors with optimized emitter and dielectrics 1-gen-2014 Venica, S.; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.761 a 6.780 di 15.023
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Scopri
Tipologia
  • Atti di CONVEGNO15022
  • Contributo su VOLUME1
Autore
  • CUCCHIARA, Rita458
  • ZAMBONELLI, Franco281
  • SELMI, LUCA228
  • FANTUZZI, Cesare217
  • GUNDUZ, Deniz215
  • FERRARI, Fabrizio212
  • BERGAMASCHI, Sonia203
  • SECCHI, Cristian195
  • LARCHER, Luca186
  • PALESTRI, Pierpaolo176
Data di pubblicazione
  • 2020 - 20262862
  • 2010 - 20195586
  • 2000 - 20094697
  • 1990 - 19991488
  • 1980 - 1989359
  • 1970 - 197930
  • 1967 - 19691
Editore
  • Institute of Electrical and Elect...1349
  • IEEE1011
  • IEEE Computer Society379
  • Springer Science and Business Med...260
  • Springer243
  • -235
  • Springer Verlag205
  • SAE International192
  • CEUR-WS125
  • SPRINGER-VERLAG BERLIN100
Rivista
  • SAE TECHNICAL PAPER202
  • JOURNAL OF PHYSICS. CONFERENCE SE...97
  • ...SUMMER SCHOOL FRANCESCO TURCO....63
  • POS PROCEEDINGS OF SCIENCE41
  • ACTA HORTICULTURAE35
  • ENERGY PROCEDIA29
Serie
  • LECTURE NOTES IN COMPUTER SCIENCE409
  • CEUR WORKSHOP PROCEEDINGS164
  • PROCEEDINGS OF SPIE, THE INTERNAT...160
  • LECTURE NOTES IN ARTIFICIAL INTEL...85
  • LECTURE NOTES IN MECHANICAL ENGIN...81
  • COMMUNICATIONS IN COMPUTER AND IN...72
  • IFAC-PAPERSONLINE71
  • PROCEEDINGS OF THE ANNUAL CONFERE...67
  • IFAC PROCEEDINGS VOLUMES65
  • TECHNICAL DIGEST - INTERNATIONAL ...64
Keyword
  • Electrical and Electronic Enginee...166
  • -160
  • Control and Systems Engineering104
  • Software86
  • Industrial and Manufacturing Engi...85
  • Computer Networks and Communications72
  • Computer Science (all)72
  • Computer Science Applications1707...72
  • CFD67
  • Artificial Intelligence63
Lingua
  • eng11823
  • ita2914
  • fre119
  • ger62
  • spa58
  • por15
  • rus12
  • und8
  • cat5
  • chi2
Accesso al fulltext
  • no fulltext10046
  • reserved2965
  • open1891
  • partially open113
  • embargoed8