Progress in Technology Oriented Analytical Models for Advanced MOSFET devices
2007 Clerc, R; Ferrier, M; Rafhay, Q; Ghibaudo, G; Palestri, Pierpaolo; Lucci, Luca; Selmi, Luca
Low-voltage high-performance III-V semiconductor MOSFETs for advanced CMOS nodes: impact of strain and interface traps
2015 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Simulation of graphene nanoscale RF transistors including scattering and generation/recombination mechanisms
2011 Paussa, A; Geromel, M; Palestri, Pierpaolo; Bresciani, M; Esseni, David; Selmi, Luca
Investigation of Hot Electron Luminescence in Silicon by means of Dual Gate MOS Structures
1993 Selmi, Luca; Wong, H. S.; Sangiorgi, Enrico; Lanzoni, M; Manfredi, M.
Efficient DC and AC simulation of nanoelectrode-nanoparticle interactions in capacitive biosensors
2012 Pittino, Federico; Widdershoven, F; Selmi, Luca
An efficient, mixed semiclassical/quantum mechanical model to simulate planar and wire nano-transistors
2007 Selmi, Luca; Palestri, Pierpaolo; Esseni, David; Lucci, Luca; De Michielis, Marco
Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain
2015 Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Does Multi Trap Assisted Tunneling Explain the Oxide Thickness Dependence of the Statistics of SILC in FLASH Memory Arrays ?
2006 Vianello, E; Driussi, Francesco; Esseni, David; Selmi, Luca; Van Duuren, M; Widdershoven, F.
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors
2000 Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven
Polarity dependent charge Trapping in Thin SiO_2/Al_2O_3 Gate Stacks with Poly-Si Gate Electrodes: Influence of High Temperature Annealing
2002 Lucci, Luca; Pantisano, L.; Cartier, E.; Kerber, A.; Groeseneken, G.; Ho, M. Y.; Green, M.; Selmi, Luca
Quasi Ballistic transport in advanced MOSFET devices
2007 R., Clerc; Palestri, Pierpaolo; Q., Rafhay; M., Ferrier; G., Pananakakis; G., Ghibaudo; Selmi, Luca
Improved surface roughness modeling and mobility projections in thin film MOSFETs
2015 Badami, Oves Mohamed Hussein; Caruso, Enrico; Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Adjacent structure interactions in the Latch-up triggering of CMOS twin-tub and epitaxial technologies
1991 Pavan, P; Zanoni, E; Menozzi, R; Selmi, Luca
Quasi Ballistic transport in Fully Depleted SOI MOSFETs: the "kT layer concept revisited
2006 Clerc, R; Palestri, Pierpaolo; Selmi, Luca
Modeling of Field-Effect-Transistors with Strained and Alternative Channel Materials
2012 Conzatti, Francesco; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs
2009 Serra, N; Conzatti, F; Esseni, David; De Michielis, M; Palestri, Pierpaolo; Selmi, Luca; Thomas, S; Whall, T. E.; Parker, E. H. C.; Leadley, D. R.; Witters, L; Hikavyy, A; Hytch, M. J.; Houdellier, F; Snoeck, E; Wang, T. J.; Lee, W. C.; Vellianitis, G; Van Dal, M. J. H.; Duriez, B; Doornbos, G; Lander, R. J. P.
The impact of longitudinal non-uniform Fin-thickness on quasi-ballistic transport in FinFETs
2008 Serra, N; Palestri, Pierpaolo; Smit, G. D. J.; Selmi, Luca
On the electron velocity-field relation in ultra-thin films of III–V compound semiconductors for advanced CMOS technology nodes
2017 Caruso, Enrico; Pin, Alessandro; Palestri, Pierpaolo; Selmi, Luca
Seminal cell-free DNA assessment as a novel prostate cancer biomarker
2018 Ponti, Giovanni; Maccaferri, Monia; Mandrioli, Mauro; Ozbenc, Tomris; Manfredini, Marco; Micali, Salvatore; Cotugno, Michele; Bianchi, Giampaolo; Pellacani, Giovanni; Tomasi, Aldo
Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs
2013 Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Progress in Technology Oriented Analytical Models for Advanced MOSFET devices | 1-gen-2007 | Clerc, R; Ferrier, M; Rafhay, Q; Ghibaudo, G; Palestri, Pierpaolo; Lucci, Luca; Selmi, Luca | |
| Low-voltage high-performance III-V semiconductor MOSFETs for advanced CMOS nodes: impact of strain and interface traps | 1-gen-2015 | Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
| Simulation of graphene nanoscale RF transistors including scattering and generation/recombination mechanisms | 1-gen-2011 | Paussa, A; Geromel, M; Palestri, Pierpaolo; Bresciani, M; Esseni, David; Selmi, Luca | |
| Investigation of Hot Electron Luminescence in Silicon by means of Dual Gate MOS Structures | 1-gen-1993 | Selmi, Luca; Wong, H. S.; Sangiorgi, Enrico; Lanzoni, M; Manfredi, M. | |
| Efficient DC and AC simulation of nanoelectrode-nanoparticle interactions in capacitive biosensors | 1-gen-2012 | Pittino, Federico; Widdershoven, F; Selmi, Luca | |
| An efficient, mixed semiclassical/quantum mechanical model to simulate planar and wire nano-transistors | 1-gen-2007 | Selmi, Luca; Palestri, Pierpaolo; Esseni, David; Lucci, Luca; De Michielis, Marco | |
| Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain | 1-gen-2015 | Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
| Does Multi Trap Assisted Tunneling Explain the Oxide Thickness Dependence of the Statistics of SILC in FLASH Memory Arrays ? | 1-gen-2006 | Vianello, E; Driussi, Francesco; Esseni, David; Selmi, Luca; Van Duuren, M; Widdershoven, F. | |
| Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven | |
| Polarity dependent charge Trapping in Thin SiO_2/Al_2O_3 Gate Stacks with Poly-Si Gate Electrodes: Influence of High Temperature Annealing | 1-gen-2002 | Lucci, Luca; Pantisano, L.; Cartier, E.; Kerber, A.; Groeseneken, G.; Ho, M. Y.; Green, M.; Selmi, Luca | |
| Quasi Ballistic transport in advanced MOSFET devices | 1-gen-2007 | R., Clerc; Palestri, Pierpaolo; Q., Rafhay; M., Ferrier; G., Pananakakis; G., Ghibaudo; Selmi, Luca | |
| Improved surface roughness modeling and mobility projections in thin film MOSFETs | 1-gen-2015 | Badami, Oves Mohamed Hussein; Caruso, Enrico; Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
| Adjacent structure interactions in the Latch-up triggering of CMOS twin-tub and epitaxial technologies | 1-gen-1991 | Pavan, P; Zanoni, E; Menozzi, R; Selmi, Luca | |
| Quasi Ballistic transport in Fully Depleted SOI MOSFETs: the "kT layer concept revisited | 1-gen-2006 | Clerc, R; Palestri, Pierpaolo; Selmi, Luca | |
| Modeling of Field-Effect-Transistors with Strained and Alternative Channel Materials | 1-gen-2012 | Conzatti, Francesco; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
| Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs | 1-gen-2009 | Serra, N; Conzatti, F; Esseni, David; De Michielis, M; Palestri, Pierpaolo; Selmi, Luca; Thomas, S; Whall, T. E.; Parker, E. H. C.; Leadley, D. R.; Witters, L; Hikavyy, A; Hytch, M. J.; Houdellier, F; Snoeck, E; Wang, T. J.; Lee, W. C.; Vellianitis, G; Van Dal, M. J. H.; Duriez, B; Doornbos, G; Lander, R. J. P. | |
| The impact of longitudinal non-uniform Fin-thickness on quasi-ballistic transport in FinFETs | 1-gen-2008 | Serra, N; Palestri, Pierpaolo; Smit, G. D. J.; Selmi, Luca | |
| On the electron velocity-field relation in ultra-thin films of III–V compound semiconductors for advanced CMOS technology nodes | 1-gen-2017 | Caruso, Enrico; Pin, Alessandro; Palestri, Pierpaolo; Selmi, Luca | |
| Seminal cell-free DNA assessment as a novel prostate cancer biomarker | 1-gen-2018 | Ponti, Giovanni; Maccaferri, Monia; Mandrioli, Mauro; Ozbenc, Tomris; Manfredini, Marco; Micali, Salvatore; Cotugno, Michele; Bianchi, Giampaolo; Pellacani, Giovanni; Tomasi, Aldo | |
| Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs | 1-gen-2013 | Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca |
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