statistiche ricercatore

Nome	#
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications	213
1/f noise model based on trap-assisted tunneling for ultra-thin oxides MOSFETs	147
Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Currents of Scaled MOSFETs	91
A Comprehensive Gate and Drain Trapping/Detrapping Noise Model and Its Implications for Thin-Dielectric MOSFETs	90
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures	79
Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques	60
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise	54
Assessment of Advanced Nanoscale Bulk FinFET's Self-Heating accounting for degraded thermal conductivity at the nanoscale	33
Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis	31
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K	21
Rumore dovuto a Trappole in Tecnologie MOSFET all'Avanguardia fino a Temperature Criogeniche	15
Probing Band Tail States in MOSFETs at Cryogenic Temperatures through Noise Spectroscopy	6
Totale	840

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2020/2021	66	6	0	6	0	11	12	10	3	10	2	4	2
2021/2022	119	0	4	13	13	6	8	4	1	25	4	26	15
2022/2023	185	13	15	6	10	13	19	7	16	22	4	9	51
2023/2024	427	55	44	43	39	62	48	40	14	5	17	35	25
2024/2025	43	29	10	4	0	0	0	0	0	0	0	0	0
Totale													840