CIONI, MARCELLO
 Distribuzione geografica
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Continente #
NA - Nord America 1.223
AS - Asia 1.047
EU - Europa 952
SA - Sud America 137
AF - Africa 11
OC - Oceania 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 3.373
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Nazione #
US - Stati Uniti d'America 1.204
IT - Italia 468
CN - Cina 342
SG - Singapore 303
HK - Hong Kong 185
BR - Brasile 110
GB - Regno Unito 101
DE - Germania 70
SE - Svezia 63
VN - Vietnam 62
FR - Francia 57
KR - Corea 50
RU - Federazione Russa 48
FI - Finlandia 34
IN - India 33
NL - Olanda 31
TW - Taiwan 21
ID - Indonesia 13
IE - Irlanda 11
AR - Argentina 10
BG - Bulgaria 10
JP - Giappone 10
CA - Canada 9
ES - Italia 9
PL - Polonia 9
MX - Messico 7
AT - Austria 6
BD - Bangladesh 5
DK - Danimarca 5
EC - Ecuador 5
LT - Lituania 5
RO - Romania 5
UA - Ucraina 5
TR - Turchia 4
UZ - Uzbekistan 4
ZA - Sudafrica 4
BE - Belgio 3
CO - Colombia 3
CR - Costa Rica 3
GR - Grecia 3
IQ - Iraq 3
PE - Perù 3
SA - Arabia Saudita 3
CH - Svizzera 2
CL - Cile 2
EG - Egitto 2
JO - Giordania 2
KE - Kenya 2
MK - Macedonia 2
PH - Filippine 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AU - Australia 1
AZ - Azerbaigian 1
BO - Bolivia 1
BY - Bielorussia 1
CG - Congo 1
CZ - Repubblica Ceca 1
DZ - Algeria 1
HU - Ungheria 1
KW - Kuwait 1
MY - Malesia 1
NZ - Nuova Zelanda 1
PK - Pakistan 1
PY - Paraguay 1
RS - Serbia 1
SD - Sudan 1
SK - Slovacchia (Repubblica Slovacca) 1
TJ - Tagikistan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 3.373
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Città #
Santa Clara 226
Singapore 193
Hong Kong 168
Hefei 166
Ashburn 120
Chandler 119
Fairfield 95
Milan 87
Nyköping 58
London 57
Modena 47
Los Angeles 40
Seoul 39
Cambridge 34
Beijing 33
Padova 30
Helsinki 29
Seattle 24
Woodbridge 24
Chicago 22
Kent 21
San Diego 21
Wilmington 21
Boardman 20
Houston 19
Ho Chi Minh City 17
Ann Arbor 16
Moscow 16
Reggio Emilia 15
Hanoi 14
Munich 14
New York 14
Buffalo 13
Council Bluffs 13
Princeton 13
Rome 13
Bologna 12
Bremen 12
Turin 11
Jakarta 10
Sofia 10
Taipei 10
Dallas 9
Dublin 9
Formigine 9
Hsinchu 9
São Paulo 9
Denver 8
Grafing 8
Guangzhou 8
Warsaw 8
Assèmini 7
Piacenza 7
Ravenna 7
Shanghai 7
Southend 7
Bengaluru 6
Brooklyn 6
Duncan 6
Frankfurt am Main 6
Marseille 6
Palermo 6
Paris 6
Reggio Nell'emilia 6
Amsterdam 5
Daegu 5
Montreal 5
Padua 5
Redondo Beach 5
Stockholm 5
Tokyo 5
Vienna 5
Bari 4
Cagliari 4
Chennai 4
Kanpur 4
Kilburn 4
Laveno-Mombello 4
Montecchio Maggiore 4
Nuremberg 4
Parma 4
Perugia 4
Riccione 4
Rio de Janeiro 4
Shenzhen 4
Tashkent 4
Vicenza 4
Ankara 3
Bexley 3
Biên Hòa 3
Bonate Sopra 3
Bonate Sotto 3
Brescia 3
Burjassot 3
Can Tho 3
Catania 3
Cesena 3
Columbus 3
Da Nang 3
Elk Grove Village 3
Totale 2.235
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Nome #
GaN-based power devices: Physics, reliability, and perspectives 478
Electric Field and Self-Heating Effects on the Emission Time of Iron Traps in GaN HEMTs 240
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 232
Mechanisms Underlying the Bidirectional VT Shift After Negative-Bias Temperature Instability Stress in Carbon-Doped Fully Recessed AlGaN/GaN MIS-HEMTs 229
Experimental and numerical investigation of Poole-Frenkel effect on dynamic RON transients in C-doped p-GaN HEMTs 222
Caratterizzazione di Dispositivi di Potenza a Semiconduttore con Largo Band-Gap 202
Partial Recovery of Dynamic RON Versus OFF-State Stress Voltage in p-GaN Gate AlGaN/GaN Power HEMTs 201
Role of carbon in dynamic effects and reliability of 0.15-um AlGaN/GaN HEMTs for RF power amplifiers 176
Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs 172
Gate-Bias Induced RON Instability in p-GaN Power HEMTs 145
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications 129
Effect of Trap-Filling Bias on the Extraction of the Time Constant of Drain Current Transients in AlGaN/GaN HEMTs 127
Impact of Soft- and Hard-Switching transitions on VTH and RON Drifts in packaged SiC MOSFETs 127
A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps 126
Identification of Interface States responsible for VTHHysteresis in packaged SiC MOSFETs 124
On the Dynamic RON, Vertical Leakage and Capacitance Behavior in pGaN HEMTs With Heavily Carbon-Doped Buffers 107
Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability 104
Unveiling the Role of Hole Barrier Traps on ON-Resistance Instability after Gate Bias Stress in p-GaN Power HEMTs 85
Physical Modelling of Charge Trapping Effects 66
RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits 66
On-Wafer RONDegradation Analysis of 100 v p-GaN HEMTs Emulating Low-and High-Side Operation in Half Bridge Circuits 66
Totale 3.424
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Categoria #
all - tutte 16.341
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 16.341
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021215 0 0 0 0 0 0 0 18 47 14 59 77
2021/2022376 25 18 26 5 33 38 33 11 38 28 78 43
2022/2023438 38 36 36 31 41 42 12 62 65 11 40 24
2023/2024399 32 27 24 43 55 21 40 36 21 31 16 53
2024/20251.150 57 20 14 76 175 139 46 75 141 58 182 167
2025/2026846 168 135 146 216 181 0 0 0 0 0 0 0
Totale 3.424