CIONI, MARCELLO
 Distribuzione geografica
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Continente #
NA - Nord America 1.386
AS - Asia 1.167
EU - Europa 984
SA - Sud America 158
AF - Africa 15
OC - Oceania 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 3.713
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Nazione #
US - Stati Uniti d'America 1.363
IT - Italia 479
CN - Cina 362
SG - Singapore 362
HK - Hong Kong 187
BR - Brasile 126
GB - Regno Unito 105
DE - Germania 72
VN - Vietnam 71
SE - Svezia 64
FR - Francia 63
KR - Corea 51
RU - Federazione Russa 48
FI - Finlandia 34
IN - India 34
NL - Olanda 33
TW - Taiwan 31
JP - Giappone 20
ID - Indonesia 13
AR - Argentina 12
CA - Canada 11
IE - Irlanda 11
BG - Bulgaria 10
PL - Polonia 10
ES - Italia 9
UA - Ucraina 8
BD - Bangladesh 7
EC - Ecuador 7
MX - Messico 7
ZA - Sudafrica 7
AT - Austria 6
LT - Lituania 6
DK - Danimarca 5
RO - Romania 5
SA - Arabia Saudita 5
CR - Costa Rica 4
TR - Turchia 4
UZ - Uzbekistan 4
BE - Belgio 3
CL - Cile 3
CO - Colombia 3
GR - Grecia 3
IQ - Iraq 3
PE - Perù 3
AE - Emirati Arabi Uniti 2
CH - Svizzera 2
EG - Egitto 2
JO - Giordania 2
KE - Kenya 2
KW - Kuwait 2
MK - Macedonia 2
PH - Filippine 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AU - Australia 1
AZ - Azerbaigian 1
BO - Bolivia 1
BY - Bielorussia 1
CG - Congo 1
CZ - Repubblica Ceca 1
DZ - Algeria 1
HU - Ungheria 1
JM - Giamaica 1
LB - Libano 1
MY - Malesia 1
NG - Nigeria 1
NZ - Nuova Zelanda 1
PK - Pakistan 1
PY - Paraguay 1
RS - Serbia 1
SD - Sudan 1
SK - Slovacchia (Repubblica Slovacca) 1
TJ - Tagikistan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 3.713
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Città #
Santa Clara 226
Singapore 219
Hong Kong 170
Hefei 166
Ashburn 134
Chandler 119
Fairfield 95
Milan 87
Nyköping 58
London 57
Modena 48
Los Angeles 45
Seoul 39
San Jose 38
Chicago 35
Cambridge 34
Beijing 33
Padova 30
Helsinki 29
Seattle 24
Woodbridge 24
Boardman 22
Wilmington 22
Houston 21
Kent 21
San Diego 21
Ho Chi Minh City 20
New York 18
Reggio Emilia 17
Ann Arbor 16
Hanoi 16
Moscow 16
Bologna 15
Council Bluffs 15
Buffalo 14
Munich 14
Taipei 14
The Dalles 14
Princeton 13
Rome 13
Bremen 12
São Paulo 11
Turin 11
Brooklyn 10
Dallas 10
Denver 10
Guangzhou 10
Hsinchu 10
Jakarta 10
Sofia 10
Dublin 9
Formigine 9
Warsaw 9
Frankfurt am Main 8
Grafing 8
Shanghai 8
Amsterdam 7
Assèmini 7
Montreal 7
Padua 7
Piacenza 7
Ravenna 7
Southend 7
Tokyo 7
Bengaluru 6
Compiègne 6
Duncan 6
Marseille 6
Palermo 6
Paris 6
Reggio Nell'emilia 6
Salt Lake City 6
Stockholm 6
Columbus 5
Daegu 5
Elk Grove Village 5
Manchester 5
Redondo Beach 5
Vienna 5
Bari 4
Cagliari 4
Chennai 4
Haiphong 4
Kanpur 4
Kilburn 4
Kyoto 4
Laveno-Mombello 4
Montecchio Maggiore 4
Nuremberg 4
Orem 4
Parma 4
Perugia 4
Riccione 4
Rio de Janeiro 4
Shenzhen 4
Tampa 4
Tashkent 4
Vicenza 4
Zhongli District 4
Ankara 3
Totale 2.410
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Nome #
GaN-based power devices: Physics, reliability, and perspectives 504
Electric Field and Self-Heating Effects on the Emission Time of Iron Traps in GaN HEMTs 254
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 245
Mechanisms Underlying the Bidirectional VT Shift After Negative-Bias Temperature Instability Stress in Carbon-Doped Fully Recessed AlGaN/GaN MIS-HEMTs 243
Experimental and numerical investigation of Poole-Frenkel effect on dynamic RON transients in C-doped p-GaN HEMTs 239
Partial Recovery of Dynamic RON Versus OFF-State Stress Voltage in p-GaN Gate AlGaN/GaN Power HEMTs 218
Caratterizzazione di Dispositivi di Potenza a Semiconduttore con Largo Band-Gap 213
Role of carbon in dynamic effects and reliability of 0.15-um AlGaN/GaN HEMTs for RF power amplifiers 195
Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs 192
Gate-Bias Induced RON Instability in p-GaN Power HEMTs 162
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications 149
A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps 147
Impact of Soft- and Hard-Switching transitions on VTH and RON Drifts in packaged SiC MOSFETs 147
Effect of Trap-Filling Bias on the Extraction of the Time Constant of Drain Current Transients in AlGaN/GaN HEMTs 143
Identification of Interface States responsible for VTHHysteresis in packaged SiC MOSFETs 139
On the Dynamic RON, Vertical Leakage and Capacitance Behavior in pGaN HEMTs With Heavily Carbon-Doped Buffers 116
Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability 115
Unveiling the Role of Hole Barrier Traps on ON-Resistance Instability after Gate Bias Stress in p-GaN Power HEMTs 97
Physical Modelling of Charge Trapping Effects 78
RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits 77
On-Wafer RONDegradation Analysis of 100 v p-GaN HEMTs Emulating Low-and High-Side Operation in Half Bridge Circuits 76
Analysis of Dynamic-Ron and VTH shift in on-wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits 16
Impact of OFF-State Stress on Dynamic RON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation 2
Totale 3.767
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Categoria #
all - tutte 17.280
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 17.280
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021215 0 0 0 0 0 0 0 18 47 14 59 77
2021/2022376 25 18 26 5 33 38 33 11 38 28 78 43
2022/2023438 38 36 36 31 41 42 12 62 65 11 40 24
2023/2024399 32 27 24 43 55 21 40 36 21 31 16 53
2024/20251.150 57 20 14 76 175 139 46 75 141 58 182 167
2025/20261.189 168 135 146 216 341 116 67 0 0 0 0 0
Totale 3.767