CIONI, MARCELLO
 Distribuzione geografica
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Continente #
NA - Nord America 1.341
AS - Asia 1.151
EU - Europa 978
SA - Sud America 158
AF - Africa 15
OC - Oceania 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 3.646
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Nazione #
US - Stati Uniti d'America 1.318
IT - Italia 473
CN - Cina 362
SG - Singapore 358
HK - Hong Kong 187
BR - Brasile 126
GB - Regno Unito 105
DE - Germania 72
VN - Vietnam 71
SE - Svezia 64
FR - Francia 63
KR - Corea 50
RU - Federazione Russa 48
FI - Finlandia 34
IN - India 34
NL - Olanda 33
TW - Taiwan 28
ID - Indonesia 13
AR - Argentina 12
JP - Giappone 12
CA - Canada 11
IE - Irlanda 11
BG - Bulgaria 10
PL - Polonia 10
ES - Italia 9
UA - Ucraina 8
BD - Bangladesh 7
EC - Ecuador 7
MX - Messico 7
ZA - Sudafrica 7
AT - Austria 6
LT - Lituania 6
DK - Danimarca 5
RO - Romania 5
SA - Arabia Saudita 5
CR - Costa Rica 4
TR - Turchia 4
UZ - Uzbekistan 4
BE - Belgio 3
CL - Cile 3
CO - Colombia 3
GR - Grecia 3
IQ - Iraq 3
PE - Perù 3
AE - Emirati Arabi Uniti 2
CH - Svizzera 2
EG - Egitto 2
JO - Giordania 2
KE - Kenya 2
KW - Kuwait 2
MK - Macedonia 2
PH - Filippine 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
AU - Australia 1
AZ - Azerbaigian 1
BO - Bolivia 1
BY - Bielorussia 1
CG - Congo 1
CZ - Repubblica Ceca 1
DZ - Algeria 1
HU - Ungheria 1
JM - Giamaica 1
LB - Libano 1
MY - Malesia 1
NG - Nigeria 1
NZ - Nuova Zelanda 1
PK - Pakistan 1
PY - Paraguay 1
RS - Serbia 1
SD - Sudan 1
SK - Slovacchia (Repubblica Slovacca) 1
TJ - Tagikistan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 3.646
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Città #
Santa Clara 226
Singapore 215
Hong Kong 170
Hefei 166
Ashburn 132
Chandler 119
Fairfield 95
Milan 87
Nyköping 58
London 57
Modena 48
Los Angeles 44
Seoul 39
Cambridge 34
Chicago 34
Beijing 33
Padova 30
Helsinki 29
Seattle 24
Woodbridge 24
Boardman 22
Wilmington 22
Houston 21
Kent 21
San Diego 21
Ho Chi Minh City 20
New York 18
Ann Arbor 16
Hanoi 16
Moscow 16
Bologna 15
Council Bluffs 15
Reggio Emilia 15
Buffalo 14
Munich 14
Taipei 14
Princeton 13
Rome 13
Bremen 12
The Dalles 12
São Paulo 11
Turin 11
Brooklyn 10
Denver 10
Guangzhou 10
Hsinchu 10
Jakarta 10
Sofia 10
Dallas 9
Dublin 9
Formigine 9
Warsaw 9
Frankfurt am Main 8
Grafing 8
Shanghai 8
Amsterdam 7
Assèmini 7
Montreal 7
Piacenza 7
Ravenna 7
Southend 7
Tokyo 7
Bengaluru 6
Compiègne 6
Duncan 6
Marseille 6
Palermo 6
Paris 6
Reggio Nell'emilia 6
Salt Lake City 6
Stockholm 6
Columbus 5
Daegu 5
Elk Grove Village 5
Manchester 5
Padua 5
Redondo Beach 5
Vienna 5
Bari 4
Cagliari 4
Chennai 4
Haiphong 4
Kanpur 4
Kilburn 4
Laveno-Mombello 4
Montecchio Maggiore 4
Nuremberg 4
Orem 4
Parma 4
Perugia 4
Riccione 4
Rio de Janeiro 4
Shenzhen 4
Tampa 4
Tashkent 4
Vicenza 4
Ankara 3
Bexley 3
Biên Hòa 3
Bonate Sopra 3
Totale 2.358
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Nome #
GaN-based power devices: Physics, reliability, and perspectives 492
Electric Field and Self-Heating Effects on the Emission Time of Iron Traps in GaN HEMTs 251
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 242
Mechanisms Underlying the Bidirectional VT Shift After Negative-Bias Temperature Instability Stress in Carbon-Doped Fully Recessed AlGaN/GaN MIS-HEMTs 241
Experimental and numerical investigation of Poole-Frenkel effect on dynamic RON transients in C-doped p-GaN HEMTs 238
Partial Recovery of Dynamic RON Versus OFF-State Stress Voltage in p-GaN Gate AlGaN/GaN Power HEMTs 217
Caratterizzazione di Dispositivi di Potenza a Semiconduttore con Largo Band-Gap 211
Role of carbon in dynamic effects and reliability of 0.15-um AlGaN/GaN HEMTs for RF power amplifiers 193
Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs 189
Gate-Bias Induced RON Instability in p-GaN Power HEMTs 158
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications 146
Impact of Soft- and Hard-Switching transitions on VTH and RON Drifts in packaged SiC MOSFETs 145
A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps 143
Effect of Trap-Filling Bias on the Extraction of the Time Constant of Drain Current Transients in AlGaN/GaN HEMTs 141
Identification of Interface States responsible for VTHHysteresis in packaged SiC MOSFETs 136
Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability 114
On the Dynamic RON, Vertical Leakage and Capacitance Behavior in pGaN HEMTs With Heavily Carbon-Doped Buffers 114
Unveiling the Role of Hole Barrier Traps on ON-Resistance Instability after Gate Bias Stress in p-GaN Power HEMTs 96
Physical Modelling of Charge Trapping Effects 75
RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits 74
On-Wafer RONDegradation Analysis of 100 v p-GaN HEMTs Emulating Low-and High-Side Operation in Half Bridge Circuits 73
Analysis of Dynamic-Ron and VTH shift in on-wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits 9
Impact of OFF-State Stress on Dynamic RON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation 2
Totale 3.700
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Categoria #
all - tutte 17.105
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 17.105
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021215 0 0 0 0 0 0 0 18 47 14 59 77
2021/2022376 25 18 26 5 33 38 33 11 38 28 78 43
2022/2023438 38 36 36 31 41 42 12 62 65 11 40 24
2023/2024399 32 27 24 43 55 21 40 36 21 31 16 53
2024/20251.150 57 20 14 76 175 139 46 75 141 58 182 167
2025/20261.122 168 135 146 216 341 116 0 0 0 0 0 0
Totale 3.700