Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability / Zanoni, E., Gao, Z., Fornasier, M., Saro, M., Rampazzo, F., De Santi, C., Meneghesso, G., Meneghini, M., Cioni, M., Zagni, N., Chini, A., Verzellesi, G.. - (2023). (46th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe & 17th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (WOCSDICE-EXMATEC 2023) Palermo (Italy) May 21-25, 2023).

Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability

Enrico Zanoni;Marcello Cioni;Nicolo' Zagni;Alessandro Chini;Giovanni Verzellesi
2023
2023
46th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe & 17th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (WOCSDICE-EXMATEC 2023)
Palermo (Italy)
May 21-25, 2023
Zanoni, Enrico; Gao, Zhan; Fornasier, Mirko; Saro, Marco; Rampazzo, Fabiana; De Santi, Carlo; Meneghesso, Gaudenzio; Meneghini, Matteo; Cioni, Marcell...espandi
Microwave and millimeter-wave GaN HEMTs: impact of epitaxial structure on short-channel effects, electron trapping and reliability / Zanoni, E., Gao, Z., Fornasier, M., Saro, M., Rampazzo, F., De Santi, C., Meneghesso, G., Meneghini, M., Cioni, M., Zagni, N., Chini, A., Verzellesi, G.. - (2023). (46th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe & 17th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (WOCSDICE-EXMATEC 2023) Palermo (Italy) May 21-25, 2023).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1332266
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