ASANOVSKI, RUBEN
ASANOVSKI, RUBEN
Dipartimento di Ingegneria "Enzo Ferrari"
1/f noise model based on trap-assisted tunneling for ultra-thin oxides MOSFETs
2020 Caruso, Enrico; Palestri, Pierpaolo; Selmi, Luca; Asanovski, Ruben
A Comprehensive Gate and Drain Trapping/Detrapping Noise Model and Its Implications for Thin-Dielectric MOSFETs
2021 Asanovski, R.; Palestri, P.; Caruso, E.; Selmi, L.
Assessment of Advanced Nanoscale Bulk FinFET's Self-Heating accounting for degraded thermal conductivity at the nanoscale
2023 Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca
Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
2024 Asanovski, R.; Arimura, H.; de Marneffe, J. -F.; Palestri, P.; Horiguchi, N.; Kaczer, B.; Selmi, L.; Franco, J.
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
2024 Asanovski, R.; Grill, A.; Franco, J.; Palestri, P.; Mertens, H.; Ritzenthaler, R.; Horiguchi, N.; Kaczer, B.; Selmi, L.
Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Currents of Scaled MOSFETs
2022 Asanovski, R.; Palestri, P.; Selmi, L.
Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
2023 Asanovski, Ruben; Franco, Jacopo; Palestri, Pierpaolo; Kaczer, Ben; Selmi, Luca
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
2022 Asanovski, R.; Grill, A.; Franco, J.; Palestri, P.; Beckers, A.; Kaczer, B.; Selmi, L.
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise
2022 Asanovski, R.; Palestri, P.; Selmi, L.
Probing Band Tail States in MOSFETs at Cryogenic Temperatures through Noise Spectroscopy
2023 Asanovski, R.; Grill, A.; Franco, J.; Palestri, P.; Li, R.; Kubicek, S.; De Greve, K.; Kaczer, B.; Selmi, L.
Rumore dovuto a Trappole in Tecnologie MOSFET all'Avanguardia fino a Temperature Criogeniche
2024 Asanovski, Ruben
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
2023 Asanovski, R; Grill, A; Franco, J; Palestri, P; Beckers, A; Kaczer, B; Selmi, L