statistiche ricercatore

Nome	#
Light sensitivity of current DLTS and its implications on the physics of DC-to-RF dispersion in AlGaAs-GaAs HFETs	194
Hot-electron-stress degradation in unpassivated GaN/AlGaN/GaN HEMTs on SiC	177
Impact of temperature on surface-trap-induced gate-lag effects in GaAs heterostructure FETs	146
The impact of light on current DLTS and gate-lag transients of AlGaAs-GaAs HFETs	145
Experimental/numerical investigation of the physical mechanisms behind dc-to-RF dispersion effects in GaAs-based HFET’s	138
Experimental and numerical assessment of gate-lag phenomena in AlGaAs-GaAs heterostructure field-effect transistors (FETs)	136
Experimental and numerical analysis of gate- and drain-lag phenomena in AlGaAs/InGaAs PHEMTs	134
Origin of hole-like peaks in current deep level transient spectroscopy of n-channel AlGaAs/GaAs heterostructure field-effect transistors	131
Energetic and spatial localisation of deep-level traps responsible for DC-to-RF dispersion effects in AlGaAs-GaAs HFETs	129
Measurements and simulations of hot-carrier degradation effects in AlGaAs/GaAs HFETs	99
Experimental and simulated gate lag transients in unpassivated GaN/AlGaN/GaN HEMTs	97
Light sensitivity of gate lag and current DLTS as a tool to investigate the origin of dc-to-RF dispersion effects in GaAs heterostructure FETs	88
Totale	1.614

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2018/2019	125	0	0	0	0	0	0	0	0	0	0	65	60
2019/2020	414	27	33	15	39	38	51	70	33	44	22	16	26
2020/2021	264	28	8	19	27	30	13	25	26	26	35	10	17
2021/2022	212	7	35	14	15	4	17	14	4	16	20	41	25
2022/2023	270	36	40	12	34	12	67	4	22	21	4	6	12
2023/2024	92	7	5	5	18	23	5	5	22	1	1	0	0
Totale													1.614