PIRROTTA, Onofrio

PIRROTTA, Onofrio  

Dipartimento di Scienze e Metodi dell'Ingegneria  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.017 secondi).
Titolo Data di pubblicazione Autore(i) File
A Novel Electronic Nose as Adaptable Device to Judge Microbiological Quality and Safety in Foodstuff 1-gen-2014 Sberveglieri, Veronica; Nunez Carmona, Estefania; Elisabetta, Comini; Andrea, Ponzoni; Dario, Zappa; Pirrotta, Onofrio; Pulvirenti, Andrea
Combined Effects of LED Lights and chicken manure on Neochloris oleoabundans Growth 1-gen-2017 ALTUNOZ HATIPOGLU, Meltem; Pirrotta, Onofrio; Forti, Luca; Allesina, Giulio; Pedrazzi, Simone; Obali, Olcay; Tartarini, Paolo; Arru, Laura
Controlling uniformity of RRAM characteristics through the forming process 1-gen-2012 Kalantarian, A.; Bersuker, G.; Gilmer, D. C.; Veksler, D.; Butcher, B.; Padovani, A.; Pirrotta, O.; Larcher, L.; Geer, R.; Nishi, Y.; Kirsch, P.
Controlling Uniformity of RRAM Characteristics via the Forming Process 1-gen-2012 A., Kalantarian; G., Bersuker; D. C., Gilmer; D., Veksler; B., Butcher; Padovani, Andrea; Pirrotta, Onofrio; Larcher, Luca; P., Kirsch; Y., Nishi
Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM 1-gen-2011 C., Cagli; J., Buckley; V., Jousseaume; A., Salaun; H., Grampeix; J. F., Nodin; H., Feldis; A., Persico; J., Cluzel; P., Lorenzi; L., Massari; R., Rao; F., Irrera; T., Cabout; F., Aussenac; C., Carabasse; M., Coue; P., Calka; E., Martinez; L., Perniola; P., Blaise; Z., Fang; Y. H., Yu; G., Ghibaudo; D., Deleruyelle; M., Bocquet; C., Muller; Padovani, Andrea; Pirrotta, Onofrio; Vandelli, Luca; Larcher, Luca; G., Reimbold; B., de Salvo
Investigation of the role of electrodes on the retention performance of HfOx based RRAM cells by experiments, atomistic simulations and device physical modeling 1-gen-2013 B., Traore; K. H., Xue; E., Vianello; G., Molas; Padovani, Andrea; Pirrotta, Onofrio; Larcher, Luca; P., Blaise; L., Fonseca; B., De Salvo; Y., Nishi
Leakage current through the poly-crystalline HfO2: trap densities at grains and grain boundaries 1-gen-2013 Pirrotta, Onofrio; Larcher, Luca; M., Lanza; Padovani, Andrea; M., Porti; Nafría, M. o.; G., Bersuker
Microscopic Modeling of HfOₓ RRAM Operations: From Forming to Switching 1-gen-2015 Padovani, Andrea; Larcher, Luca; Pirrotta, Onofrio; Vandelli, Luca; Bersuker, Gennadi
Microscopic understanding and modeling of HfO2 RRAM device physics 1-gen-2012 Larcher, Luca; Padovani, Andrea; Pirrotta, Onofrio; Vandelli, Luca; G., Bersuker
Modeling the charge transport and degradation in HfO 2 dielectric for reliability improvement and life-time predictions in logic and memory devices 1-gen-2011 Padovani, Andrea; Larcher, Luca; Vandelli, Luca; Pirrotta, Onofrio; Pavan, Paolo
Multi-scale modeling of oxygen vacancies assisted charge transport in sub-stoichiometric TiOx for RRAM application 1-gen-2014 Pirrotta, Onofrio; Padovani, Andrea; Larcher, Luca; L., Zhao; B., Magyari Köpe; Y., Nishi
Progresses in Modeling HfOx RRAM Operations and Variability 1-gen-2014 Larcher, Luca; Pirrotta, Onofrio; Puglisi, Francesco Maria; Padovani, Andrea; Pavan, Paolo; Vandelli, Luca
Temperature impact (up to 200 °C) on performance and reliability of HfO2-based RRAMs 1-gen-2013 T., Cabout; L., Perniola; V., Jousseaume; H., Grampeix; J. F., Nodin; A., Toffoli; E., Jalaguier; E., Vianello; G., Molas; G., Reimbold; B., De Salvo; Pirrotta, Onofrio; Padovani, Andrea; Larcher, Luca; T., Diokh; P., Candelier; M., Guillermet; M., Bocquet; C., Muller