Sfoglia per Serie
A scaled replacement metal gate InGaAs-on-Insulator n-FinFET on Si with record performance
2017 Hahn, H.; Deshpande, V.; Caruso, E.; Sant, S.; O'Connor, E.; Baumgartner, Y.; Sousa, M.; Caimi, D.; Olziersky, A.; Palestri, P.; Selmi, L.; Schenk, A.; Czornomaz, L.
Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain
2015 Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Simulation of graphene nanoscale RF transistors including scattering and generation/recombination mechanisms
2011 Paussa, A; Geromel, M; Palestri, Pierpaolo; Bresciani, M; Esseni, David; Selmi, Luca
A simulation study of strain induced performance enhancements in InAs nanowire Tunnel-FETs
2011 Conzatti, Francesco; M. G., Pala; Esseni, David; E., Bano; Selmi, Luca
Simulation study of the on-current improvements in Ge and sGe versus Si and sSi nano-MOSFETs
2010 Conzatti, Francesco; Toniutti, Paolo; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Spectroscopic Analysis of Trap Assisted Tunneling on This Oxides by Means of Substrate Hot Electron Injection Experiments
2002 Driussi, Francesco; Iob, R.; Esseni, David; Selmi, Luca; VAN SCHAIJK, R.; Widdershoven, F.
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories
2003 Larcher, Luca; Pavan, Paolo
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs
2002 Esseni, David; Abramo, Antonio; Selmi, Luca; Sangiorgi, Enrico
Substrate enhanced degradation of cmos devices
2000 Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza
Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs
2013 Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Towards Microscopic Understanding of MOSFET Reliability: the Role of Carrier Energy and Transport Simulations
2003 Selmi, Luca; Esseni, David; Palestri, Pierpaolo
Transport in deca-nanometric MOSFETs: from bandstructure to on-currents
2006 Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Trapping and High Field Related Issues in GaN Power HEMTs
2014 Meneghesso, Gaudenzio; Meneghini, Matteo; Chini, Alessandro; Verzellesi, Giovanni; Zanoni, Enrico
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
A scaled replacement metal gate InGaAs-on-Insulator n-FinFET on Si with record performance | 1-gen-2017 | Hahn, H.; Deshpande, V.; Caruso, E.; Sant, S.; O'Connor, E.; Baumgartner, Y.; Sousa, M.; Caimi, D.; Olziersky, A.; Palestri, P.; Selmi, L.; Schenk, A.; Czornomaz, L. | |
Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain | 1-gen-2015 | Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Simulation of graphene nanoscale RF transistors including scattering and generation/recombination mechanisms | 1-gen-2011 | Paussa, A; Geromel, M; Palestri, Pierpaolo; Bresciani, M; Esseni, David; Selmi, Luca | |
A simulation study of strain induced performance enhancements in InAs nanowire Tunnel-FETs | 1-gen-2011 | Conzatti, Francesco; M. G., Pala; Esseni, David; E., Bano; Selmi, Luca | |
Simulation study of the on-current improvements in Ge and sGe versus Si and sSi nano-MOSFETs | 1-gen-2010 | Conzatti, Francesco; Toniutti, Paolo; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Spectroscopic Analysis of Trap Assisted Tunneling on This Oxides by Means of Substrate Hot Electron Injection Experiments | 1-gen-2002 | Driussi, Francesco; Iob, R.; Esseni, David; Selmi, Luca; VAN SCHAIJK, R.; Widdershoven, F. | |
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories | 1-gen-2003 | Larcher, Luca; Pavan, Paolo | |
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs | 1-gen-2002 | Esseni, David; Abramo, Antonio; Selmi, Luca; Sangiorgi, Enrico | |
Substrate enhanced degradation of cmos devices | 1-gen-2000 | Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza | |
Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs | 1-gen-2013 | Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Towards Microscopic Understanding of MOSFET Reliability: the Role of Carrier Energy and Transport Simulations | 1-gen-2003 | Selmi, Luca; Esseni, David; Palestri, Pierpaolo | |
Transport in deca-nanometric MOSFETs: from bandstructure to on-currents | 1-gen-2006 | Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Trapping and High Field Related Issues in GaN Power HEMTs | 1-gen-2014 | Meneghesso, Gaudenzio; Meneghini, Matteo; Chini, Alessandro; Verzellesi, Giovanni; Zanoni, Enrico |
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