NAVA, Filippo
NAVA, Filippo
Charge particle detection properties of epitaxial 4H-SiC Schottky diodes
2000-01-01 Verzellesi, Giovanni; Vanni, Paolo; Nava, Filippo; E., Vittone; C., Manfredotti; A., LO GIUDICE; A., Castaldini; A., Cavallini; L., Polenta; R., Nipoti; C., Donolato
Charge particle detection properties of epitaxial 4H-SiC Schottky diodes
2001-01-01 Nava, Filippo; P., Vanni; Verzellesi, Giovanni; A., Castaldini; A., Cavallini; L., Polenta; R., Nipoti; C., Donolato
Diffusion coeffcient of electrons in Si
1981-01-01 Brunetti, Rossella; Jacoboni, Carlo; Nava, Filippo; L., Reggiani; G., Bosman; R. J. J., Zijlstra
Diffusion coefficient of electrons in silicon
1981-01-01 Brunetti, R.; Jacoboni, C.; Nava, F.; Reggiani, L.; Bosman, G.; Zijlstra, R. J. J.
Electric-field behavior and charge-density distribution in semi-insulating gallium arsenide Schottky diodes
1997-01-01 Castaldini, A; Cavallini, A; Polenta, L; Canali, C; Delpapa, C; Nava, Filippo
Electrical and optical properties of near-noble silicides
1987-01-01 Bisi, Olmes; M. G., Betti; Nava, Filippo; A., Borghesi; G., Guizzetti; L., Nosenzo; A., Piaggi
Electrical and optical properties of silicide single crystals and thin films
1993-01-01 Nava, Filippo; K. N., Tu; O., Thomas; J. P., Senateur; R., Madar; A., Borghesi; G., Guizzetti; U., Gottlieb; O., Laborde; Bisi, Olmes
Electrical and structural characterization of Nb - Si thin film alloys
1986-01-01 Nava, Filippo; P., Psaras; H., Takai; K. N., Tu; Valeri, Sergio; Bisi, Olmes
Electrical characterization of alloy thin films of VSi2 and V3Si
1986-01-01 Nava, Filippo; Bisi, Olmes; P., Psaras; H., Takai; K. N., Tu
Electrical transport properties of V3Si, V5Si3 and VSi2 thin films
1986-01-01 Nava, Filippo; Bisi, Olmes; K. N., Tu
Far Infrared Vibrational Spectroscopy in CrSi_2
1990-01-01 A., Borghesi; A., Piaggi; Franchini, Anna; G., Guizzetti; Nava, Filippo; Santoro, Giorgio
Far-infrared spectroscopy of thermally annealed tungsten silicide films
1991-01-01 M., Amiotti; A., Borghesi; G., Guizzetti; Nava, Filippo; Santoro, Giorgio
Investigation on the charge collection properties of a 4H-SiC Schottky diode detector
2002-01-01 Verzellesi, Giovanni; Vanni, Paolo; Nava, Filippo; Canali, Claudio
On the UV responsivity of neutron irradiated 4H-SiC
2008-01-01 Anna, Cavallini; Antonio, Castaldini; Nava, Filippo
Optical and vibrational properties of Cr and Fe disilicides
1990-01-01 A., Borghesi; A., Piaggi; A., Stella; G., Guizzetti; Nava, Filippo; Santoro, Giorgio
OPTICAL STUDY OF NIOBIUM DISILICIDE POLYCRYSTALLINE FILMS
1991-01-01 Amiotti, M; Borghesi, A; Marabelli, F; Guizzetti, G; Nava, Filippo
Polymerization and Characterization of 4,4’-bis(alkylsulfanyl)-2,2’-bithiophenes
1999-01-01 Iarossi, Dario; Mucci, Adele; Schenetti, Luisa; Seeber, Renato; F., Goldoni; Affronte, Marco; Nava, Filippo
Processing high-quality silicon for microstrip detectors
1992-01-01 Nava, Filippo; Ottaviani, Giampiero; Tonini, Rita; Frabboni, Stefano; A., Alberigi Quaranta; P., Cantoni; P. L., Frabetti; L., Stagni; G., Queirolo; P. F., Manfredi
Radiation detection properties of 4H-SiC Schottky diodes irradiated up to 10(16) n/cm(2) by 1 MeV neutrons
2006-01-01 Nava, Filippo; A., Castaldini; A., Cavallini; P., Errani; V., Cindro
Radiation tolerance of epitaxial silicon carbide detectors for electrons, protons and gamma-rays
2003-01-01 Nava, Filippo; E., Vittone; P., Vanni; Verzellesi, Giovanni; Pg, Fuochi; C., Lanzieri; M., Glaser
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Charge particle detection properties of epitaxial 4H-SiC Schottky diodes | 1-gen-2000 | Verzellesi, Giovanni; Vanni, Paolo; Nava, Filippo; E., Vittone; C., Manfredotti; A., LO GIUDICE; A., Castaldini; A., Cavallini; L., Polenta; R., Nipoti; C., Donolato | |
Charge particle detection properties of epitaxial 4H-SiC Schottky diodes | 1-gen-2001 | Nava, Filippo; P., Vanni; Verzellesi, Giovanni; A., Castaldini; A., Cavallini; L., Polenta; R., Nipoti; C., Donolato | |
Diffusion coeffcient of electrons in Si | 1-gen-1981 | Brunetti, Rossella; Jacoboni, Carlo; Nava, Filippo; L., Reggiani; G., Bosman; R. J. J., Zijlstra | |
Diffusion coefficient of electrons in silicon | 1-gen-1981 | Brunetti, R.; Jacoboni, C.; Nava, F.; Reggiani, L.; Bosman, G.; Zijlstra, R. J. J. | |
Electric-field behavior and charge-density distribution in semi-insulating gallium arsenide Schottky diodes | 1-gen-1997 | Castaldini, A; Cavallini, A; Polenta, L; Canali, C; Delpapa, C; Nava, Filippo | |
Electrical and optical properties of near-noble silicides | 1-gen-1987 | Bisi, Olmes; M. G., Betti; Nava, Filippo; A., Borghesi; G., Guizzetti; L., Nosenzo; A., Piaggi | |
Electrical and optical properties of silicide single crystals and thin films | 1-gen-1993 | Nava, Filippo; K. N., Tu; O., Thomas; J. P., Senateur; R., Madar; A., Borghesi; G., Guizzetti; U., Gottlieb; O., Laborde; Bisi, Olmes | |
Electrical and structural characterization of Nb - Si thin film alloys | 1-gen-1986 | Nava, Filippo; P., Psaras; H., Takai; K. N., Tu; Valeri, Sergio; Bisi, Olmes | |
Electrical characterization of alloy thin films of VSi2 and V3Si | 1-gen-1986 | Nava, Filippo; Bisi, Olmes; P., Psaras; H., Takai; K. N., Tu | |
Electrical transport properties of V3Si, V5Si3 and VSi2 thin films | 1-gen-1986 | Nava, Filippo; Bisi, Olmes; K. N., Tu | |
Far Infrared Vibrational Spectroscopy in CrSi_2 | 1-gen-1990 | A., Borghesi; A., Piaggi; Franchini, Anna; G., Guizzetti; Nava, Filippo; Santoro, Giorgio | |
Far-infrared spectroscopy of thermally annealed tungsten silicide films | 1-gen-1991 | M., Amiotti; A., Borghesi; G., Guizzetti; Nava, Filippo; Santoro, Giorgio | |
Investigation on the charge collection properties of a 4H-SiC Schottky diode detector | 1-gen-2002 | Verzellesi, Giovanni; Vanni, Paolo; Nava, Filippo; Canali, Claudio | |
On the UV responsivity of neutron irradiated 4H-SiC | 1-gen-2008 | Anna, Cavallini; Antonio, Castaldini; Nava, Filippo | |
Optical and vibrational properties of Cr and Fe disilicides | 1-gen-1990 | A., Borghesi; A., Piaggi; A., Stella; G., Guizzetti; Nava, Filippo; Santoro, Giorgio | |
OPTICAL STUDY OF NIOBIUM DISILICIDE POLYCRYSTALLINE FILMS | 1-gen-1991 | Amiotti, M; Borghesi, A; Marabelli, F; Guizzetti, G; Nava, Filippo | |
Polymerization and Characterization of 4,4’-bis(alkylsulfanyl)-2,2’-bithiophenes | 1-gen-1999 | Iarossi, Dario; Mucci, Adele; Schenetti, Luisa; Seeber, Renato; F., Goldoni; Affronte, Marco; Nava, Filippo | |
Processing high-quality silicon for microstrip detectors | 1-gen-1992 | Nava, Filippo; Ottaviani, Giampiero; Tonini, Rita; Frabboni, Stefano; A., Alberigi Quaranta; P., Cantoni; P. L., Frabetti; L., Stagni; G., Queirolo; P. F., Manfredi | |
Radiation detection properties of 4H-SiC Schottky diodes irradiated up to 10(16) n/cm(2) by 1 MeV neutrons | 1-gen-2006 | Nava, Filippo; A., Castaldini; A., Cavallini; P., Errani; V., Cindro | |
Radiation tolerance of epitaxial silicon carbide detectors for electrons, protons and gamma-rays | 1-gen-2003 | Nava, Filippo; E., Vittone; P., Vanni; Verzellesi, Giovanni; Pg, Fuochi; C., Lanzieri; M., Glaser |