EnglishIn situ resistivity measurement was used to study the crystallization and the electrical conduction processes of V3Si and VSi2 thin films as a function of temperature. The films were deposited by dual-electron-beam coevaporation through metallic masks in a van der Pauw configuration onto oxidized silicon substrates. In the as-deposited state the alloy thin films were amorphous. For the electrical characterization of VSi2, silicon-rich specimens with a V:Si atomic ratio of 1:3 were used.The kinetics of crystallization are well described by an equation of the Johnson-Mehl-Avrami type.Measurements of the electrical resistivity varrho over a wide temperature range (2–1100 K) on samples preheated at a high temperature exhibit a similar behavior for both the vanadium silicides, i.e. varrho rises less rapidly with temperature T than the Bloch-Grüneisen theory predicts and seems to approach a saturation value at the higher temperatures. An empirical formula is used to obtain a best fit of the resistivity curves. Polycrystalline V3Si thin film became superconductive at 15 K with a residual resistivity ratio of 10.6.
| Data di pubblicazione: | 1986 |
| Titolo: | Electrical characterization of alloy thin films of VSi2 and V3Si |
| Autore/i: | F.NAVA; O. BISI; P.PSARAS; H.TAKAI; K.N.TU |
| Autore/i UNIMORE: | |
| Rivista: | |
| Volume: | 140 |
| Pagina iniziale: | 167 |
| Pagina finale: | 172 |
| Codice identificativo ISI: | WOS:A1986D381600019 |
| Codice identificativo Scopus: | 2-s2.0-0022079785 |
| Citazione: | Electrical characterization of alloy thin films of VSi2 and V3Si / F.NAVA; O. BISI; P.PSARAS; H.TAKAI; K.N.TU. - In: THIN SOLID FILMS. - ISSN 0040-6090. - STAMPA. - 140(1986), pp. 167-172. |
| Tipologia | Articolo su rivista |
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