CORNI, Federico

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 179 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autore(i)
1	X-ray reflectivity study of hydrogen implanted silicon	2006	P. DUBCEK; B. PIVAC; S. BERNSTORFF; F. CORNI; R. TONINI; G. OTTAVIANI
2	X-ray Absorption Spectroscopy in YBa2Cu3O7-x superconductors with variable oxygen con¬tent	1988	M. Sacchi; F. Corni; G.M. Antonini; C. Calandra; F.C. Matacotta; R. Frahm
3	Water tank experiment clears up some refraction misconceptions	2006	F. CORNI
4	Visible photoluminescence from He‐implanted silicon	1995	D. Bisero; F. Corni; C. Nobili; R. Tonini; G. Ottaviani; C. Mazzoleni; L. Pavesi
5	Visible luminescence from silicon by hydrogen implantation and annealing treatments	1994	PAVESI L; GIEBEL G; TONINI R; CORNI F; NOBILI C; OTTAVIANI G
6	Visible light emission from silicon implanted and annealed SiO2 layers	1997	Ghislotti G; Nielsen B; AsokaKumar P; Lynn KG; DiMauro LF; Bottani CE; Corni F; Tonini R; Ottaviani GP
7	Vibrational spectroscopy study of Ar+-ion irradiated Si-rich oxide films grown by plasma-enhanced chemical vapor deposition	2005	G. MARIOTTO; G. DAS; A. QUARANTA; G. DELLA MEA; F. CORNI; R. TONINI
8	Vacancy-gettering in silicon: Cavities and helium-implantation	1999	Corni F; Tonini R; Frabboni S; Nobili C; Calzolari G; Masetti S; Tamarozzi P; Pavia G; Cerofolini GF
9	Using evidence from nanocavities to assess the vibrational properties of external surfaces	2012	G.F. Cerofolini; F. Corni; S. Frabboni; G. Ottaviani; E. Romano; R. Tonini; D. Narducci
10	Un’introduzione alla Rutherford Backscattering Spectrometry	1996	F. CORNI
11	Understand Time Resolved Reflectivity by simple experiments	1993	F. CORNI; MAZZEGA E; MICHELINI M; OTTAVIANI G
12	Ultradense gas bubbles in Hydrogen- or Helium-implanted (or co-implanted) Silicon	2000	CEROFOLINI G.F.; CALZOLARI G.; F. CORNI; NOBILI C.; OTTAVIANI G.; TONINI R.
13	Transmission electron microscopy study of helium implanted silicon	2018	Frabboni, Stefano; Corni, Federico; Tonini, Rita; Nobili, Carlo Emanuele; Ottaviani, Giampiero
14	Transmission Electron Microscopy study of Helium Implanted Silicon	2004	Frabboni, S.; Corni, F.; Tonini, R.; Nobili, C.; Ottaviani, G.
15	Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon	2004	S. Frabboni; GC Gazzadi; L. Felisari; R. Tonini; F. Corni; G. Ottaviani
16	A Tool for the Spectroscopic Investigation of Hydrogen-Silicon Interaction	2010	Romano, E.; Cerofolini, G. F.; Narducci, D.; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita
17	Thinking on vectors and formal description of the light polarization for a new educational approach	2002	COBAL M; MICHELINI M; F. CORNI
18	Thermal desorption spectra from cavities in helium-implanted silicon	2000	Cerofolini GF; Calzolari G; Corni F; Frabboni S; Nobili C; Ottaviani G; Tonini R
19	The Story Format and the Cycle of Meaning Construction for Physics Education in Primary Schools	2014	Cristina Mariani; Federico Corni
20	The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films	1998	Corni F; Frabboni S; Tonini R; Leone D; de Boer W; Gasparotto A

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CORNI, Federico