Sfoglia per Autore
Effects of static disorder on LACBED patterns of single crystal silicon implanted with hydrogen
1997 Frabboni, Stefano; Gambetta, F; Tonini, Rita; Balboni, R; Armigliato, A.
Evolution of defect profiles in He-implanted silicon studied by slow positrons
1997 Brusa, Rs; Karwasz, Gp; Tiengo, N; Zecca, A; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita
Visible light emission from silicon implanted and annealed SiO2 layers
1997 Ghislotti, G; Nielsen, B; Asokakumar, P; Lynn, Kg; Dimauro, Lf; Bottani, Ce; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
Photoluminescence characterization of SiGe QW grown by MBE
1997 De Padova, P; Perfetti, P; Felici, R; Priori, S; Quaresima, C; Pizzoferrato, R; Casalboni, M; Prosposito, P; Corni, Federico; Tonini, Rita; Grilli, A; Raco, A.
Helium in silicon: Thermal-desorption investigation of bubble precursors
1997 Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita; Calzolari, G; Cerofolini, Gf; Queirolo, G.
High-dose helium-implanted single-crystal silicon: Annealing behavior
1998 Tonini, Rita; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Cerofolini, G. F.
Electron paramagnetic resonance evidence for reversible transformation of thermal donor into shallow donor-type center in hydrogen-implanted silicon
1998 Rakvin, B; Pivac, B; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films
1998 Corni, Federico; Frabboni, Stefano; Tonini, Rita; Leone, D; de Boer, W; Gasparotto, A.
Growth kinetics of a displacement field in hydrogen implanted single crystalline silicon
1998 D., Bisero; Corni, Federico; Frabboni, Stefano; Tonini, Rita; Ottaviani, Giampiero; R., Balboni
Helium-implanted silicon: A study of bubble precursors
1999 Corni, Federico; Calzolari, G; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita; Cerofolini, Gf; Leone, D; Servidori, M; Brusa, Rs; Karwasz, Gp; Tiengo, N; Zecca, A.
Pre-cavities defect distribution in He implanted silicon studied by slow positron beam
1999 Brusa, Rs; Karwasz, Gp; Zecca, A; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
Vacancy-gettering in silicon: Cavities and helium-implantation
1999 Corni, Federico; Tonini, Rita; Frabboni, Stefano; Nobili, Carlo Emanuele; Calzolari, G; Masetti, S; Tamarozzi, P; Pavia, G; Cerofolini, Gf
Hydrogen and helium bubbles in silicon
2000 G. F., Cerofolini; Corni, Federico; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita
GISAXS study of defects in He implanted silicon
2000 P., Dubcek; O., Milat; B., Pivac; S., Bernstorff; H., Amenitsch; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
Ultradense gas bubbles in Hydrogen- or Helium-implanted (or co-implanted) Silicon
2000 Cerofolini, G. F.; Calzolari, G.; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita
Evolution of vacancy-like defects in He-implanted (100) Si studied by thermal desorption spectrometry
2000 Corni, Federico; G., Calzolari; Gambetta, Francesca; Nobili, Carlo Emanuele; Tonini, Rita; Zapparoli, Mauro
Electron paramagnetic resonance study of S2 defects in Hydrogen implanted Silicon
2000 B., Rakvin; B., Pivac; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
Thermal desorption spectra from cavities in helium-implanted silicon
2000 Cerofolini, Gf; Calzolari, G; Corni, Federico; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita
Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy
2000 R. S., Brusa; G. P., Karwasz; N., Tiengo; A., Zecca; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon
2000 Gambetta, Francesca; Frabboni, Stefano; Tonini, Rita; Corni, Federico
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Effects of static disorder on LACBED patterns of single crystal silicon implanted with hydrogen | 1-gen-1997 | Frabboni, Stefano; Gambetta, F; Tonini, Rita; Balboni, R; Armigliato, A. | |
Evolution of defect profiles in He-implanted silicon studied by slow positrons | 1-gen-1997 | Brusa, Rs; Karwasz, Gp; Tiengo, N; Zecca, A; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita | |
Visible light emission from silicon implanted and annealed SiO2 layers | 1-gen-1997 | Ghislotti, G; Nielsen, B; Asokakumar, P; Lynn, Kg; Dimauro, Lf; Bottani, Ce; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
Photoluminescence characterization of SiGe QW grown by MBE | 1-gen-1997 | De Padova, P; Perfetti, P; Felici, R; Priori, S; Quaresima, C; Pizzoferrato, R; Casalboni, M; Prosposito, P; Corni, Federico; Tonini, Rita; Grilli, A; Raco, A. | |
Helium in silicon: Thermal-desorption investigation of bubble precursors | 1-gen-1997 | Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita; Calzolari, G; Cerofolini, Gf; Queirolo, G. | |
High-dose helium-implanted single-crystal silicon: Annealing behavior | 1-gen-1998 | Tonini, Rita; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Cerofolini, G. F. | |
Electron paramagnetic resonance evidence for reversible transformation of thermal donor into shallow donor-type center in hydrogen-implanted silicon | 1-gen-1998 | Rakvin, B; Pivac, B; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
The effect of biaxial stress on the solid phase epitaxial crystallization of GexSi((1-x)) films | 1-gen-1998 | Corni, Federico; Frabboni, Stefano; Tonini, Rita; Leone, D; de Boer, W; Gasparotto, A. | |
Growth kinetics of a displacement field in hydrogen implanted single crystalline silicon | 1-gen-1998 | D., Bisero; Corni, Federico; Frabboni, Stefano; Tonini, Rita; Ottaviani, Giampiero; R., Balboni | |
Helium-implanted silicon: A study of bubble precursors | 1-gen-1999 | Corni, Federico; Calzolari, G; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita; Cerofolini, Gf; Leone, D; Servidori, M; Brusa, Rs; Karwasz, Gp; Tiengo, N; Zecca, A. | |
Pre-cavities defect distribution in He implanted silicon studied by slow positron beam | 1-gen-1999 | Brusa, Rs; Karwasz, Gp; Zecca, A; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
Vacancy-gettering in silicon: Cavities and helium-implantation | 1-gen-1999 | Corni, Federico; Tonini, Rita; Frabboni, Stefano; Nobili, Carlo Emanuele; Calzolari, G; Masetti, S; Tamarozzi, P; Pavia, G; Cerofolini, Gf | |
Hydrogen and helium bubbles in silicon | 1-gen-2000 | G. F., Cerofolini; Corni, Federico; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita | |
GISAXS study of defects in He implanted silicon | 1-gen-2000 | P., Dubcek; O., Milat; B., Pivac; S., Bernstorff; H., Amenitsch; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
Ultradense gas bubbles in Hydrogen- or Helium-implanted (or co-implanted) Silicon | 1-gen-2000 | Cerofolini, G. F.; Calzolari, G.; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita | |
Evolution of vacancy-like defects in He-implanted (100) Si studied by thermal desorption spectrometry | 1-gen-2000 | Corni, Federico; G., Calzolari; Gambetta, Francesca; Nobili, Carlo Emanuele; Tonini, Rita; Zapparoli, Mauro | |
Electron paramagnetic resonance study of S2 defects in Hydrogen implanted Silicon | 1-gen-2000 | B., Rakvin; B., Pivac; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
Thermal desorption spectra from cavities in helium-implanted silicon | 1-gen-2000 | Cerofolini, Gf; Calzolari, G; Corni, Federico; Frabboni, Stefano; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Tonini, Rita | |
Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy | 1-gen-2000 | R. S., Brusa; G. P., Karwasz; N., Tiengo; A., Zecca; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon | 1-gen-2000 | Gambetta, Francesca; Frabboni, Stefano; Tonini, Rita; Corni, Federico |
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