Sfoglia per Autore
Evolution of vacancy-like defects in He-implanted (100) Si studied by thermal desorption spectrometry
2000 Corni, Federico; G., Calzolari; Gambetta, Francesca; Nobili, Carlo Emanuele; Tonini, Rita; Zapparoli, Mauro
Helium/deuterium co-implanted silicon – a thermal desorption spectrometry investigation
2001 Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita; Ottaviani, Giampiero; Tonelli, Massimo
DLTS and EPR study of defects in H implanted silicon
2002 V., Miksic; B., Pivac; B., Rakvin; H., Zorc; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
In-situ time-resolved reflectivity: a technique useful to investigate solid-state transformations
2002 Corni, Federico; Tonini, Rita; Pontiroli, A; Pavia, G; Queirolo, G; Zonca, R.
Some aspects of blistering and exfoliation of helium-hydrogen coimplanted (100) silicon
2002 Corni, Federico; Tonini, Rita
Damage evolution in helium-hydrogen co-implanted (100) silicon
2002 Tonini, Rita; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Cazzaniga, F; Queirolo, G.
Reply to comments on 'EPR study of He-implanted Si' by P. Pivac, B. Rakvin, R. Tonini, F. Corni, G. Ottaizani, Published in Mater. Sci. Eng. B73 (2000) 60-63 - Written by M. Kakazey, M. Vlasova, and J.G. Gonzalez-Rodriguez - Reply to discussion
2002 Pivac, B; Rakvin, B; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
GISAXS study of structural relaxation in amorphous silicon
2003 Dubcek, P; Pivac, B; Bernstorff, S; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
Grazing incidence small-angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon
2003 P., Dubcek; B., Pivac; S., Bernstorff; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
Early stages of bubble formation in helium-implated (100) silicon
2003 B., Pivac; O., Milat; P., Dubcek; S., Bernstorff; Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita
Copper–titanium thin film interaction
2004 L., Castoldi; G., Visalli; S., Morin; P., Ferrari; S., Alberici; Ottaviani, Giampiero; Corni, Federico; Tonini, Rita; Nobili, Carlo Emanuele; M., Bersani
GISAXS Study of Hydrogen Implanted Silicon
2004 B., Pivac; P., Dub; Ek, ; S., Bernstorff; Corni, Federico; Tonini, Rita
Transmission Electron Microscopy study of Helium Implanted Silicon
2004 Frabboni, S.; Corni, F.; Tonini, R.; Nobili, C.; Ottaviani, G.
Phase formations in Co-Silicon system
2004 Corni, Federico; Tonini, Rita; Ottaviani, Giampiero; S., Alberici; D., Erbetta; T., Marangon
Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon
2004 Frabboni, Stefano; Gc, Gazzadi; L., Felisari; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero
Nanovoid formationin helium-implanted single-crystal silicon studied by in situ techniques
2004 Frabboni, Stefano; Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita; Ottaviani, Giampiero
Vibrational spectroscopy study of Ar+-ion irradiated Si-rich oxide films grown by plasma-enhanced chemical vapor deposition
2005 G., Mariotto; G., Das; A., Quaranta; G., DELLA MEA; Corni, Federico; Tonini, Rita
X-ray reflectivity study of hydrogen implanted silicon
2006 P., Dubcek; B., Pivac; S., Bernstorff; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero
Structural properties of reactively sputtered W-Si-N thin films
2007 Vomiero, A; Marchi, Eb; Quaranta, A; DELLA MEA, G; Brusa, Rs; Mariotto, G; Felisari, L; Frabboni, Stefano; Tonini, Rita; Ottaviani, G; Mattei, G; Scandurra, A; Puglisi, O.
Hydrogen injection and retention in nanocavities of single-crystalline silicon
2009 G. F., Cerofolini; E., Romano; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Evolution of vacancy-like defects in He-implanted (100) Si studied by thermal desorption spectrometry | 1-gen-2000 | Corni, Federico; G., Calzolari; Gambetta, Francesca; Nobili, Carlo Emanuele; Tonini, Rita; Zapparoli, Mauro | |
Helium/deuterium co-implanted silicon – a thermal desorption spectrometry investigation | 1-gen-2001 | Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita; Ottaviani, Giampiero; Tonelli, Massimo | |
DLTS and EPR study of defects in H implanted silicon | 1-gen-2002 | V., Miksic; B., Pivac; B., Rakvin; H., Zorc; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
In-situ time-resolved reflectivity: a technique useful to investigate solid-state transformations | 1-gen-2002 | Corni, Federico; Tonini, Rita; Pontiroli, A; Pavia, G; Queirolo, G; Zonca, R. | |
Some aspects of blistering and exfoliation of helium-hydrogen coimplanted (100) silicon | 1-gen-2002 | Corni, Federico; Tonini, Rita | |
Damage evolution in helium-hydrogen co-implanted (100) silicon | 1-gen-2002 | Tonini, Rita; Corni, Federico; Nobili, Carlo Emanuele; Ottaviani, Giampiero; Cazzaniga, F; Queirolo, G. | |
Reply to comments on 'EPR study of He-implanted Si' by P. Pivac, B. Rakvin, R. Tonini, F. Corni, G. Ottaizani, Published in Mater. Sci. Eng. B73 (2000) 60-63 - Written by M. Kakazey, M. Vlasova, and J.G. Gonzalez-Rodriguez - Reply to discussion | 1-gen-2002 | Pivac, B; Rakvin, B; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
GISAXS study of structural relaxation in amorphous silicon | 1-gen-2003 | Dubcek, P; Pivac, B; Bernstorff, S; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
Grazing incidence small-angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon | 1-gen-2003 | P., Dubcek; B., Pivac; S., Bernstorff; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
Early stages of bubble formation in helium-implated (100) silicon | 1-gen-2003 | B., Pivac; O., Milat; P., Dubcek; S., Bernstorff; Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita | |
Copper–titanium thin film interaction | 1-gen-2004 | L., Castoldi; G., Visalli; S., Morin; P., Ferrari; S., Alberici; Ottaviani, Giampiero; Corni, Federico; Tonini, Rita; Nobili, Carlo Emanuele; M., Bersani | |
GISAXS Study of Hydrogen Implanted Silicon | 1-gen-2004 | B., Pivac; P., Dub; Ek, ; S., Bernstorff; Corni, Federico; Tonini, Rita | |
Transmission Electron Microscopy study of Helium Implanted Silicon | 1-gen-2004 | Frabboni, S.; Corni, F.; Tonini, R.; Nobili, C.; Ottaviani, G. | |
Phase formations in Co-Silicon system | 1-gen-2004 | Corni, Federico; Tonini, Rita; Ottaviani, Giampiero; S., Alberici; D., Erbetta; T., Marangon | |
Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon | 1-gen-2004 | Frabboni, Stefano; Gc, Gazzadi; L., Felisari; Tonini, Rita; Corni, Federico; Ottaviani, Giampiero | |
Nanovoid formationin helium-implanted single-crystal silicon studied by in situ techniques | 1-gen-2004 | Frabboni, Stefano; Corni, Federico; Nobili, Carlo Emanuele; Tonini, Rita; Ottaviani, Giampiero | |
Vibrational spectroscopy study of Ar+-ion irradiated Si-rich oxide films grown by plasma-enhanced chemical vapor deposition | 1-gen-2005 | G., Mariotto; G., Das; A., Quaranta; G., DELLA MEA; Corni, Federico; Tonini, Rita | |
X-ray reflectivity study of hydrogen implanted silicon | 1-gen-2006 | P., Dubcek; B., Pivac; S., Bernstorff; Corni, Federico; Tonini, Rita; Ottaviani, Giampiero | |
Structural properties of reactively sputtered W-Si-N thin films | 1-gen-2007 | Vomiero, A; Marchi, Eb; Quaranta, A; DELLA MEA, G; Brusa, Rs; Mariotto, G; Felisari, L; Frabboni, Stefano; Tonini, Rita; Ottaviani, G; Mattei, G; Scandurra, A; Puglisi, O. | |
Hydrogen injection and retention in nanocavities of single-crystalline silicon | 1-gen-2009 | G. F., Cerofolini; E., Romano; D., Narducci; Corni, Federico; Frabboni, Stefano; Ottaviani, Giampiero; Tonini, Rita |
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