In this paper we analyze Random Telegraph Signal (RTS) noise in hafnium-based RRAMs. RTS is measured in HRS, showing fast and slow multilevel switching events. RTS characteristics are examined through novel color-coded time-lag plots and Hidden Markov Model (HMM) time-series analyses. Noise is examined at different reset conditions to provide new insights on conduction mechanisms in HRS. Higher reset voltages result in an enhanced complexity in RTS due to a larger number of active traps
Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States / Puglisi, Francesco Maria; Pavan, Paolo; Padovani, Andrea; Larcher, Luca; G., Bersuker. - STAMPA. - (2012), pp. 274-277. (Intervento presentato al convegno 42nd European Solid-State Device Research Conference, ESSDERC 2012 tenutosi a Bordeaux, fra nel Sept. 17-21) [10.1109/ESSDERC.2012.6343386].
Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States
PUGLISI, Francesco Maria;PAVAN, Paolo;PADOVANI, ANDREA;LARCHER, Luca;
2012
Abstract
In this paper we analyze Random Telegraph Signal (RTS) noise in hafnium-based RRAMs. RTS is measured in HRS, showing fast and slow multilevel switching events. RTS characteristics are examined through novel color-coded time-lag plots and Hidden Markov Model (HMM) time-series analyses. Noise is examined at different reset conditions to provide new insights on conduction mechanisms in HRS. Higher reset voltages result in an enhanced complexity in RTS due to a larger number of active traps
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