Relazione in Atti di Convegno: [14994] Home page tipologia

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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 3.621 a 3.640 di 14.994
Titolo Data di pubblicazione Autore(i) File
Assessing the Role of Boundary-level Objectives in Indoor Semantic Segmentation 1-gen-2021 Amoroso, Roberto; Baraldi, Lorenzo; Cucchiara, Rita
Out of the Box: Embodied Navigation in the Real World 1-gen-2021 Bigazzi, Roberto; Landi, Federico; Cornia, Marcella; Cascianelli, Silvia; Baraldi, Lorenzo; Cucchiara, Rita
Learning to Read L'Infinito: Handwritten Text Recognition with Synthetic Training Data 1-gen-2021 Cascianelli, Silvia; Cornia, Marcella; Baraldi, Lorenzo; Piazzi, Maria Ludovica; Schiuma, Rosiana; Cucchiara, Rita
Modelling, prototype construction and testing of helical shape memory springs with hollow cross-section 1-gen-2009 Spinelia, I.; Dragoni, E.; Stortiero, F.
Modelling and validation of a rotary motor combining shape memory wires and overrunning clutches 1-gen-2014 Mammano, Giovanni; Dragoni, E.
Variability sources and reliability of 3D-FeFETs 1-gen-2021 Pesic, M.; Beltrando, B.; Padovani, A.; Gangopadhyay, S.; Kaliappan, M.; Haverty, M.; Villena, M. A.; Piccinini, E.; Bertocchi, M.; Chiang, T.; Larcher, L.; Strand, J.; Shluger, A. L.
Controlling uniformity of RRAM characteristics through the forming process 1-gen-2012 Kalantarian, A.; Bersuker, G.; Gilmer, D. C.; Veksler, D.; Butcher, B.; Padovani, A.; Pirrotta, O.; Larcher, L.; Geer, R.; Nishi, Y.; Kirsch, P.
Application and benefits of target programming algorithms for ferroelectric HfO2transistors 1-gen-2020 Zhou, H.; Ocker, J.; Padovani, A.; Pesic, M.; Trentzsch, M.; Dunkel, S.; Mulaosmanovic, H.; Slesazeck, S.; Larcher, L.; Beyer, S.; Muller, S.; Mikolajick, T.
A new model for tunneling conduction in ultra-thin dielectrics 1-gen-1998 Larcher, L.; Paccagnella, A.; Scarpa, A.; Ghidini, G.
Current status of EUV lithography development in Japan 1-gen-2010 Larcher, L.
CMOS and interconnect reliability-non-volatile memory reliability 1-gen-2006 Visconti, A.; Larcher, L.
Hot Electrons as the Dominant Source of Degradation for Sub-5nm HZO FeFETs 1-gen-2020 Tan, A. J.; Pesic, M.; Larcher, L.; Liao, Y. -H.; Wang, L. -C.; Bae, J. -H.; Hu, C.; Salahuddin, S.
Investigation of the role of H-related defects in Al2O3 blocking layer on charge-trap memory retention by atomistic simulations and device physical modelling 1-gen-2010 Molas, G.; Masoero, L.; Blaise, P.; Padovani, A.; Colonna, J. P.; Vianello, E.; Bocquet, M.; Nowak, E.; Gasulla, M.; Cueto, O.; Grampeix, H.; Martin, F.; Kies, R.; Brianceau, P.; Gely, M.; Papon, A. M.; Lafond, D.; Barnes, J. P.; Licitra, C.; Ghibaudo, G.; Larcher, L.; Deleonibus, S.; De Salvo, B.
Multiscale modeling of CeO2/La2 O3 stacks for material/defect characterization 1-gen-2020 Dianat, B.; Padovani, A.; Larcher, L.
An Inertial/RFID based localization method for autonomous lawnmowers 1-gen-2012 Levratti, A.; Bonaiuti, M.; Secchi, C.; Fantuzzi, C.
A nonlinear proportional controller for motion control application 1-gen-2010 Fantuzzi, C.; Canini, G.
On the suitability of object-oriented models for industrial logic controllers 1-gen-2004 Bonte, M.; Fantuzzi, C.
Fuzzy system identification and fault diagnosis of industrial processes 1-gen-2001 Simani, S.; Fantuzzi, C.; Beghelli, S.
Coordination of multiple robots with assigned paths 1-gen-2010 Olmi, R.; Secchi, C.; Fantuzzi, C.
Parameter identification of piecewise affine dynamic models from input-output data 1-gen-2003 Simani, S.; Beghelli, S.; Fantuzzi, C.; Rovatti, R.
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 3.621 a 3.640 di 14.994
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Scopri
Tipologia
  • Atti di CONVEGNO14993
  • Contributo su VOLUME1
Autore
  • CUCCHIARA, Rita455
  • ZAMBONELLI, Franco281
  • SELMI, LUCA228
  • FANTUZZI, Cesare217
  • GUNDUZ, Deniz215
  • FERRARI, Fabrizio212
  • BERGAMASCHI, Sonia203
  • SECCHI, Cristian195
  • LARCHER, Luca186
  • PALESTRI, Pierpaolo176
Data di pubblicazione
  • 2020 - 20262833
  • 2010 - 20195586
  • 2000 - 20094697
  • 1990 - 19991488
  • 1980 - 1989359
  • 1970 - 197930
  • 1967 - 19691
Editore
  • Institute of Electrical and Elect...1329
  • IEEE1012
  • IEEE Computer Society376
  • Springer Science and Business Med...251
  • Springer241
  • -235
  • Springer Verlag205
  • SAE International192
  • CEUR-WS124
  • SPRINGER-VERLAG BERLIN100
Rivista
  • SAE TECHNICAL PAPER202
  • JOURNAL OF PHYSICS. CONFERENCE SE...97
  • ...SUMMER SCHOOL FRANCESCO TURCO....63
  • POS PROCEEDINGS OF SCIENCE41
  • ACTA HORTICULTURAE35
  • ENERGY PROCEDIA29
Serie
  • LECTURE NOTES IN COMPUTER SCIENCE403
  • CEUR WORKSHOP PROCEEDINGS163
  • PROCEEDINGS OF SPIE, THE INTERNAT...160
  • LECTURE NOTES IN ARTIFICIAL INTEL...85
  • LECTURE NOTES IN MECHANICAL ENGIN...80
  • COMMUNICATIONS IN COMPUTER AND IN...72
  • IFAC-PAPERSONLINE69
  • PROCEEDINGS OF THE ANNUAL CONFERE...67
  • IFAC PROCEEDINGS VOLUMES65
  • TECHNICAL DIGEST - INTERNATIONAL ...64
Keyword
  • Electrical and Electronic Enginee...166
  • -160
  • Control and Systems Engineering104
  • Software86
  • Industrial and Manufacturing Engi...85
  • Computer Networks and Communications72
  • Computer Science (all)72
  • Computer Science Applications1707...72
  • CFD67
  • Artificial Intelligence63
Lingua
  • eng11795
  • ita2913
  • fre119
  • ger62
  • spa58
  • por15
  • rus12
  • und8
  • cat5
  • chi2
Accesso al fulltext
  • no fulltext10056
  • reserved2946
  • open1871
  • partially open113
  • embargoed8