BERTOCCHI, MATTEO

BERTOCCHI, MATTEO  

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Titolo Data di pubblicazione Autore(i) File
A microscopic physical description of RTN current fluctuations in HfOx RRAM 1-gen-2015 Puglisi, Francesco Maria; Pavan, Paolo; Vandelli, Luca; Padovani, Andrea; Bertocchi, Matteo; Larcher, Luca
Cross-correlation of electrical measurements via physics-based device simulations: Linking electrical and structural characteristics 1-gen-2015 Padovani, A.; Larcher, L.; Vandelli, L.; Bertocchi, M.; Cavicchioli, R.; Veksler, D.; Bersuker, G.
Defects and strain enhancements of second-harmonic generation in Si/Ge superlattices 1-gen-2014 Bertocchi, Matteo; E., Luppi; Degoli, Elena; V., Véniard; Ossicini, Stefano
Large crystal local-field effects in second-harmonic generation of a Si/CaF2 interface:An ab initio study 1-gen-2012 Bertocchi, Matteo; E., Luppi; Degoli, Elena; V., Véniard; Ossicini, Stefano
Second Harmonic Generation in Silicon Based Heterostructures: The Role of Strain and Symmetry 1-gen-2017 Bertocchi, Matteo; Degoli, Elena; Véniard, V; Luppi, E; Ossicini, Stefano
Second-harmonic Generation Spectroscopy from Time-dependent Density-functional Theory 1-gen-2011 E., Luppi; H., Huebener; Bertocchi, Matteo; Degoli, Elena; Ossicini, Stefano; V., Veniard
Strain-designed strategy to induce and enhance second-harmonic generation in centrosymmetric and noncentrosymmetric materials 1-gen-2015 Luppi, Eleonora; Degoli, Elena; Bertocchi, Matteo; Ossicini, Stefano; Véniard, Valérie
Work function bowing in Si1−xGex heterostructures: Ab initio results 1-gen-2016 Amato, Michele; Bertocchi, Matteo; Ossicini, Stefano
Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy 1-gen-2015 Pouch, Sylvain; Amato, Michele; Bertocchi, Matteo; Ossicini, Stefano; Chevalier, Nicolas; Melin, Thierry; Hartmann, Jean Michel; Renault, Olivier; Delaye, Vincent; Mariolle, Denis; Borowik, Lukasz