EnglishNANNARONE, Stefano
Risultati 1 - 20 di 173 (tempo di esecuzione: 0.002 secondi).
| Titolo | Data di pubblicazione | Autore(i) | |
|---|---|---|---|
| 1 | Yb interface growth on GaP(110): an electron spectroscopy investigation | 1990 | L. Duó; M. Sancrotti; M. Newell; P. Weightman; D. Norman; R. Cosso; S. D'Addato; A. Ruocco; S. Nannarone |
| 2 | X-ray magneto-optics and surface science (X-MOSS) beamline at ELETTRA | 1998 | Nannarone, Stefano; Gazzadi, Gc; Pasquali, Luca; Sacchi, M; Pelizzo, Mg; Tondello, G. |
| 3 | X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides | 1985 | M. De Crescenzi; E. Colavita; U. Del Pennino; P. Sassaroli; S. Valeri; C. Rinaldi; L. Sorba; S. Nannarone |
| 4 | VALENCE-BAND STATES OF H-GAAS(110) | 1994 | Plesanovas, A; Tarabini, Ac; Abbati, I; Kaciulis, S; Paolicelli, G; Pasquali, Luca; Ruocco, A; Nannarone, Stefano |
| 5 | UPS, XPS, and NEXAFS Study of Self-Assembly of Standing 1,4 Benzenedimethanethiol SAMs on Gold | 2011 | Pasquali, Luca; Terzi, Fabio; Seeber, Renato; Nannarone, Stefano; D., Datta; C., Dablemont; H., Hamoudi; M., Canepa; V. A., Esaulov |
| 6 | UNOCCUPIED 3D-DERIVED STATES IN NI SILICIDES VIA NI L2,3 X-RAY ABSORPTION-SPECTROSCOPY | 1991 | M. SANCROTTI; L. DUO; R. COSSO; S. D'ADDATO; S. IACOBUCCI; G. PANACCIONE; A. RUOCCO; S. NANNARONE; M. SURMAN; P. UNSWORTH;P. WEIGHTMAN |
| 7 | The UHV Experimental Chamber For Optical Measurements (Reflectivity and Absorption) and Angle Resolved Photoemission of the BEAR Beamline at ELETTRA | 2004 | Pasquali, Luca; A., De Luisa; Nannarone, Stefano |
| 8 | Triode electron bombardement evaporation source for UHV thin film depositino | 2000 | R., Verucchi; Nannarone, Stefano |
| 9 | Transmittance and optical constants of Tm films in the 2.75–1600 eV spectral range | 2009 | Manuela Vidal-Dasilva;Mónica Fernández-Perea;José A. Aznárez;Juan I. Larruquert;José A. Méndez;Luca Poletto;A. Marco Malvezzi;Angelo Giglia;Stefano Nannarone |
| 10 | Transmittance and optical constants of Lu films in the 3–1800 eV spectral range | 2010 | Sergio García-Cortés;Luis Rodríguez-de Marcos;Juan I. Larruquert;José A. Aznárez;José A. Méndez;Luca Poletto;Fabio Frassetto;A. Marco Malvezzi;Angelo Giglia;Nicola Mahne;Stefano Nannarone |
| 11 | Transmittance and optical constants of evaporated Pr, Eu, and Tm films in the 4-1600 eV spectral rangeProceedings of SPIE | 2008 | M., Fernandez Perea; M., Vidal Dasilva; J. A., Aznarez; J. I., Larruquert; J. A., Mendez; L., Poletto; D., Garoli; A. M., Malvezzi; A., Giglia; Nannarone, Stefano |
| 12 | Transmittance and optical constants of Eu films from 8.3 to 1400 eV | 2008 | Mónica Fernández-Perea;Manuela Vidal-Dasilva;José A. Aznárez;Juan I. Larruquert;José A. Méndez;Luca Poletto;Denis Garoli;A. Marco Malvezzi;Angelo Giglia;Stefano Nannarone |
| 13 | Transmittance and optical constants of erbium films in the 325−1580 eV spectral range | 2011 | Juan I. Larruquert;Fabio Frassetto;Sergio García-Cortés;Manuela Vidal-Dasilva;Mónica Fernández-Perea;José A. Aznárez;José A. Méndez;Luca Poletto;A. Marco Malvezzi;Angelo Giglia;Stefano Nannarone |
| 14 | Transmittance and optical constants of Ce films in the 6–1200 eV spectral range | 2008 | Mónica Fernández-Perea;José A. Aznárez;Juan I. Larruquert;José A. Méndez;Luca Poletto;Denis Garoli;A. Marco Malvezzi;Angelo Giglia;Stefano Nannarone |
| 15 | Transmittance and extinction coefficient of Ce films measured in situ in the extreme ultraviolet and soft x-raysProceedings of SPIE | 2006 | Monica Fernandez, Perea; Jose A., Aznarez; Juan I., Larruquert; Jose A., Mendez; Luca, Poletto; Denis, Garoli; A., Marco Malvezzi; Angelo, Giglia; Nannarone, Stefano |
| 16 | Thermal properties, optical and interface characterization of Mg/Co multilayers for the EUV range | 2010 | M. H., Hu; K., Le Guen; J. M., Andre; P., Jonnard; S. K., Zhou; H. C. h., Li; J. T., Zhu; Z. S., Wang; N., Mahne; A., Giglia; Nannarone, Stefano |
| 17 | Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers | 2008 | H. Maury;P. Jonnard;K. Guen;J. -M. André;Z. Wang;J. Zhu;J. Dong;Z. Zhang;F. Bridou;F. Delmotte;C. Hecquet;N. Mahne;A. Giglia;S. Nannarone |
| 18 | The influence of surface roughness in X-ray resonant magnetic reflectivity experiments | 2012 | A. Verna;B. A. Davidson;A. Mirone;S. Nannarone |
| 19 | The beam position monitor of the BEAR beamline | 2005 | Giglia A; Mahne N; Pedio M; Nannarone S; Pelizzo MG; Naletto G; Zambolin P |
| 20 | SYNCHROTRON-RADIATION INVESTIGATION OF THE CHEMICAL-DEPENDENCE OF THE VACANCY-SATELLITE STRUCTURE OF THE NIL3VV SPECTRA IN NI SILICIDES | 1992 | G. CURRO; R. COSSO; M. SANCROTTI; L. DUO;S. D'ADDATO; S. NANNARONE; S. IACOBUCCI; G. PANACCIONE; P. WEIGHTMAN |
Nome completo:
NANNARONE, Stefano
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