In this paper a bulk twin-tub and an epitaxial CMOS technology are studied from the viewpoint of latch-up hardness reduction due to interaction between adjacent structures, by means of static triggering measurements performed on "ad hoc" test patterns. The experimental results indicate that such interactions can seriously increase the latch-up susceptibility of the devices under test in the case of the bulk twin-tub process, while the epitaxial one shows in general better stability of the latch-up behavior.

Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies / Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.. - STAMPA. - (1991), pp. 333-338. (Intervento presentato al convegno ESREF'91 tenutosi a Bordeaux (F) nel Oct. 7-10, 1991).

Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies

PAVAN, Paolo;L. Selmi
1991

Abstract

In this paper a bulk twin-tub and an epitaxial CMOS technology are studied from the viewpoint of latch-up hardness reduction due to interaction between adjacent structures, by means of static triggering measurements performed on "ad hoc" test patterns. The experimental results indicate that such interactions can seriously increase the latch-up susceptibility of the devices under test in the case of the bulk twin-tub process, while the epitaxial one shows in general better stability of the latch-up behavior.
1991
ESREF'91
Bordeaux (F)
Oct. 7-10, 1991
333
338
Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.
Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies / Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.. - STAMPA. - (1991), pp. 333-338. (Intervento presentato al convegno ESREF'91 tenutosi a Bordeaux (F) nel Oct. 7-10, 1991).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/737756
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