In this paper we report results on PCM endurance failure characterization. We show that endurance failure is related to SET pulse features and we analyze and model SET operation to obtain a better understanding and improve endurance performance. Results give interesting insights on the crystallization process of GST material. SET obeys to a constant energy law. Fast SET pulses require high power; slow SET pulses can be implemented in low power applications. Results may be used for optimized SET/RESET operation to achieve better endurance.

SET switching effects on PCM endurance / V., Della Marca; F., Carboni; Larcher, Luca; Padovani, Andrea; Pavan, Paolo. - STAMPA. - (2010), pp. 321-324. ((Intervento presentato al convegno ESSDERC tenutosi a Seville (Spain) nel 14-16 Sept. 2010 [10.1109/ESSDERC.2010.5618227].

SET switching effects on PCM endurance

LARCHER, Luca;PADOVANI, ANDREA;PAVAN, Paolo
2010-01-01

Abstract

In this paper we report results on PCM endurance failure characterization. We show that endurance failure is related to SET pulse features and we analyze and model SET operation to obtain a better understanding and improve endurance performance. Results give interesting insights on the crystallization process of GST material. SET obeys to a constant energy law. Fast SET pulses require high power; slow SET pulses can be implemented in low power applications. Results may be used for optimized SET/RESET operation to achieve better endurance.
ESSDERC
Seville (Spain)
14-16 Sept. 2010
321
324
V., Della Marca; F., Carboni; Larcher, Luca; Padovani, Andrea; Pavan, Paolo
SET switching effects on PCM endurance / V., Della Marca; F., Carboni; Larcher, Luca; Padovani, Andrea; Pavan, Paolo. - STAMPA. - (2010), pp. 321-324. ((Intervento presentato al convegno ESSDERC tenutosi a Seville (Spain) nel 14-16 Sept. 2010 [10.1109/ESSDERC.2010.5618227].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/646630
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