Piezoresistive properties of thick-film resistors obtained with ink series supplied by different manufacturers were investigated as a function of composition, structure, sheet resistivity, and applied strain between 0 and ±1000 m strain. The strain sensitivity of thick-film resistors appears to be a strong function of the nature of the conductive grains and of the sheet resistivity of the paste; the results obtained suggest a dominant role of the tunneling effect in the conduction mechanism and in the strain sensitivity.

Piezoresistive effects in thick-film resistors / Canali, Claudio; D., Malavasi; Morten, Bruno; Prudenziati, Maria; Taroni, Andrea. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 51:(1980), pp. 3282-3288.

Piezoresistive effects in thick-film resistors

CANALI, Claudio;MORTEN, Bruno;PRUDENZIATI, Maria;TARONI, Andrea
1980

Abstract

Piezoresistive properties of thick-film resistors obtained with ink series supplied by different manufacturers were investigated as a function of composition, structure, sheet resistivity, and applied strain between 0 and ±1000 m strain. The strain sensitivity of thick-film resistors appears to be a strong function of the nature of the conductive grains and of the sheet resistivity of the paste; the results obtained suggest a dominant role of the tunneling effect in the conduction mechanism and in the strain sensitivity.
1980
51
3282
3288
Piezoresistive effects in thick-film resistors / Canali, Claudio; D., Malavasi; Morten, Bruno; Prudenziati, Maria; Taroni, Andrea. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 51:(1980), pp. 3282-3288.
Canali, Claudio; D., Malavasi; Morten, Bruno; Prudenziati, Maria; Taroni, Andrea
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/618922
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