Piezoresistive properties of thick-film resistors obtained with ink series supplied by different manufacturers were investigated as a function of composition, structure, sheet resistivity, and applied strain between 0 and ±1000 m strain. The strain sensitivity of thick-film resistors appears to be a strong function of the nature of the conductive grains and of the sheet resistivity of the paste; the results obtained suggest a dominant role of the tunneling effect in the conduction mechanism and in the strain sensitivity.
Piezoresistive effects in thick-film resistors / Canali, Claudio; D., Malavasi; Morten, Bruno; Prudenziati, Maria; Taroni, Andrea. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 51:(1980), pp. 3282-3288.
Piezoresistive effects in thick-film resistors
CANALI, Claudio;MORTEN, Bruno;PRUDENZIATI, Maria;TARONI, Andrea
1980
Abstract
Piezoresistive properties of thick-film resistors obtained with ink series supplied by different manufacturers were investigated as a function of composition, structure, sheet resistivity, and applied strain between 0 and ±1000 m strain. The strain sensitivity of thick-film resistors appears to be a strong function of the nature of the conductive grains and of the sheet resistivity of the paste; the results obtained suggest a dominant role of the tunneling effect in the conduction mechanism and in the strain sensitivity.Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris