This article reviews the state of the art in dielectric breakdown (DB) modeling, with particular emphasis on recent atomistic approaches, and on the key characteristics that are expected to play a major role in enabling effective design-for-reliability of future ultra-scaled devices.
Modeling Dielectric Breakdown in Scaled Nodes: Challenges and Perspectives / Puglisi, F. M.; Padovani, A.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - (2026), pp. 1-7. [10.1109/TED.2026.3669887]
Modeling Dielectric Breakdown in Scaled Nodes: Challenges and Perspectives
Puglisi F. M.;Padovani A.
2026
Abstract
This article reviews the state of the art in dielectric breakdown (DB) modeling, with particular emphasis on recent atomistic approaches, and on the key characteristics that are expected to play a major role in enabling effective design-for-reliability of future ultra-scaled devices.
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris
