The Young-Feynman two-slit experiment for single electrons was carried out by inserting two nanometric slits and a fast recording system, capable of detecting the electron arrival-time, in a conventional transmission electron microscope. The sensor, designed for experiments at future high energy colliders, is based on a custom 4096 Monolithic Active Pixels CMOS chip, is equipped with a fast readout chain and can manage up to 106 frames per second, allowing the collection of high statistic samples of single electron events within a time interval compatible with the stability of the experimental setup and the coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals was obtained.

Single electron interference and diffraction experiments with a high energy physics detector / Alberghi, G. L.; Don, R.; Gabrielli, A.; Giorgi, F.; Matteucci, G.; Cesari, N. S.; Villa, M.; Zoccoli, A.; Frabboni, S.; Gazzadi, G.. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - 2013-:(2013). (Intervento presentato al convegno 11th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, RD 2013 tenutosi a Auditorium Cassa di Risparmio di Firenze, via Folco Portinari 5, ita nel 2013).

Single electron interference and diffraction experiments with a high energy physics detector

Frabboni S.;Gazzadi G.
2013

Abstract

The Young-Feynman two-slit experiment for single electrons was carried out by inserting two nanometric slits and a fast recording system, capable of detecting the electron arrival-time, in a conventional transmission electron microscope. The sensor, designed for experiments at future high energy colliders, is based on a custom 4096 Monolithic Active Pixels CMOS chip, is equipped with a fast readout chain and can manage up to 106 frames per second, allowing the collection of high statistic samples of single electron events within a time interval compatible with the stability of the experimental setup and the coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals was obtained.
2013
11th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, RD 2013
Auditorium Cassa di Risparmio di Firenze, via Folco Portinari 5, ita
2013
2013-
Alberghi, G. L.; Don, R.; Gabrielli, A.; Giorgi, F.; Matteucci, G.; Cesari, N. S.; Villa, M.; Zoccoli, A.; Frabboni, S.; Gazzadi, G.
Single electron interference and diffraction experiments with a high energy physics detector / Alberghi, G. L.; Don, R.; Gabrielli, A.; Giorgi, F.; Matteucci, G.; Cesari, N. S.; Villa, M.; Zoccoli, A.; Frabboni, S.; Gazzadi, G.. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - 2013-:(2013). (Intervento presentato al convegno 11th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, RD 2013 tenutosi a Auditorium Cassa di Risparmio di Firenze, via Folco Portinari 5, ita nel 2013).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1281242
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