TONDELLI, LISA
TONDELLI, LISA
Dipartimento di Ingegneria "Enzo Ferrari"
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Risultati 1 - 5 di 5 (tempo di esecuzione: 0.006 secondi).
Assessment of Advanced Nanoscale Bulk FinFET's Self-Heating accounting for degraded thermal conductivity at the nanoscale
2023 Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca
Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology
2024 Dinh, T. V.; Tam, S-W.; Scholten, A. J.; Tondelli, L.; Pijper, R. M. T.; Kondapalli, S. H.; Xie, J.; Wong, A.; To, I.; Asanovski, R.; Selmi, L.
On the design of LDMOS finFETs in advanced technology nodes
2024 Ruggieri, Alessandro; Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca
On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices
2024 Tondelli, L.; Scholten, A. J.; Asanovski, R.; Pijper, R. M. T.; Dinh, T. V.; Selmi, L.
Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes
2024 Tondelli, L.; Asanovski, R.; Scholten, A. J.; Dinh, T. V.; Tam, S. -W.; Pijper, R. M. T.; Selmi, L.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Assessment of Advanced Nanoscale Bulk FinFET's Self-Heating accounting for degraded thermal conductivity at the nanoscale | 1-gen-2023 | Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca | |
Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology | 1-gen-2024 | Dinh, T. V.; Tam, S-W.; Scholten, A. J.; Tondelli, L.; Pijper, R. M. T.; Kondapalli, S. H.; Xie, J.; Wong, A.; To, I.; Asanovski, R.; Selmi, L. | |
On the design of LDMOS finFETs in advanced technology nodes | 1-gen-2024 | Ruggieri, Alessandro; Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca | |
On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices | 1-gen-2024 | Tondelli, L.; Scholten, A. J.; Asanovski, R.; Pijper, R. M. T.; Dinh, T. V.; Selmi, L. | |
Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes | 1-gen-2024 | Tondelli, L.; Asanovski, R.; Scholten, A. J.; Dinh, T. V.; Tam, S. -W.; Pijper, R. M. T.; Selmi, L. |