BENATTI, LORENZO

BENATTI, LORENZO  

Dipartimento di Ingegneria "Enzo Ferrari"  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.018 secondi).
Titolo Data di pubblicazione Autore(i) File
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules 1-gen-2022 Florini, Davide; Gandolfi, Daniela; Mapelli, Jonathan; Benatti, Lorenzo; Pavan, Paolo; Puglisi, Francesco Maria
Biologically Plausible Information Propagation in a CMOS Integrate-and-Fire Artificial Neuron Circuit with Memristive Synapses 1-gen-2023 Benatti, Lorenzo; Zanotti, Tommaso; Gandolfi, Daniela; Mapelli, Jonathan; Puglisi, Francesco Maria
Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions 1-gen-2022 Benatti, L.; Pavan, P.; Puglisi, F. M.
Effect of cycling on ultra-thin HfZrO4, ferroelectric synaptic weights 1-gen-2022 Bégon-Lours, Laura; Halter, Mattia; Sousa, Marilyne; Popoff, Youri; Dávila Pineda, Diana; Falcone, Donato Francesco; Yu, Zhenming; Reidt, Steffen; Benatti, Lorenzo; Puglisi, Francesco Maria; Offrein, Bert Jan
Impedance Investigation of MIFM Ferroelectric Tunnel Junction using a Comprehensive Small-Signal Model 1-gen-2022 Benatti, L.; Puglisi, F. M.
Impedance Spectroscopy of Ferroelectric Capacitors and Ferroelectric Tunnel Junctions 1-gen-2022 Benatti, L.; Vecchi, S.; Puglisi, F. M.
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by means of Impedance Spectroscopy 1-gen-2023 Benatti, L.; Vecchi, S.; Puglisi, F. M.
Scaled, Ferroelectric Memristive Synapse for Back-End-of-Line Integration with Neuromorphic Hardware 1-gen-2022 Begon-Lours, L.; Halter, M.; Puglisi, F. M.; Benatti, L.; Falcone, D. F.; Popoff, Y.; Davila Pineda, D.; Sousa, M.; Offrein, B. J.
The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging 1-gen-2023 Benatti, L.; Vecchi, S.; Pesic, M.; Puglisi, F. M.
Ultra-low power logic in memory with commercial grade memristors and FPGA-based smart-IMPLY architecture 1-gen-2023 Benatti, L; Zanotti, T; Pavan, P; Puglisi, Fm
Understanding the Reliability of Ferroelectric Tunnel Junction Operations using an Advanced Small-Signal Model 1-gen-2021 Benatti, Lorenzo; Puglisi, Francesco Maria