The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 45° angle to the detector's edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported.
Beam test results for the SuperB-SVT thin striplet detector / L., F., D., C., M., M., V., R.e., G., T., A., G., F., G., G., P., C., S., N., S.C., S., V., M., V., A., Z., A., B., D., L., M., P., A., B., F., W., G., B., J., M., et al.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 718:(2013), pp. 314-317. [10.1016/j.nima.2012.10.086]
Beam test results for the SuperB-SVT thin striplet detector
VERZELLESI, Giovanni;
2013
Abstract
The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 45° angle to the detector's edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported.
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