X-ray absorption spectroscopy is used to investigate the near-L-edge structures of Pd in pure Pd and bulk Pd2Si and PdSi silicides. Possible many-body effects are suggested to explain the apparent discrepancy between the occurrence of L2,3 white lines and the 4d hole filling in Pd silicides. The interpretations of the extended fine structures and of the near-edge features are correlated with each other in order to find common support for a dynamical relaxation model for the L2,3 deep core holes of Pd silicides.
X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides / M., De Crescenzi; E., Colavita; DEL PENNINO, Umberto; P., Sassaroli; Valeri, Sergio; C., Rinaldi; L., Sorba; Nannarone, Stefano. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - STAMPA. - 32:(1985), pp. 612-622. [10.1103/PhysRevB.32.612]
X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides
DEL PENNINO, Umberto;VALERI, Sergio;NANNARONE, Stefano
1985
Abstract
X-ray absorption spectroscopy is used to investigate the near-L-edge structures of Pd in pure Pd and bulk Pd2Si and PdSi silicides. Possible many-body effects are suggested to explain the apparent discrepancy between the occurrence of L2,3 white lines and the 4d hole filling in Pd silicides. The interpretations of the extended fine structures and of the near-edge features are correlated with each other in order to find common support for a dynamical relaxation model for the L2,3 deep core holes of Pd silicides.
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