The atomic geometry and growth mechanism of Fe films (0.5-20 monolayers (ML)) epitaxially grown on Ni(001) have been investigated by a multitechnique approach with the twofold aim of assessing the reliability of quick structural techniques (primary-beam diffraction modulated electron emission (PDMEE), secondary electron imaging (SEI)), suitable for on-line monitoring of film growth, and studying the structural evolution of the Fe/Ni system. To this end, samples were analyzed by PDMEE and SEI together with synchrotron radiation photoelectron diffraction (PD), and extended x-ray absorption fine structure (EXAFS). Results show the effectiveness of the approach by quick techniques. In the early stage of growth, Fe arranges in a strained fcc(001) structure. Transition to the bcc phase occurs through nucleation of bcc(110) domains with the bcc〈111〉//fcc〈110〉 orientation. Quantitative analysis based on PD and EXAFS data is also presented.

Solid-State Effects on the Valence-Band 4d-Photoionization Cross Sections at the Cooper Minimum / I., Abbati; L., Braicovich; G., Rossi; I., Lindau; DEL PENNINO, Umberto; Nannarone, Stefano. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - STAMPA. - 50(1983), pp. 1799-1802. [10.1103/PhysRevLett.50.1799]

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