EnglishThe atomic geometry and growth mechanism of Fe films (0.5-20 monolayers (ML)) epitaxially grown on Ni(001) have been investigated by a multitechnique approach with the twofold aim of assessing the reliability of quick structural techniques (primary-beam diffraction modulated electron emission (PDMEE), secondary electron imaging (SEI)), suitable for on-line monitoring of film growth, and studying the structural evolution of the Fe/Ni system. To this end, samples were analyzed by PDMEE and SEI together with synchrotron radiation photoelectron diffraction (PD), and extended x-ray absorption fine structure (EXAFS). Results show the effectiveness of the approach by quick techniques. In the early stage of growth, Fe arranges in a strained fcc(001) structure. Transition to the bcc phase occurs through nucleation of bcc(110) domains with the bcc〈111〉//fcc〈110〉 orientation. Quantitative analysis based on PD and EXAFS data is also presented.
| Data di pubblicazione: | 1983 |
| Titolo: | Solid-State Effects on the Valence-Band 4d-Photoionization Cross Sections at the Cooper Minimum |
| Autore/i: | I. Abbati;L. Braicovich;G. Rossi;I. Lindau;U. del Pennino;S. Nannarone |
| Autore/i UNIMORE: | |
| Digital Object Identifier (DOI): | 10.1103/PhysRevLett.50.1799 |
| Rivista: | |
| Volume: | 50 |
| Pagina iniziale: | 1799 |
| Pagina finale: | 1802 |
| Codice identificativo ISI: | WOS:A1983QR62100023 |
| Codice identificativo Scopus: | 2-s2.0-4243114391 |
| Citazione: | Solid-State Effects on the Valence-Band 4d-Photoionization Cross Sections at the Cooper Minimum / I. Abbati;L. Braicovich;G. Rossi;I. Lindau;U. del Pennino;S. Nannarone. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - STAMPA. - 50(1983), pp. 1799-1802. |
| Tipologia | Articolo su rivista |
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