Well-ordered clean InAs(1 1 1) A and B surfaces have been prepared using HCl-isopropanol solutions and characterized using low-energy electron diffraction and photoemission spectroscopy. The as-treated surfaces are covered by a layer containing arsenic and small amounts of InClx. Annealing induces desorption of the overlayer and reveals (2 × 2) and (1 × 1) structures on the A and B surfaces, respectively. For both surfaces, the surface components of the In 4d and As 3d reveal a charge transfer from the electropositive surface indium to the electronegative surface arsenic. The major advantage of this preparation method over conventional thermal cleaning is a significant reduction in the annealing temperature (≈250 °C) thereby avoiding anion evaporation.

Clean reconstructed InAs(111) A and B surfaces using chemical treatments and annealing / O. E., Tereshchenko; D., Paget; A. C. H., Rowe; V. L., Berkovits; P., Chiaradia; B. P., Doyle; Nannarone, Stefano. - In: SURFACE SCIENCE. - ISSN 0039-6028. - STAMPA. - 603:(2009), pp. 518-522. [10.1016/j.susc.2008.12.014]

Clean reconstructed InAs(111) A and B surfaces using chemical treatments and annealing

NANNARONE, Stefano
2009

Abstract

Well-ordered clean InAs(1 1 1) A and B surfaces have been prepared using HCl-isopropanol solutions and characterized using low-energy electron diffraction and photoemission spectroscopy. The as-treated surfaces are covered by a layer containing arsenic and small amounts of InClx. Annealing induces desorption of the overlayer and reveals (2 × 2) and (1 × 1) structures on the A and B surfaces, respectively. For both surfaces, the surface components of the In 4d and As 3d reveal a charge transfer from the electropositive surface indium to the electronegative surface arsenic. The major advantage of this preparation method over conventional thermal cleaning is a significant reduction in the annealing temperature (≈250 °C) thereby avoiding anion evaporation.
2009
603
518
522
Clean reconstructed InAs(111) A and B surfaces using chemical treatments and annealing / O. E., Tereshchenko; D., Paget; A. C. H., Rowe; V. L., Berkovits; P., Chiaradia; B. P., Doyle; Nannarone, Stefano. - In: SURFACE SCIENCE. - ISSN 0039-6028. - STAMPA. - 603:(2009), pp. 518-522. [10.1016/j.susc.2008.12.014]
O. E., Tereshchenko; D., Paget; A. C. H., Rowe; V. L., Berkovits; P., Chiaradia; B. P., Doyle; Nannarone, Stefano
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/743034
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