Using RAD, a new module of Berkeley Reliability Tools (BERT), as a tool, users can design circuits to be radiation hard and characterize circuit behavior in environments where radiation is present. Previous simulators could not provide circuit output waveforms after irradiation because it was difficult to simulate the effect of radiation on a circuit in operation (AC bias condition) and because radiation affected MOSFETs of different processes in different ways. We have dealt with these problems and for the first time, successfully provided "SPICE-like'' simulation results.

Simulating total dose radiation effects on circuit behavior / R., Tu; G., Lum; Pavan, Paolo; P. K., Ko; C., Hu. - STAMPA. - (1994), pp. 344-350. ((Intervento presentato al convegno IRPS 1994 tenutosi a San Jose, CA (USA) nel 12-14 April 1994.

Simulating total dose radiation effects on circuit behavior

PAVAN, Paolo;
1994-01-01

Abstract

Using RAD, a new module of Berkeley Reliability Tools (BERT), as a tool, users can design circuits to be radiation hard and characterize circuit behavior in environments where radiation is present. Previous simulators could not provide circuit output waveforms after irradiation because it was difficult to simulate the effect of radiation on a circuit in operation (AC bias condition) and because radiation affected MOSFETs of different processes in different ways. We have dealt with these problems and for the first time, successfully provided "SPICE-like'' simulation results.
IRPS 1994
San Jose, CA (USA)
12-14 April 1994
344
350
R., Tu; G., Lum; Pavan, Paolo; P. K., Ko; C., Hu
Simulating total dose radiation effects on circuit behavior / R., Tu; G., Lum; Pavan, Paolo; P. K., Ko; C., Hu. - STAMPA. - (1994), pp. 344-350. ((Intervento presentato al convegno IRPS 1994 tenutosi a San Jose, CA (USA) nel 12-14 April 1994.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/737748
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