Using RAD, a new module of Berkeley Reliability Tools (BERT), as a tool, users can design circuits to be radiation hard and characterize circuit behavior in environments where radiation is present. Previous simulators could not provide circuit output waveforms after irradiation because it was difficult to simulate the effect of radiation on a circuit in operation (AC bias condition) and because radiation affected MOSFETs of different processes in different ways. We have dealt with these problems and for the first time, successfully provided "SPICE-like'' simulation results.

Simulating total dose radiation effects on circuit behavior / R., Tu; G., Lum; Pavan, Paolo; P. K., Ko; C., Hu. - STAMPA. - (1994), pp. 344-350. ((Intervento presentato al convegno IRPS 1994 tenutosi a San Jose, CA (USA) nel 12-14 April 1994.

I documenti presenti in Iris Unimore sono rilasciati con licenza Creative Commons Attribuzione - Non commerciale - Non opere derivate 3.0 Italia, salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Powered by IRIS-about IRIS-Utilizzo dei cookie

 Copyright © 2021