Microelectronics systems designed for automotive applications face an extremely hostile electrical and physical environment. Designers must produce increased component and system reliability while maintaining required compactness and cost effectiveness levels. Their designs become crucial to all as we devote more electronic systems to safety-critical applications. We summarizee the results of the European Prometheus PRO-CHIP research groups working on the reliability and fail-safe operation of microelectronic systems and devices.

Improving reliability and safety of automotive electronics: research activities within the PROMETHEUS project / E., Zanoni; Pavan, Paolo. - In: IEEE MICRO. - ISSN 0272-1732. - STAMPA. - 13:(1993), pp. 30-48.

Improving reliability and safety of automotive electronics: research activities within the PROMETHEUS project

PAVAN, Paolo
1993-01-01

Abstract

Microelectronics systems designed for automotive applications face an extremely hostile electrical and physical environment. Designers must produce increased component and system reliability while maintaining required compactness and cost effectiveness levels. Their designs become crucial to all as we devote more electronic systems to safety-critical applications. We summarizee the results of the European Prometheus PRO-CHIP research groups working on the reliability and fail-safe operation of microelectronic systems and devices.
13
30
48
Improving reliability and safety of automotive electronics: research activities within the PROMETHEUS project / E., Zanoni; Pavan, Paolo. - In: IEEE MICRO. - ISSN 0272-1732. - STAMPA. - 13:(1993), pp. 30-48.
E., Zanoni; Pavan, Paolo
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/737656
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