The continuous scaling of physical dimensions has strongly increased circuit performance variability and the traditional corner-case methodology is becoming unreliable. As a consequence, there is an urgent need for new and more accurate statistical models. In this scenario, the purpose of this paper is twofold: 1) to give the reader the basic concepts of statistical modeling, and 2) to discuss a viable statistical approach that could be adopted into a traditional IC design flow for the next technology generations.
Statistical Methodologies for Integrated Circuits Design / Padovani, Andrea; A., Chimenton; P., Olivo; P., Fantini; L., Vendrame; S., Mennillo. - STAMPA. - (2007), pp. 277-280. (Intervento presentato al convegno 2007 Ph.D Research in Microelectronics and Electronics conference, PRIME 2007 tenutosi a Bordeaux, fra nel July 2-5, 2007) [10.1109/RME.2007.4401866].
Statistical Methodologies for Integrated Circuits Design
PADOVANI, ANDREA;
2007
Abstract
The continuous scaling of physical dimensions has strongly increased circuit performance variability and the traditional corner-case methodology is becoming unreliable. As a consequence, there is an urgent need for new and more accurate statistical models. In this scenario, the purpose of this paper is twofold: 1) to give the reader the basic concepts of statistical modeling, and 2) to discuss a viable statistical approach that could be adopted into a traditional IC design flow for the next technology generations.
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