Low-frequency noise in PCM devices is experimentally investigated providing a new physical model for the amorphous GST (Ge2Sb2Te5) material. Noise intensity is characterized and modelled as a function of bias, temperature and size. Findings from 1/f noise analysis are used to understand the drift mechanism of the amorphous state resistance.
Characterization and modelling of low-frequency noise in PCM devices / P., Fantini; G., Betti Beneventi; A., Calderoni; Larcher, Luca; Pavan, Paolo; F., Pellizzer. - STAMPA. - (2008), pp. 1-4. (Intervento presentato al convegno 2008 IEEE International Electron Devices Meeting, IEDM 2008 tenutosi a San Francisco, CA, usa nel 15-17 Dec. 2008) [10.1109/IEDM.2008.4796656].