Focused ion beam was utilized to locally modify magnetism and structure of L10 FePt perpendicularthin films. As a first step, we have performed a magnetic, morphological, and structural study ofcompletely irradiated FePt films with different Ga+ doses 11013 –41016 ions/cm2 and ionbeam energy of 30 keV. For doses of 11014 ions/cm2 and above a complete transition from theordered L10 to the disordered A1 phase was found to occur, resulting in a drop of magneticanisotropy and in the consequent moment reorientation from out-of-plane to in-plane. The lowesteffective dose in disordering the structure 11014 ions/cm2 was found not to affect the filmmorphology. Taking advantage of these results, continuous two-dimensional 2D patterns ofperpendicular magnetic structures 250 nm dots, 1 m dots, 1 m-large stripes were produced byfocused ion beam without affecting the morphology. The 2D patterns were revealed by means ofmagnetic force microscopy, that evidenced peculiar domain structures in the case of 1 m dots.© 2008 American Institute of Physics.
|Anno di pubblicazione:||2008|
|Titolo:||Local modifications of magnetism and structure in FePt (001) epitaxial thin films by focused ion beam: two-dimensional perpendicular patterns|
|Autori:||F. Albertini; L. Nasi; F. Casoli; S. Fabbrici; P. Luches; G.C. Gazzadi; A. di Bona; P. Vavassori; S. Valeri; S.F. Contri|
|Appare nelle tipologie:||Articolo su rivista|
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